Grazing-incidence X-ray diffraction (GI-XRD) is a kind of X-ray diffraction technique, which is different from the traditional XRD experiment, mainly by changing the Angle of X-ray incidence and the orientation of the sample.

It is necessary to reduce the harmful residual stress and predict the distribution trend and value of residual stress. In this paper, the non-destructive testing method of residual stress testing is introduced.

X-ray diffraction (XRD) is currently a powerful method for studying crystal structure (such as the type and location distribution of atoms or ions and their groups, cell shape and size, etc.).

X-ray crystallography is a technique used to determine the atomic and molecular structure of a crystal, where the crystal structure causes the incident X-ray beam to diffract into many specific directions.

Based on Bragg's Law, in-situ X-ray diffraction (XRD) can be used to monitor the change of phase and its lattice parameters in the electrode or electrode-electrolyte interface in real time during the charge-discharge cycle of a battery.

Three single point detectors are shared below: proportional counter, scintillation counter, and semiconductor solid state detector.

X-ray crystal analyzer is a kind of large analytical instrument for studying the internal microstructure of substances, mainly used in single crystal orientation, defect detection, residual stress determination, single crystal dislocation and so on.

This procedure is a self-developed procedure. It contains a variety of quantitative analysis functions developed by ourselves, which are in accordance with the diffraction theory and are calculated by integral intensity.

X-rays are a type of short-wavelength electromagnetic radiation, between ultraviolet and gamma rays， that was developed by the German physicist W.K. It was discovered by Roentgen in 1895, so it is also called Roentgen rays.

X-ray diffractometer is mainly used for phase characterization, quantitative analysis, crystal structure analysis​, material structure analysis, crystal orientation analysis of powder, block or thin film samples.