X-ray diffractometer is mainly used for phase characterization, quantitative analysis, crystal structure analysis, material structure analysis, crystal orientation analysis of powder, block or thin film samples. Measurement of macroscopic stress or microscopic stress, measurement of grain size, measurement of crystallinity, etc.

Advantages of TD series X-ray Diffractometer:

1.With independent intellectual property rights, and the national invention patents of the programmable

logic controller (PLC) contro| technology;

2.Easy operation,one-button acquisition system;

3.Modular design, instrument accessories plug and play, no calibration required;

4.Touch screen is used for real-time online monitoring to display instrument status;

5.Electronic lead door interlocking devicedouble protection to ensure user safety;

6.High frequency and high voltage X-ray generator, stable and reliable performance;

7.Advanced record control unit, strong anti-interference abilit

                      TD-3500 XRD                                                                    TD-3700 XRD

                            TDM-20 XRD                                                              TDM-10 XRD