Many materials through rolling, extrusion and other deformation processes, or even if not deformed, the grains in the polycrystal show more or less statistical uneven distribution, this organizational structure is called texture.

The precursor of ternary material is a low-cost compound of variable valence metal, which will be oxidized in the air, and the higher the drying temperature, the more serious the oxidation degree, and the general choice of air atmosphere drying.

As a means of characterizing crystal structure and its change rule, XRD is widely used in many fields such as materials, chemistry, ceramics, metallurgy and minerals.

The main indicators of polymer materials include the type of polymer or its crystallinity. Polymers also exhibit different microstructure, which can also affect the mechanical .properties of polymer materials.

An important indicator of XRD is that there is a very good X-ray light source. The so-called good X-ray light source usually refers to high intensity, high parallelism and high purity. This paper will introduce one of the core technologies of neo-Confucianism, CBO optical path.

X-ray diffraction technology is widely used in the research of lithium-ion batteries. XRD is a conventional method for qualitative and quantitative analysis of phases in materials.

XRD can measure bulk and powder samples, and has different requirements for different sample sizes and properties.

Global X-ray diffractometer (XRD) has developed steadily in recent years, and China is a market with great development prospects.

Taking deposition scaling as an example, this paper introduces how to use X-ray diffractometer for qualitative phase and quantitative analysis.

The application of new technologies and new products such as 5G, big data, and artificial intelligence will bring a huge semiconductor market demand, and global semiconductor equipment spending has entered an upward cycle.

High-resolution XRD (HR-XRD) is a common method for measuring the composition and thickness of compound semiconductors such as SiGe, AlGaAs, InGaAs, etc.

X-ray diffractometer (XRD) can be divided into X-ray powder diffractometer and X-ray single crystal diffractometer, the basic physical principle of the two is the same.