Three single point detectors are shared below: proportional counter, scintillation counter, and semiconductor solid state detector.

X-ray crystal analyzer is a kind of large analytical instrument for studying the internal microstructure of substances, mainly used in single crystal orientation, defect detection, residual stress determination, single crystal dislocation and so on.

X-ray diffraction, through the X-ray diffraction of a material, the analysis of its diffraction pattern, to obtain the composition of the material, the structure or shape of the atoms or molecules inside the material and other research means.

XRF instruments use X-rays to "excite" a material in order to characterize its composition by identifying elements in the sample (qualitative analysis) or by determining the strength of an element in the sample (quantitative analysis)

This procedure is a self-developed procedure. It contains a variety of quantitative analysis functions developed by ourselves, which are in accordance with the diffraction theory and are calculated by integral intensity.

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