In-situ XRD, also known as In situ X-ray Diffraction, is a technique for making X-ray diffraction measurements during a structure or phase transition. This technology can monitor the dynamic change of the structure of the material under external force in real time.

In-situ XRD is one of the most popular and developed advanced characterization techniques for studying lithium-ion and sodium-ion battery systems in electrochemical processes.

XRD technology plays an important role in the research and development of ceramic materials. It provides a reliable scientific basis for the synthesis, preparation process optimization, performance improvement and application popularization of ceramic materials.

It is difficult to quantify the amorphous and crystalline phases of cement materials due to the complexity of the mineral phases in the mixture and the significant overlapping peaks. Excellent results can be obtained by Rietveld refinement of the measured sample using standard measurement configurations.

In materials science research, X-ray diffraction (XRD) is an important experimental method. Through XRD data, we can obtain information such as grain size, lattice distortion and dislocation density.

Powder X-ray diffraction, as one of the methods for the study of drug polymorphism, has the advantages of not destroying samples and simple operation, and is the main method for the qualitative and quantitative analysis of drug polymorphism at present.

The Bragg glass phase is a near-perfect crystalline phase with glassy characteristics that is expected to occur in vortex lattices and charge density wave systems in the presence of disorder.

X-ray frequency and energy is second only to gamma rays, with penetration, frequency range 30PHz~300EHz, corresponding wavelength of 1pm~10nm, energy of 124eV~1.24MeV. Let's take a look at the properties and applications of X-rays.

This paper introduces the related knowledge of crystal pattern and crystal fetish

The X-ray intensity of nondestructive testing at a point in space is the sum of the number of photons and the energy product over a unit area perpendicular to the X-ray propagation direction in unit time.