In the fields of materials science and industrial testing, precise sample analysis relies on reliable instruments. The rotating sample stage produced by Dandong Tongda Technology Co., Ltd. is precisely such a critical accessory dedicated to enhancing the quality of X-ray diffraction (XRD) analysis. In X-ray diffraction analysis, the characteristics of the sample itself often pose challenges. For example, when the grains are excessively coarse, the material exhibits significant texture (or "preferred orientation," meaning the grains are not randomly arranged), or the sample has specific crystal habits (crystal growth patterns), obtaining diffraction data that is statistically representative and truly reflects the overall material properties becomes difficult. When measuring such samples with traditional static sample stages, the diffraction intensity may be distorted due to the aforementioned factors, affecting the accuracy of phase identification, texture analysis, and other evaluations. The core design philosophy of Tongda Technology's rotating sample stage is to address these challenges by enabling smooth rotation of the sample within its own plane. Core Function: Eliminating Orientation Errors and Enhancing Data Reliability The working principle of this rotating sample stage is intuitive and effective. By driving the sample to rotate continuously or in a stepwise manner, it ensures that the X-ray beam covers more grains with different orientations on the sample during irradiation. The main advantages of this approach are: Effective Reduction of Measurement Errors: Through the rotation averaging effect, it significantly mitigates measurement deviations caused by coarse grains or preferred orientation, making the diffraction data more representative of the material's overall properties. Ensuring Result Reproducibility: Whether the sample itself has texture or not, it guarantees good reproducibility of diffraction intensity across multiple measurements or between different laboratories, enhancing the reliability and comparability of data. Simplified Sample Preparation Requirements: It reduces the stringent demands for perfect sample preparation to a certain extent, improving analysis efficiency. Technical Specifications: Precision Control and Flexible Adaptability The rotating sample stage from Dandong Tongda Technology offers the following key technical parameters to meet the rigorous demands of scientific research and industrial testing: ParameterDescription Rotation Methodβ-axis (sample rotates within its own plane) Rotation Speed Range1 ~ 60 RPM (revolutions per minute) Adjustable based on experimental requirements Stepping PrecisionMinimum step width: 0.1º Supports high-precision positioning scanning Operation ModesConstant-speed rotation (for sample scanning), stepping, continuous, and other modes Adapts to various testing workflows and data acquisition needs Typical ApplicationsQuality control and R&D in industries such as environmental protection and electronics CompatibilityPrimarily used as an accessory for X-ray diffraction spectrometers (XRD) Application Scenarios: Serving the Environmental Protection and Electronics Industries This rotating sample stage is not merely a "showpiece" in the laboratory; it directly serves industries with high requirements for material analysis, such as environmental protection and electronics. In areas such as quality control, new product development, and failure analysis in these fields, it assists engineers and researchers in conducting more accurate phase analysis on samples of various forms, including powders, bulk materials, and thin films, ensuring the authenticity and reliability of data.

Dandong Tongda's X-ray Crystal Analyzer adopts advanced X-ray diffraction technology, enabling non-destructive detection of microstructural information in various materials. Whether it's single crystal orientation, defect inspection, lattice parameter measurement, or residual stress analysis, this instrument provides accurate and reliable test data, offering solid support for material research and quality control. The instrument is equipped with a highly stable X-ray generator that delivers exceptional performance. The tube voltage can be precisely adjusted within the range of 10-60kV, and the tube current can be regulated from 2-60mA, with a stability of no more than ±0.005%. This ensures highly repeatable and accurate test results, providing researchers with dependable data assurance. Dandong Tongda's X-ray Crystal Analyzer integrates intelligent control and comprehensive safety protection. It features an imported PLC automatic control system, enabling unattended automatic timed measurements. The multi-level safety protection system includes no-pressure, no-current, over-voltage, over-current, over-power, no-water, and X-ray tube over-temperature protections, ensuring the safety of operators. The TDF series X-ray crystal analyzer adopts a vertical tube housing with four windows that can be used simultaneously. It utilizes imported PLC control technology, which offers high precision and strong anti-interference capabilities, ensuring the reliable operation of the system. The PLC controls the switching and adjustment of high voltage and includes an automatic training function for the X-ray tube, effectively extending the service life of both the X-ray tube and the instrument. The instrument's radiation protection enclosure is constructed with high-density, high-transparency leaded glass, with external radiation leakage far below national safety standards, allowing researchers to conduct experimental studies in a secure environment. As a national high-tech enterprise, Dandong Tongda Technology Co., Ltd. has a comprehensive quality management system and a technical R&D team. Its products not only meet domestic market demands but are also exported to numerous countries and regions, demonstrating the strength and capability of China's scientific instrument manufacturing. Dandong Tongda's X-ray Crystal Analyzer, with its outstanding performance and reliable quality, has become a powerful assistant in the field of material analysis. It helps researchers and engineers unveil the layers of the material world and explore more unknown possibilities.

The small angle diffraction attachment is a specialized component used in X-ray diffraction instruments, mainly for the analysis of the structure and thickness of nanoscale materials. 1. Core functions of small angle diffraction attachments (1) Diffraction angle range: covering a small angle range of 0 ° -5 °, suitable for diffraction analysis of nanoscale materials. (2) Main application: It can accurately test the thickness of nano multilayer films and support the study of material surface or interface structure. 2. Compatible devices for small angle diffraction attachments This attachment is usually used in conjunction with X-ray diffractometers (such as TD-3500, TD-3700, TDM-20, etc.). 3. Application scenarios of small angle diffraction attachments (1) Materials Science: Characterization of Nanofilm and Multilayer Film Structures. (2) Chemistry and Chemical Engineering: Surface Treatment of Materials, Testing of Coating Thickness. (3) Other fields: Nanoscale analysis of materials such as geology, minerals, ceramics, and pharmaceuticals. 4. Manufacturer information Dandong Tongda Technology Co., Ltd. is the main manufacturer of this type of accessory, and its TD series analytical instruments have been mentioned as approaching or reaching international standards, and exported to countries such as the United States and Azerbaijan. In general, small angle diffraction attachments are key tools for nanomaterial analysis and thin film thickness measurement, and need to be used in conjunction with specialized X-ray diffraction instruments. Their application scenarios are concentrated in cutting-edge fields such as materials science and chemical engineering.

The TDM-10 desktop x ray diffraction instrumentation is an instrument used for analyzing the phase structure of materials, which can be equipped with scintillation/proportional/linear array detectors. 1. The working principle of TDM-10 desktop x ray diffraction instrumentation:Based on Bragg's law, when a monochromatic X-ray beam is incident on a crystal, if the Bragg diffraction condition is satisfied (n λ=2dsin θ, where λ is the wavelength of the X-ray, d is the interplanar spacing, and θ is the incident angle), atoms or molecules in the crystal will scatter and interfere with the X-ray, forming a specific diffraction pattern. By measuring the diffraction intensity at different angles, the structural information of the crystal can be obtained. 2. Characteristics of TDM-10 desktop x ray diffraction instrumentation: The high resolution of a desktop x ray diffraction instrumentation enables precise measurement of the crystal structure of substances, which is crucial for studying complex mixtures or searching for low content polycrystalline and trace phases. Non destructive analysis of desktop x ray diffraction instrumentation: During the testing process, it will not cause damage to the sample, and the sample can remain in its original state for further testing or use. The operation of desktop X-ray powder diffraction equipment is simple: Modern desktop X-ray powder diffraction equipment usually have automation and intelligence functions, making the operation more convenient and reducing the requirements for the operator's professional knowledge and skills. The versatility of desktop X-ray powder diffraction equipment: X-ray powder diffraction equipment can perform various analyses such as phase qualitative and quantitative analysis, lattice constant analysis, stress analysis, etc. 3. Technical parameters of TDM-10 desktop X-ray powder diffraction equipment: Desktop x ray diffraction machine has a small volume; High frequency and high voltage power supply reduces the overall power consumption of the machine; Can quickly calibrate and test samples; Simple circuit control, easy to debug and install; The measurement accuracy of diffraction peak position is 0.001 °; Detector: scintillation, proportional, linear array; Range of 2 θ:- 10°~150° Power: 600W; Maximum voltage: 40kV； Maximum current: 15mA； X-ray tubes: corrugated ceramic tubes, metal ceramic tubes, glass tubes. 4. Application areas of TDM-10 desktop x ray diffraction machine: Materials Science: Used to study the crystal structure, phase composition, grain size, crystallinity, etc. of metals, ceramics, semiconductors, and other materials, helping materials scientists understand the properties and characteristics of materials. In the field of chemistry, x ray diffraction machine can be used in the manufacturing industry of catalysts, cement, pharmaceuticals, and other products to identify phases in unknown samples, as well as to quantitatively analyze known phases in mixed samples. Geology: Conducting phase analysis on ores, rocks, etc. to determine their mineral composition and structure. Environmental science: used to analyze the mineral composition and pollutant forms in environmental samples such as soil and sediment. Food industry: detecting crystal components, additives, etc. in food. The TDM-10 desktop x ray diffraction machine is a powerful analytical instrument with important application value in multiple fields.

Fiber accessories are tested for their unique crystal structure using X-ray diffraction (transmission) method. Test the orientation of the sample based on data such as fiber texture and half peak width.

Fiber accessories are tested for their unique crystal structure using X-ray diffraction (transmission) method. Test the orientation of the sample based on the fiber crystallinity and half peak width of the fibers. This type of accessory is usually installed on a wide-angle diffractometer and is mainly used to study the texture of thin films on the substrate, perform crystal phase detection, orientation, stress testing, and other tests.

Parallel optical film measuring accessory is a specialized tool for X-ray diffraction analysis, which filters out more scattered lines by increasing the length of the grating plate, thereby reducing the influence of the substrate signal on the results and enhancing the signal intensity of the thin film. In the field of materials science, parallel optical film measuring accessory is commonly used to study the crystal structure, phase transition behavior, and stress state of thin film materials. With the development of nanotechnology, parallel optical film measuring accessory has also been widely used in thickness testing and small angle diffraction analysis of nano multilayer films. The design and manufacturing of parallel optical film measuring accessory pursue high precision to meet the requirements of scientific research and industrial production for data accuracy. During use, parallel optical film measuring accessory need to maintain a high degree of stability to ensure the reliability of test results. With the advancement of technology and the development of industry, the demand for high-precision and high stability analytical instruments is constantly increasing. Parallel optical film measuring accessory, as an important component, are also experiencing sustained market demand growth. In order to meet market demand and improve product performance, the technology of parallel optical film measuring accessory is constantly innovating and improving. For example, improving the material and design of grating plates, optimizing the optical system, and other means can enhance the filtering effect and signal enhancement capability. In summary, parallel optical film measuring accessory play a crucial role in X-ray diffraction analysis. With the advancement of technology and the development of industry, its application prospects will become even broader.

The small angle diffractometer accessories are special device used in X-ray diffraction (XRD) experiments, mainly for measuring diffraction peaks in the low angle range to study the microstructure and properties of materials. The small angle diffractometer accessories are specialized device for X-ray diffractometers that allows for precise diffraction measurements within a lower 2θangle range (typically from 0°to 5°or lower). This technology is of great significance for studying nanostructures, mesoporous materials, multilayer films, and other materials. By configuring corresponding small angle diffractometer accessories, the thickness of nano multilayer films can be accurately measured. Overall, small angle diffractometer accessories are an indispensable and important component of X-ray diffractometers, with broad application prospects in materials science, chemistry, physics, and other fields.

Fiber accessories are tested for their unique crystal structure using X-ray diffraction (transmission) method. Test the orientation of the sample based on data such as fiber crystallinity and half peak width. Fiber accessories have a wide range of applications in various fields, including materials science, biomedicine, chemical engineering, nanotechnology, geological exploration, environmental monitoring, and more.

The TD-3700 high-resolution X-ray diffractometer, with all the advantages of the TD-3500 X-ray diffractometer, is equipped with a high-performance array detector. Compared to scintillation detectors or proportional detectors, diffraction calculation intensity can be increased by several tens of times, and complete high-sensitivity, high-resolution diffraction patterns and higher counting intensity can be obtained in a shorter sampling period. The TD-3700 high-resolution X-ray diffractometer supports both conventional diffraction data scanning and transmission data scanning methods. The resolution of transmission mode is much higher than that of diffraction mode, which is suitable for structural analysis and other fields. Diffraction mode has strong diffraction signals and is more suitable for routine phase identification in the laboratory. In addition, in the transmission mode, the powder sample can be in trace amounts, which is suitable for data acquisition in cases where the sample size is relatively small and does not meet the requirements of diffraction method for sample preparation.

Using X-ray diffraction (transmission) method to test the unique crystal structure of fibers. Test the orientation of the sample based on data such as fiber texture and half peak width.

The use of four concentric circles technique ensures that the center of the angle measuring instrument remains unchanged regardless of any rotation, achieving the goal of obtaining the most accurate data and higher completeness. Four concentric circles are a necessary condition for conventional single crystal scanning.