X-ray diffraction technology is widely used in the research of lithium-ion batteries. XRD is a conventional method for qualitative and quantitative analysis of phases in materials.

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Global X-ray diffractometer (XRD) has developed steadily in recent years, and China is a market with great development prospects.

The application of new technologies and new products such as 5G, big data, and artificial intelligence will bring a huge semiconductor market demand, and global semiconductor equipment spending has entered an upward cycle.

In recent years, there has been a growing interest in the measurement of high-pressure biological samples. This is reflected in the development of new techniques for pressure measurement that are different from those implemented by DAC. One of them is the technique of freezing crystals under pressure.

High-resolution XRD (HR-XRD) is a common method for measuring the composition and thickness of compound semiconductors such as SiGe, AlGaAs, InGaAs, etc.

X-ray diffractometer (XRD) can be divided into X-ray powder diffractometer and X-ray single crystal diffractometer, the basic physical principle of the two is the same.

XRD is a means of research which is Diffraction by X-Ray diffraction of a material to analyze its diffraction pattern to obtain information such as the composition of the material, the structure or shape of atoms or molecules inside the material.

Grazing-incidence X-ray diffraction (GI-XRD) is a kind of X-ray diffraction technique, which is different from the traditional XRD experiment, mainly by changing the Angle of X-ray incidence and the orientation of the sample.

It is necessary to reduce the harmful residual stress and predict the distribution trend and value of residual stress. In this paper, the non-destructive testing method of residual stress testing is introduced.

X-ray diffraction (XRD) is currently a powerful method for studying crystal structure (such as the type and location distribution of atoms or ions and their groups, cell shape and size, etc.).

X-ray crystallography is a technique used to determine the atomic and molecular structure of a crystal, where the crystal structure causes the incident X-ray beam to diffract into many specific directions.