X-ray diffractometer is mainly used for phase characterization, quantitative analysis, crystal structure analysis, material structure analysis, crystal orientation analysis of powder, block or thin film samples, etc.

Due to the different crystallization conditions, the particles of powder drug samples will have different morphologies.

Researchers at the synchrotron radiation facility SPring-8 at the RIKEN Research Institute in Japan and their collaborators have developed a faster and simpler way to perform segmentation analysis, an important process in materials science.

In X-ray analysis, an instrument used to measure the Angle between an incident X-ray beam and a diffracted X-ray beam. The diffractometer automatically maps the variation of the diffraction intensity with the 2θ Angle.

Researchers have developed an X-ray imaging technique that produces detailed images of organisms at much lower X-ray doses than previously possible.

Polycrystalline X-ray diffractometer, also known as powder diffractometer, is usually used to measure powder, polycrystalline metal or polymer bulk materials.

XRD as a qualitative analysis means is not blind, with the help of analysis software just for convenience, fundamentally speaking, the most important thing is the XRD pattern itself.

As a new material characterization technology, PDF (Pair Distribution Function) is useful in the study of the local structure of both crystal and amorphous materials.

The structural stability of SBA-15 is closely related to its pore size and properties, and XRD is one of the effective methods to characterize its structure.

The full name of XRD is X-ray diffraction, which uses the diffraction phenomenon of X-ray in the crystal to obtain the X-ray signal characteristics after diffraction, and gets the diffraction pattern after processing.