GIWAXS is a technique to characterize the internal microstructure of thin film samples. The corresponding structure size is between 10nm and 1um, so it is widely used to characterize the crystallization inside solar thin film cells.

For organic solar cell films, which do not have a fixed lattice structure, GIWAXS focuses on characterizing the orientation and proportion of the crystals inside the films. Example: Figure 3

GIWAXS technology characterizes two other advantages of thin-film solar cells: one can adjust the depth of the sample penetrated by controlling the Angle of the incident beam, so as to achieve the purpose of layered characterization. Secondly, GIWAXS is suitable for in-situ testing of thin film batteries, and the test time is short.

In summary, GIWAXS has a wide range of applications in characterizing the morphology of thin-film solar cells, and can be used to characterize in situ the crystal formation process inside the thin film, as well as the crystal orientation, lattice size and crystal proportion, providing technical support for optimizing the internal structure of thin film cells.