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Embark on a new era of medium and low temperature technology

The medium and low temperature accessory is designed to understand the changes in crystal structure during the low-temperature refrigeration process.

2025/01/17
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Parallel optical film measuring accessory, opening a new chapter in your scientific research.

The parallel optical film measuring accessory increases the length of the grating plate to filter out more scattered lines, which is beneficial for reducing the influence of the substrate signal on the results and enhancing the signal intensity of the film.

2025/01/13
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Uncovering the secrets deep within matter

The X-ray irradiator can generate high-energy X-rays to irradiate cells or small animals. Used for various basic and applied research. Throughout history, radioactive isotope irradiators have been used, which require transporting samples to a core irradiation facility. Today, smaller, safer, simpler, and lower cost X-ray irradiation equipment can be installed in laboratories for convenient and rapid irradiation of cells.

2025/01/10
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Innovative technology, high temperature resistance testing

High temperature accessory are designed to understand the changes in the crystal structure of samples during high-temperature heating, as well as the changes in mutual dissolution of various substances during high-temperature heating.

2025/01/09
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Accurate measurement, extraordinary insights

X-ray absorption fine structure spectrometer (XAFS) is a powerful tool for studying the local atomic or electronic structure of materials, widely used in popular fields such as catalysis, energy, and nanotechnology.

2025/01/07
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The important role of crystal analyzer in the development of new materials

The TDF series X-ray crystal analyzer is a large-scale analytical instrument used to study the internal microstructure of substances. It is mainly used for single crystal orientation, defect inspection, determination of lattice parameters, determination of residual stresses, study of the structure of plates and rods, study of the structure of unknown substances, and single crystal dislocations.

2025/01/04
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Save space without compromising performance

The TDM-20 high-power X-ray diffractometer (benchtop XRD) is mainly used for phase analysis of powders, solids, and similar paste like materials. The principle of X-ray diffraction can be used for qualitative or quantitative analysis, crystal structure analysis, and other polycrystalline materials such as powder samples and metal samples. It is widely used in industries such as industry, agriculture, national defense, pharmaceuticals, minerals, food safety, petroleum, education, and scientific research.

2025/01/03
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High precision analysis tool

X-ray diffractometer is mainly used for phase qualitative and quantitative analysis, crystal structure analysis, material structure analysis, crystal orientation analysis, macroscopic or microscopic stress determination, grain size determination, crystallinity determination, etc. of powder, block or film samples. It produced by Dandong Tongda Technology Co., Ltd. adopts imported Siemens PLC control, which makes the TD-3500 X-ray diffractometer have the characteristics of high accuracy, high precision, good stability, long service life, easy upgrade, easy operation and intelligence, and can flexibly adapt to testing analysis and research in various industries!

2025/01/02
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How to reshape material analysis with high-resolution diffractometer

The TD-3700 series high-resolution X-ray diffractometer is a new member of the TD series, equipped with a variety of high-performance detectors such as high-speed one-dimensional array detectors, two-dimensional detectors, SDD detectors, etc. It integrates fast analysis, convenient operation, and user safety. The modular hardware architecture and customized software system achieve a perfect combination, making its failure rate extremely low, anti-interference performance good, and ensuring long-term stable operation of high-voltage power supply.

2024/12/31
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Unveiling the secrets of the microscopic world

The TD-5000 X-ray single crystal diffractometer is mainly used to determine the three-dimensional spatial structure and electron cloud density of crystalline substances such as inorganic, organic, and metal complexes, and to analyze the structure of special materials such as twinning, non commensurate crystals, quasicrystals, etc. Determine the accurate three-dimensional space (including bond length, bond angle, configuration, conformation, and even bonding electron density) of new compound (crystalline) molecules and the actual arrangement of molecules in the lattice; It can provide information on the crystal cell parameters, space group, crystal molecular structure, intermolecular hydrogen bonding and weak interactions, as well as structural information such as molecular configuration and conformation. It is widely used in analytical research in chemical crystallography, molecular biology, pharmacology, mineralogy, and materials science.

2024/12/30
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