X-rays are a type of electromagnetic radiation widely used in medical and industrial fields. Although most X-rays are produced artificially, there are also some phenomena in nature that produce X-rays.

Based on Bragg's Law, in-situ X-ray diffraction (XRD) can be used to monitor the change of phase and its lattice parameters in the electrode or electrode-electrolyte interface in real time during the charge-discharge cycle of a battery.

X-ray testing is a non-destructive testing method that does not damage the object itself, and has been widely used in material testing (QC), failure analysis (FA), quality control (QC), quality assurance and reliability (QA/QC), research and development (R&D) and other fields.

Three single point detectors are shared below: proportional counter, scintillation counter, and semiconductor solid state detector.

X-ray crystal analyzer is a kind of large analytical instrument for studying the internal microstructure of substances, mainly used in single crystal orientation, defect detection, residual stress determination, single crystal dislocation and so on.

X-ray diffraction, through the X-ray diffraction of a material, the analysis of its diffraction pattern, to obtain the composition of the material, the structure or shape of the atoms or molecules inside the material and other research means.

XRF instruments use X-rays to "excite" a material in order to characterize its composition by identifying elements in the sample (qualitative analysis) or by determining the strength of an element in the sample (quantitative analysis)

X-ray diffraction is the most effective and most widely used means, and X-ray diffraction is the first method used by humans to study the microstructure of matter.

X-rays are a type of short-wavelength electromagnetic radiation, between ultraviolet and gamma rays， that was developed by the German physicist W.K. It was discovered by Roentgen in 1895, so it is also called Roentgen rays.

X-ray diffractometer is mainly used for phase characterization, quantitative analysis, crystal structure analysis​, material structure analysis, crystal orientation analysis of powder, block or thin film samples.