The multifunctional integratedmeasuring accessories are used for analyzing films on boards, blocks, and substrates, and can perform tests such as crystal phase detection, orientation, texture, stress, and in-plane structure of thin films. Multifunctional integrated measuring accessories are typically designed to enhance the functionality of X-ray diffractometer , enabling them to adapt to more diverse testing needs. There is a close relationship between multifunctional integrated measurement accessories and X-ray diffractometer. These accessories not only enhance the functionality and performance of X-ray diffractometer, but also improve its ease of operation and safety. In practical applications, users can choose suitable accessories according to their specific needs to expand the application scenarios of X-ray diffractometer and improve measurement efficiency.

X-ray tubes specifically designed for analytical instruments： corrugated ceramic tubes, cermet tube , and glass tubes ，suitable for various models of XRD, XRF, crystal analyzers, and orientation instruments at home and abroad. X-ray tubes technical parameter： 1. Optional target material types: Cu, Co, Fe, Cr, Mo, Ti, W, etc 2. Focus type: 0.2 × 12mm² or 1 × 10mm² or 0.4 × 14mm² (fine focus)

Originally Battery Accessory, testing range: 0.5-160 degrees, temperature resistance: 400 ℃, beryllium window (polyester film) size: diameter 15mm (customizable); Thickness 0.1mm (customizable). They are widely used as X-ray diffractometer accessories in electrochemical systems containing carbon, oxygen, nitrogen sulfur, metal embedded complexes, etc. Originally Battery Accessory is used to fix the entire Originally Battery ​ sample stage on the angle measuring instrument of the X-ray diffractometer, serving as a connection and support.

Parallel optical film measuring accessory is a specialized tool for X-ray diffraction analysis, which filters out more scattered lines by increasing the length of the grating plate, thereby reducing the influence of the substrate signal on the results and enhancing the signal intensity of the thin film. In the field of materials science, parallel optical film measuring accessory is commonly used to study the crystal structure, phase transition behavior, and stress state of thin film materials. With the development of nanotechnology, parallel optical film measuring accessory has also been widely used in thickness testing and small angle diffraction analysis of nano multilayer films. The design and manufacturing of parallel optical film measuring accessory pursue high precision to meet the requirements of scientific research and industrial production for data accuracy. During use, parallel optical film measuring accessory need to maintain a high degree of stability to ensure the reliability of test results. With the advancement of technology and the development of industry, the demand for high-precision and high stability analytical instruments is constantly increasing. Parallel optical film measuring accessory, as an important component, are also experiencing sustained market demand growth. In order to meet market demand and improve product performance, the technology of parallel optical film measuring accessory is constantly innovating and improving. For example, improving the material and design of grating plates, optimizing the optical system, and other means can enhance the filtering effect and signal enhancement capability. In summary, parallel optical film measuring accessory play a crucial role in X-ray diffraction analysis. With the advancement of technology and the development of industry, its application prospects will become even broader.

Fiber accessories are tested for their unique crystal structure using X-ray diffraction (transmission) method. Test the orientation of the sample based on data such as fiber crystallinity and half peak width. Fiber accessories have a wide range of applications in various fields, including materials science, biomedicine, chemical engineering, nanotechnology, geological exploration, environmental monitoring, and more.

The cabinet X-ray irradiator system generates high-energy X-rays to irradiate cells or small animals. Used for various basic and applied research. In history, radioactive isotope irradiator equipment has been used, which requires transporting samples to a core irradiation facility. Today, smaller, safer, simpler, and lower cost X-ray irradiator devices can be installed in laboratories for convenient and rapid irradiator of cells. Various samples can be directly irradiated in the laboratory without affecting fertility or safety. This biological X-ray irradiator device is convenient for personnel without professional X-ray training to use, and there are no expensive license applications or maintenance costs for safety or radiation sources. The X-ray irradiator instrument is easy to operate, safe, reliable, and cost-effective, and can replace radioactive isotope sources.

The X-ray orientation analyzer is a device that uses the principle of X-ray diffraction to determine crystal orientation. It is widely used in fields such as materials science, geology, physics, etc., for studying crystal structure, lattice parameters, crystal defects, etc. The working principle of an X-ray orientation analyzer​ is to irradiate a monochromatic X-ray beam onto the crystal under test. When the X-ray interacts with atoms in the crystal, scattering occurs. According to Bragg's law, when the wavelength of X-rays is an integer multiple of the atomic spacing in a crystal, scattered light will interfere and form a series of alternating bright and dark stripes, known as Bragg reflection. By measuring the angles and intensities of these Bragg reflections, information such as crystal orientation and lattice parameters can be calculated. The X-ray orientation analyzer usually includes the following main parts: 1.X-ray source: a device that produces monochromatic X-rays, typically using an X-ray tube or synchrotron radiation source. 2.Sample stage: a platform used to place the crystal to be tested, which can adjust the position and angle of the crystal. 3.Detector: used to receive scattered X-rays and convert them into electrical signals. Common detectors include scintillation counters, proportional counters, etc. 4.Data acquisition and processing system: used to collect signals output by detectors, and perform data processing and analysis. Usually includes multi-channel analyzers, computers, and other equipment. 5.Control system: used to control the movement of X-ray source, sample stage, and detector to achieve measurement of crystals in different directions. By using an X-ray orientation analyzer, researchers can accurately determine the orientation and lattice parameters of crystals, thereby gaining a deeper understanding of their structure and properties. This is of great significance for the development of new materials, geological exploration, crystal growth and other fields.

The TD-5000 X-ray single crystal diffractometer is mainly used to determine the three-dimensional spatial structure and electron cloud density of crystalline substances such as inorganic, organic, and metal complexes, and to analyze the structure of special materials such as twinning, non commensurate crystals, quasicrystals, etc. Determine the accurate three-dimensional space (including bond length, bond angle, configuration, conformation, and even bonding electron density) of new compound (crystalline) molecules and the actual arrangement of molecules in the lattice; Single crystal X-ray diffractometer can provide information on crystal cell parameters, space group, crystal molecular structure, intermolecular hydrogen bonding and weak interactions, as well as structural information such as molecular configuration and conformation. Single crystal XRD is widely used in analytical research in chemical crystallography, molecular biology, pharmacology, mineralogy, and materials science. The single crystal diffractometer adopts the four circle concentricity technique to ensure that the center of the angle measuring instrument remains unchanged regardless of the rotation, achieving the goal of obtaining the most accurate data and obtaining higher integrity. Four circle concentricity is a necessary condition for conventional single crystal scanning. The company's technical personnel have completed the installation and debugging of the foreign single crystal X-ray diffractometer, and the test results have greatly satisfied foreign users. At the same time, the functionality, stability, and after-sales service of the instrument have received unanimous praise from foreign users.

The TDM-20 desktop X-ray diffractometer is mainly used for phase analysis of powders, solids, and similar paste like materials.Benchtop XRD utilizes the principle of X-ray diffractometer to perform qualitative or quantitative analysis, crystal structure analysis, and other polycrystalline materials such as powder samples and metal samples. The TDM-20 desktop X-ray diffractometer is widely used in industries such as industry, agriculture, national defense, pharmaceuticals, minerals, food safety, petroleum, education, and scientific research. The loading of a new high-performance array detector has led to a significant improvement in the performance of benchtop XRD。 Benchtop XRD equipment has a small volume and light weight; The working power of the Benchtop XRD high-voltage power supply can reach 1600 watts; Benchtop XRD can quickly calibrate and test samples; Benchtop XRD circuit control is simple and easy to debug and install; The repeatability of the Benchtop XRD angle can reach 0.0001.

The TD-3700 high-resolution X-ray diffractometer, with all the advantages of the TD-3500 X-ray diffractometer, is equipped with a high-performance array detector. Compared to scintillation detectors or proportional detectors, diffraction calculation intensity can be increased by several tens of times, and complete high-sensitivity, high-resolution diffraction patterns and higher counting intensity can be obtained in a shorter sampling period. The TD-3700 high-resolution X-ray diffractometer supports both conventional diffraction data scanning and transmission data scanning methods. The resolution of transmission mode is much higher than that of diffraction mode, which is suitable for structural analysis and other fields. Diffraction mode has strong diffraction signals and is more suitable for routine phase identification in the laboratory. In addition, in the transmission mode, the powder sample can be in trace amounts, which is suitable for data acquisition in cases where the sample size is relatively small and does not meet the requirements of diffraction method for sample preparation.

The TD series diffractometer embodies the essence of Tongda Technology's research and development over the years, evolving with the demands of the times. X-ray diffractometer is mainly used for phase qualitative and quantitative analysis, crystal structure analysis, material structure analysis, crystal orientation analysis, macroscopic or microscopic stress determination, grain size determination, crystallinity determination, etc. of powder, block or film samples. The TD-3500 X-ray diffractometer produced by Dandong Tongda Technology Co., Ltd. adopts imported Siemens PLC control, which makes the TD-3500 X-ray diffractometer have the characteristics of high accuracy, high precision, good stability, long service life, easy upgrade, easy operation and intelligence, and can flexibly adapt to testing analysis and research in various industries! Angle measuring instrument with hollow shaft structure

A high-precision X-ray single crystal diffractometer designed specifically for materials science research, crystal structure analysis, and industrial quality control. It utilizes the diffraction effect generated by the interaction between X-rays and single crystals to provide users with detailed crystal structure information by accurately measuring diffraction angles and intensities, thereby revealing the microstructure and properties of materials.