Almost all analytical laboratories supporting the pharmaceutical industry have both thermal analysis instruments and X-ray powder diffractometers. Combining DSC and XRD into one simultaneous measurement, thermal data and diffraction data on the same sample can obtain rich information.

Polymers are commonly synthesized as fibers, sheets, and other solid forms. Its properties are greatly affected by its structural parameters such as crystallinity, crystal structure and orientation, and can be studied using XRD

X-ray diffraction is divided into two kinds of single crystal diffraction and powder diffraction, single crystal is mainly used for the determination of molecular weight and crystal structure, powder is mainly used for the identification and purity of crystalline substances.

Dandong Tongda Technology Co., Ltd. is a professional manufacturer of X-ray diffractometer, has a history of 14 years, and has reached cooperation with many universities and enterprises at home and abroad.

With the development of XRD detection technology, instrument miniaturization, low energy consumption, simple use, intelligent detection is becoming more and more popular, and has become the trend of instrument update.

The new large-area, high-angular resolution, imaging X-ray spectrometer will reveal the fundamental drivers of galactic evolution that leave their mark in the warm plasma that cosmologists believe exists in intergalactic space

An X-ray diffractometer is an instrument used to measure residual stress inside a material. By analyzing the X-ray diffraction pattern of the material, the residual stress distribution inside the material is calculated.

GIWAXS is a technique to characterize the internal microstructure of thin film samples. The corresponding structure size is between 10nm and 1um, so it is widely used to characterize the crystallization inside solar thin film cells.

HRXRD is a powerful non-destructive testing method, and its research objects are mainly single crystal materials, single crystal epitaxial thin film materials and various low-dimensional semiconductor heterostructures.

In the development of X-ray imaging technology, X-ray imaging technology has formed a relatively complete X-ray non-destructive testing technology system. In order to meet the needs, new detection technology is constantly innovated, and X-ray online detection technology is adopted.