The 7th China-Russia Expo will be held in Ekaterinburg from July 10 to 13, 2023. As an exhibitor, Dandong Tongda Technology Co., Ltd. is honored to participate in this meeting. Many participants came to our booth to understand the configuration and performance of related products, and gave affirmation to the diffractometer series products developed by our company.

Since its inception, Dandong Tongda Technology Co., Ltd. has put the value of employees on the company philosophy. They are not optional workers, they are partners, friends, is to achieve the company's continuous development and growth of the primary contributors, this point can be said to be real experience in Tongda.

X-ray diffractometer , also known as X-ray crystal diffractometer, abbreviated XPD or XRD, is an instrument to study the internal microstructure of matter. X-ray diffractometer has the advantages of high precision, high stability and convenient operation.

X-Ray Diffraction (XRD) is a major method for studying the phase and crystal structure of a substance. When a substance (crystal or non-crystal) is diffraction analysis, the substance is irradiated by X-rays to produce different degrees of diffraction phenomenon, material composition, crystal type, intramolecular bonding mode, molecular configuration, conformation and other material characteristics determine the specific diffraction pattern of the substance.

It uses the X-ray principle to carry out qualitative or quantitative analysis and crystal structure analysis of polycrystalline materials such as powder samples and metal samples.

Dandong Tongda Technology Co., LTD., is an innovative enterprise specializing in the development, production and sales of X-ray products and equipment. Since its establishment, Dandong Tongda Technology has always paid attention to the development of new technologies and new concepts in the world, and has brought together a group of high-level R & D teams with rich experience in the field of X-ray diffractometer research.

TD-5000 single crystal X-ray diffractometer is mainly used to determine the three-dimensional spatial structure and electron cloud density of crystalline substances such as inorganic substances and organic substances, and analyze the structure of special materials such as twins, inhomogeneous crystals and quasicrystals.