X-ray diffraction spectroscopy mainly analyzes the crystal state and microstructure of materials, and there are two X-ray diffraction measurement methods for crystal analysis.

Automatic X-ray orientation instrument is an indispensable instrument for precision processing and manufacturing crystal devices. It is widely used in the research, processing and manufacturing of crystal materials.

In the past 10 years, the Institute of Physics of the Chinese Academy of Sciences has used powder diffraction method to determine the crystal structure of many inorganic and organic compounds.

X-ray detector is a device used to detect X-rays, which has a wide range of applications in medicine, science and industry. X-ray detectors convert X-rays into electrical signals for digital processing and imaging.

X-rays have a short wavelength and high energy, and can penetrate objects to directly observe internal defects. Highly praised in the field of non-destructive testing. In fact, there is another function that is also widely used, namely foreign body detection.

Nondestructive testing (NDT) is a kind of testing method widely used in various industries, which is widely praised for its high precision, high resolution imaging effect and fast and efficient detection speed.

The composition of the diffraction pattern is mainly the position and intensity of the diffraction peak, and our analysis of the XRD pattern is based on the changes in the intensity and position to explain the changes in the micro and macro of the material.

SBA-15 is a kind of mesoporous molecular sieve, and its synthesis is another important chemical technology emerging in recent years.

Nowadays, X-ray imaging technology has formed a relatively complete X-ray non-destructive testing technology system. New detection technologies are also being innovated, using Xray online detection technology.

Grazing incidence means that the X-ray is exposed to the film at a very small incidence Angle (< 5°), which greatly reduces the penetration depth in the film.At the same time, the low incidence Angle increases the irradiation area of the X-ray on the sample