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The in-situ medium and low temperature accessory​ is designed to understand the changes in crystal structure during the low-temperature refrigeration process; In order to provide a medium and low temperature (usually below room temperature but not extremely low temperature, such as a range between -100 ℃ and room temperature) sample environment for microscopes and other instruments. Vacuum environment: -196~500℃ Temperature control accuracy: ±0.5℃ Refrigeration method: liquid nitrogen (consumption less than 4L/h) Window material: Polyester film Cooling method: deionized water circulation cooling

High temperature accessory is designed to understand the changes in the crystal structure of samples during high-temperature heating, as well as the changes in mutual dissolution of various substances during high-temperature heating.  High-temperature accessory play a crucial role as important experimental and industrial equipment in multiple fields. Its wide range of application fields, precise technical parameters, and diverse product types make high-temperature accessory an indispensable part of scientific research and industrial production. technical parameter Temperature setting: Inert gas environment from room temperature to 1200 ℃ Vacuum environment with high temperature of 1600 ℃ Temperature control accuracy: ± 0.5 ℃ Window material: Polyester film

X-ray tubes specifically designed for analytical instruments： corrugated ceramic tubes, cermet tube , and glass tubes ，suitable for various models of XRD, XRF, crystal analyzers, and orientation instruments at home and abroad. X-ray tubes technical parameter： 1. Optional target material types: Cu, Co, Fe, Cr, Mo, Ti, W, etc 2. Focus type: 0.2 × 12mm² or 1 × 10mm² or 0.4 × 14mm² (fine focus)

Originally Battery Accessory, testing range: 0.5-160 degrees, temperature resistance: 400 ℃, beryllium window (polyester film) size: diameter 15mm (customizable); Thickness 0.1mm (customizable). They are widely used as X-ray diffractometer accessories in electrochemical systems containing carbon, oxygen, nitrogen sulfur, metal embedded complexes, etc. Originally Battery Accessory is used to fix the entire Originally Battery ​ sample stage on the angle measuring instrument of the X-ray diffractometer, serving as a connection and support.

Multi-function Sample Holder belongs to the X-ray diffractometer accessory(XRD accessory), which adopts advanced design technology and modular design ideas, and achieves functions such as rotation, lifting differential, and high-temperature oxidation resistance through the combination of different modules. Multi-function Sample Holder is suitable for various advanced thin film growth and deposition technologies, including MBE (molecular beam epitaxy), PLD (pulsed laser deposition), magnetron sputtering, and EB (electron beam evaporation), and can also be used for substrate annealing, high-temperature degassing, and material modification. The substrate of multi-function Sample Holder can reach a maximum heating temperature of 1100 ℃, and can be connected to RF/DC, with self rotation and a speed of 0-20 revolutions per minute. It is continuously adjustable and provides zero positioning. The modular design allows for multiple combination configurations to be selected, and the sample size can accommodate up to 8 inches. In summary, multi-function Sample Holder is a powerful and flexible experimental equipment, suitable for various scientific research and industrial applications as an X-ray diffractometer accessory (XRD accessory). The modular design and multiple functions of the multifunctional sample stage make it an indispensable tool in laboratories and industrial production.

Parallel optical film measuring accessory is a specialized tool for X-ray diffraction analysis, which filters out more scattered lines by increasing the length of the grating plate, thereby reducing the influence of the substrate signal on the results and enhancing the signal intensity of the thin film. In the field of materials science, parallel optical film measuring accessory is commonly used to study the crystal structure, phase transition behavior, and stress state of thin film materials. With the development of nanotechnology, parallel optical film measuring accessory has also been widely used in thickness testing and small angle diffraction analysis of nano multilayer films. The design and manufacturing of parallel optical film measuring accessory pursue high precision to meet the requirements of scientific research and industrial production for data accuracy. During use, parallel optical film measuring accessory need to maintain a high degree of stability to ensure the reliability of test results. With the advancement of technology and the development of industry, the demand for high-precision and high stability analytical instruments is constantly increasing. Parallel optical film measuring accessory, as an important component, are also experiencing sustained market demand growth. In order to meet market demand and improve product performance, the technology of parallel optical film measuring accessory is constantly innovating and improving. For example, improving the material and design of grating plates, optimizing the optical system, and other means can enhance the filtering effect and signal enhancement capability. In summary, parallel optical film measuring accessory play a crucial role in X-ray diffraction analysis. With the advancement of technology and the development of industry, its application prospects will become even broader.

The small angle diffractometer accessories are special device used in X-ray diffraction (XRD) experiments, mainly for measuring diffraction peaks in the low angle range to study the microstructure and properties of materials. The small angle diffractometer accessories are specialized device for X-ray diffractometers that allows for precise diffraction measurements within a lower 2θangle range (typically from 0°to 5°or lower). This technology is of great significance for studying nanostructures, mesoporous materials, multilayer films, and other materials. By configuring corresponding small angle diffractometer accessories, the thickness of nano multilayer films can be accurately measured. Overall, small angle diffractometer accessories are an indispensable and important component of X-ray diffractometers, with broad application prospects in materials science, chemistry, physics, and other fields.

Fiber accessories are tested for their unique crystal structure using X-ray diffraction (transmission) method. Test the orientation of the sample based on data such as fiber crystallinity and half peak width. Fiber accessories have a wide range of applications in various fields, including materials science, biomedicine, chemical engineering, nanotechnology, geological exploration, environmental monitoring, and more.

The cabinet X-ray irradiator system generates high-energy X-rays to irradiate cells or small animals. Used for various basic and applied research. In history, radioactive isotope irradiator equipment has been used, which requires transporting samples to a core irradiation facility. Today, smaller, safer, simpler, and lower cost X-ray irradiator devices can be installed in laboratories for convenient and rapid irradiator of cells. Various samples can be directly irradiated in the laboratory without affecting fertility or safety. This biological X-ray irradiator device is convenient for personnel without professional X-ray training to use, and there are no expensive license applications or maintenance costs for safety or radiation sources. The X-ray irradiator instrument is easy to operate, safe, reliable, and cost-effective, and can replace radioactive isotope sources.

The X-ray orientation analyzer is a device that uses the principle of X-ray diffraction to determine crystal orientation. It is widely used in fields such as materials science, geology, physics, etc., for studying crystal structure, lattice parameters, crystal defects, etc. The working principle of an X-ray orientation analyzer​ is to irradiate a monochromatic X-ray beam onto the crystal under test. When the X-ray interacts with atoms in the crystal, scattering occurs. According to Bragg's law, when the wavelength of X-rays is an integer multiple of the atomic spacing in a crystal, scattered light will interfere and form a series of alternating bright and dark stripes, known as Bragg reflection. By measuring the angles and intensities of these Bragg reflections, information such as crystal orientation and lattice parameters can be calculated. The X-ray orientation analyzer usually includes the following main parts: 1.X-ray source: a device that produces monochromatic X-rays, typically using an X-ray tube or synchrotron radiation source. 2.Sample stage: a platform used to place the crystal to be tested, which can adjust the position and angle of the crystal. 3.Detector: used to receive scattered X-rays and convert them into electrical signals. Common detectors include scintillation counters, proportional counters, etc. 4.Data acquisition and processing system: used to collect signals output by detectors, and perform data processing and analysis. Usually includes multi-channel analyzers, computers, and other equipment. 5.Control system: used to control the movement of X-ray source, sample stage, and detector to achieve measurement of crystals in different directions. By using an X-ray orientation analyzer, researchers can accurately determine the orientation and lattice parameters of crystals, thereby gaining a deeper understanding of their structure and properties. This is of great significance for the development of new materials, geological exploration, crystal growth and other fields.