Powder X-ray diffractometer is mainly used for phase qualitative and quantitative analysis, crystal structure analysis, material structure analysis, crystal orientation analysis, macroscopic or microscopic stress determination, grain size determination, crystallinity determination, etc. of powder, block or film samples. The TD-3500 X-ray diffractometer produced by Dandong Tongda Technology Co., Ltd. adopts imported Siemens PLC control, which makes the TD-3500 X-ray diffractometer have the characteristics of high accuracy, high precision, good stability, long service life, easy upgrade, easy operation and intelligence, and can flexibly adapt to testing analysis and research in various industries!
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The TD-3700 X-ray diffractometer is a high-performance and multifunctional X-ray diffractometer produced by Dandong Tongda Technology Co., Ltd. The main features are high-performance detectors, diverse scanning methods, convenient and safe operation, stable and reliable performance. For specific details, please refer to the website of Dandong Tongda Technology Co., Ltd.
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The medium and low temperature accessory is designed to understand the changes in crystal structure during the low-temperature refrigeration process.
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The parallel optical film measuring accessory increases the length of the grating plate to filter out more scattered lines, which is beneficial for reducing the influence of the substrate signal on the results and enhancing the signal intensity of the film.
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The X-ray irradiator can generate high-energy X-rays to irradiate cells or small animals. Used for various basic and applied research. Throughout history, radioactive isotope irradiators have been used, which require transporting samples to a core irradiation facility. Today, smaller, safer, simpler, and lower cost X-ray irradiation equipment can be installed in laboratories for convenient and rapid irradiation of cells.
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High temperature accessory are designed to understand the changes in the crystal structure of samples during high-temperature heating, as well as the changes in mutual dissolution of various substances during high-temperature heating.
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X-ray absorption fine structure spectrometer (XAFS) is a powerful tool for studying the local atomic or electronic structure of materials, widely used in popular fields such as catalysis, energy, and nanotechnology.
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XRD enables precise TiO2 phase quantification, crucial for product quality. Dandong Tongda's TD-series diffractometers, with specialized programs, ensure accurate rutile/anatase analysis (<0.2% error).
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The TDM-20 desktop X-ray diffractometer delivers 1200W power in a compact design, surpassing 600W international standards. With ±0.01° linearity and 0.0001° repeatability, it enables precise phase analysis for materials research and industrial QC. Its integrated cooling system and global accessory compatibility make it an ideal cost-effective solution for international laboratories
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The TDF series X-ray crystal analyzer delivers exceptional performance in microstructure analysis, supporting single crystal orientation, defect detection, and stress measurement. Featuring a vertical tube design with multi-window operation and imported PLC control, it ensures high precision, safety compliance (radiation <0.1 µSv/h), and adaptability across industries. Backed by ISO certification and global exports, this instrument empowers scientific and industrial advancements worldwide
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