X-ray crystallography is a technique used to determine the atomic and molecular structure of a crystal, where the crystal structure causes the incident X-ray beam to diffract into many specific directions.

Based on Bragg's Law, in-situ X-ray diffraction (XRD) can be used to monitor the change of phase and its lattice parameters in the electrode or electrode-electrolyte interface in real time during the charge-discharge cycle of a battery.

Three single point detectors are shared below: proportional counter, scintillation counter, and semiconductor solid state detector.

X-ray diffraction, through the X-ray diffraction of a material, the analysis of its diffraction pattern, to obtain the composition of the material, the structure or shape of the atoms or molecules inside the material and other research means.

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X-ray diffraction is the most effective and most widely used means, and X-ray diffraction is the first method used by humans to study the microstructure of matter.

X-rays are a type of short-wavelength electromagnetic radiation, between ultraviolet and gamma rays， that was developed by the German physicist W.K. It was discovered by Roentgen in 1895, so it is also called Roentgen rays.

When X-ray diffraction is projected into a crystal as an electromagnetic wave, it is scattered by the atoms in the crystal, and the scattered waves appear to emanate from the center of the atoms, and the scattered waves emitted from the center of each atom are similar to the source spherical waves.

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