Global X-ray diffractometer (XRD) has developed steadily in recent years, and China is a market with great development prospects.

Taking deposition scaling as an example, this paper introduces how to use X-ray diffractometer for qualitative phase and quantitative analysis.

The application of new technologies and new products such as 5G, big data, and artificial intelligence will bring a huge semiconductor market demand, and global semiconductor equipment spending has entered an upward cycle.

High-resolution XRD (HR-XRD) is a common method for measuring the composition and thickness of compound semiconductors such as SiGe, AlGaAs, InGaAs, etc.

X-ray diffractometer (XRD) can be divided into X-ray powder diffractometer and X-ray single crystal diffractometer, the basic physical principle of the two is the same.

XRD is a means of research which is Diffraction by X-Ray diffraction of a material to analyze its diffraction pattern to obtain information such as the composition of the material, the structure or shape of atoms or molecules inside the material.

Grazing-incidence X-ray diffraction (GI-XRD) is a kind of X-ray diffraction technique, which is different from the traditional XRD experiment, mainly by changing the Angle of X-ray incidence and the orientation of the sample.

X-ray diffraction (XRD) is currently a powerful method for studying crystal structure (such as the type and location distribution of atoms or ions and their groups, cell shape and size, etc.).

Based on Bragg's Law, in-situ X-ray diffraction (XRD) can be used to monitor the change of phase and its lattice parameters in the electrode or electrode-electrolyte interface in real time during the charge-discharge cycle of a battery.

X-ray diffraction, through the X-ray diffraction of a material, the analysis of its diffraction pattern, to obtain the composition of the material, the structure or shape of the atoms or molecules inside the material and other research means.

Some "JADE software to analyze and process XRD data" related content.

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