Polymers are commonly synthesized as fibers, sheets, and other solid forms. Its properties are greatly affected by its structural parameters such as crystallinity, crystal structure and orientation, and can be studied using XRD

X-ray diffraction is divided into two kinds of single crystal diffraction and powder diffraction, single crystal is mainly used for the determination of molecular weight and crystal structure, powder is mainly used for the identification and purity of crystalline substances.

GIWAXS is a technique to characterize the internal microstructure of thin film samples. The corresponding structure size is between 10nm and 1um, so it is widely used to characterize the crystallization inside solar thin film cells.

HRXRD is a powerful non-destructive testing method, and its research objects are mainly single crystal materials, single crystal epitaxial thin film materials and various low-dimensional semiconductor heterostructures.

The polycrystalline phenomenon of drugs refers to the formation of different crystal states of a compound molecule in the solid state due to the different crystal arrangement and filling methods. ​

In the process of drug development, the properties and structure of drug crystal powders play a crucial role in their efficacy and safety, and the application of X-ray diffraction (XRD) technology provides us with a powerful tool.

X-ray diffractometer is a device that uses the principle of interaction between X-rays and substances to obtain information such as crystal structure and lattice constant of substances by measuring the diffraction Angle and intensity of X-rays in substances.

Characterization methods of copper monatomic catalysts are often used to determine their structure and properties, and the following are several common characterization methods.

By X-ray diffraction of the material and analysis of its diffraction pattern, information such as the composition of the material, the structure or morphology of the internal atoms or molecules is obtained.

In this paper, we briefly analyze one (actually two) crystal defects, one fault and layer fault in these three crystal structures. Other crystal structures also have faults and layer faults.