X-ray diffractometer is a device that uses the principle of interaction between X-rays and substances to obtain information such as crystal structure and lattice constant of substances by measuring the diffraction Angle and intensity of X-rays in substances.

Characterization methods of copper monatomic catalysts are often used to determine their structure and properties, and the following are several common characterization methods.

By X-ray diffraction of the material and analysis of its diffraction pattern, information such as the composition of the material, the structure or morphology of the internal atoms or molecules is obtained.

In this paper, we briefly analyze one (actually two) crystal defects, one fault and layer fault in these three crystal structures. Other crystal structures also have faults and layer faults.

X-ray technology plays a vital role in medical and scientific research, and recent advances in X-ray technology are enabling brighter, stronger beams and imaging of increasingly complex systems under real-world conditions.

The three-dimensional space of atoms is arranged in a long-range order, and the smallest unit of repeated arrangement is called the cell, which can be divided into 7 kinds of crystal systems, 14 kinds of lattice, and 230 kinds of space groups according to the arrangement law.

Dandong Tongda TD-5000X-ray single crystal diffractometer won the "ACCSI2023 Instrument and Detection 3i Award --2022 Annual Scientific Instrument Industry Outstanding New Product Award".

Crystals, although long admired for their regularity and symmetry, were not studied scientifically until the 17th century. Let's take a look at the early history of crystallography.

Using the principle of X-ray diffraction, the cutting Angle of natural and artificial single crystals is accurately and quickly determined, and the cutting machine is equipped for directional cutting of the said crystals.