X-ray diffraction is a commonly used non-destructive analytical technique that can be used to reveal the crystal structure, chemical composition, and physical properties of substances.

X-ray diffraction, through the X-ray diffraction of a material, the analysis of its diffraction pattern, to obtain the composition of the material, the structure or shape of the atoms or molecules inside the material and other research means.

According to the position and intensity changes of in-situ XRD diffraction peaks, the intermediates generated during the cycle can be inferred, and the reaction mechanism can be further derived from these intermediates.

X-ray diffraction runs through every stage of drug quality control, such as the study of raw materials and preparations.

Residual stress has a great impact on the dimensional stability, stress corrosion resistance, fatigue strength, phase change and other properties of materials and components. Its measurement has been widely concerned by academia and industry.

Recently, A new study successfully fused metal oxides with zeolite A, and revealed the mystery of this process through XRD and FTIR technology.

XRD, is short for X-ray diffraction, as a material person, no matter what material is done, XRD is the most commonly used, the most basic means of characterization.

X-ray Absorption Fine Structure(XAFS) is a powerful tool for studying the local atomic or electronic struct ure of materials based on synchrotron radiation light source.

When a beam of extremely thin X-rays passes through a material with an uneven electron density of nanometer size, the X-rays will spread out in a small angular region near the direction of the original beam, this phenomenon is called small-angle X-ray scattering.

Small-angle X-ray scattering is the diffuse scattering of electrons to X-rays in the small Angle range near the original beam. Small-angle scattering occurs in all materials with non-uniform electron density on the nanometer scale.

Small Angle X-ray diffraction (SAXD) is mainly used to determine the spacing of very large crystal faces or the structure of thin films.