The WBK-01 X-ray system produces high-energy X-rays to irradiate cells or small animals. For a variety of basic research and applied research.

The Mid-Autumn Festival, the festival celebration! Dandong Tongda Technology Co., Ltd. for all employees to issue Mid-Autumn Festival benefits!

The principle of many characterization devices is to make electrons interact with substances that need to be detected, excite secondary electrons, or make atomic level transitions and backtrips, and release characteristic energy.

As the demand for lithium batteries continues to grow, their production and safety standards urgently need to be improved, so high-resolution, high-throughput 3D inspection systems are essential.

XRD can measure bulk and powder samples, and has different requirements for different sample sizes and properties.

In August 2023, under the leadership of the company, the big family of Dandong Tongda Technology Co., Ltd. in Liaoning Province held an outdoor dinner on the eve of the end of the month.

Global X-ray diffractometer (XRD) has developed steadily in recent years, and China is a market with great development prospects.

Taking deposition scaling as an example, this paper introduces how to use X-ray diffractometer for qualitative phase and quantitative analysis.

The application of new technologies and new products such as 5G, big data, and artificial intelligence will bring a huge semiconductor market demand, and global semiconductor equipment spending has entered an upward cycle.

The previous one detailed and complete introduction of the company's pre-sale, sale and after-sales service, today introduced is our company's product training related content.

In recent years, there has been a growing interest in the measurement of high-pressure biological samples. This is reflected in the development of new techniques for pressure measurement that are different from those implemented by DAC. One of them is the technique of freezing crystals under pressure.

High-resolution XRD (HR-XRD) is a common method for measuring the composition and thickness of compound semiconductors such as SiGe, AlGaAs, InGaAs, etc.