Crystals, although long admired for their regularity and symmetry, were not studied scientifically until the 17th century. Let's take a look at the early history of crystallography.

Using the principle of X-ray diffraction, the cutting Angle of natural and artificial single crystals is accurately and quickly determined, and the cutting machine is equipped for directional cutting of the said crystals.

The method of assisting internal stress without additional energy proposed in this paper provides an economical and convenient new strategy for improving battery reaction dynamics.

XRD can measure bulk and powder samples, and has different requirements for different sample sizes and properties.

Global X-ray diffractometer (XRD) has developed steadily in recent years, and China is a market with great development prospects.

Taking deposition scaling as an example, this paper introduces how to use X-ray diffractometer for qualitative phase and quantitative analysis.

The application of new technologies and new products such as 5G, big data, and artificial intelligence will bring a huge semiconductor market demand, and global semiconductor equipment spending has entered an upward cycle.

High-resolution XRD (HR-XRD) is a common method for measuring the composition and thickness of compound semiconductors such as SiGe, AlGaAs, InGaAs, etc.

XRD is a means of research which is Diffraction by X-Ray diffraction of a material to analyze its diffraction pattern to obtain information such as the composition of the material, the structure or shape of atoms or molecules inside the material.

Grazing-incidence X-ray diffraction (GI-XRD) is a kind of X-ray diffraction technique, which is different from the traditional XRD experiment, mainly by changing the Angle of X-ray incidence and the orientation of the sample.

It is necessary to reduce the harmful residual stress and predict the distribution trend and value of residual stress. In this paper, the non-destructive testing method of residual stress testing is introduced.

X-ray diffraction (XRD) is currently a powerful method for studying crystal structure (such as the type and location distribution of atoms or ions and their groups, cell shape and size, etc.).