Dandong Tongda Technology Co., Ltd. is a professional manufacturer of X-ray diffractometer, has a history of 14 years, and has reached cooperation with many universities and enterprises at home and abroad.

With the development of XRD detection technology, instrument miniaturization, low energy consumption, simple use, intelligent detection is becoming more and more popular, and has become the trend of instrument update.

The new large-area, high-angular resolution, imaging X-ray spectrometer will reveal the fundamental drivers of galactic evolution that leave their mark in the warm plasma that cosmologists believe exists in intergalactic space

An X-ray diffractometer is an instrument used to measure residual stress inside a material. By analyzing the X-ray diffraction pattern of the material, the residual stress distribution inside the material is calculated.

GIWAXS is a technique to characterize the internal microstructure of thin film samples. The corresponding structure size is between 10nm and 1um, so it is widely used to characterize the crystallization inside solar thin film cells.

HRXRD is a powerful non-destructive testing method, and its research objects are mainly single crystal materials, single crystal epitaxial thin film materials and various low-dimensional semiconductor heterostructures.

In the development of X-ray imaging technology, X-ray imaging technology has formed a relatively complete X-ray non-destructive testing technology system. In order to meet the needs, new detection technology is constantly innovated, and X-ray online detection technology is adopted.

At the European XFEL X-ray laser, the researchers used scandium to create a more accurate pulse generator with an accuracy of one second in 300 billion years, about a thousand times more accurate than today's standard atomic clocks based on cesium.

The polycrystalline phenomenon of drugs refers to the formation of different crystal states of a compound molecule in the solid state due to the different crystal arrangement and filling methods. ​

The power conditions depend on the X-ray tube as the target material and focus type. Although Cu targets are widely used for diffraction, the use of Cu targets for residual austenite analysis is not recommended because of the strong fluorescence of iron-based materials.