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The 'super detector' of the microscopic world

2025-03-27 09:18

X-ray absorption fine structure Spectrum (XAFS) is a powerful tool for studying the local atomic or electronic structure of materials, widely used in popular fields such as catalysis, energy, and nanotechnology.

The principle of X-ray absorption fine structure Spectrum(XAFS):

X-ray absorption fine structure Spectrum refers to high-resolution spectra near the characteristic edges of atomic core electrons absorbing X-rays. When the energy of X-rays is the same as the excitation energy of the inner shell electrons of the measured element, they will be strongly absorbed, resulting in an absorption limit (or absorption edge). Near the absorption edge, due to multiple scattering and other reasons, the absorption coefficient of X-rays will exhibit oscillatory phenomena, namely fine structure.

2. Core advantages of X-ray absorption fine structure Spectrum(XAFS):

(1) The highest luminous flux product, with a photon flux exceeding 1000000 photons/second/eV, and a spectral efficiency several times higher than other products; Obtain data quality equivalent to synchrotron radiation

(2) Excellent stability, monochromatic light intensity stability of the light source is better than 0.1%, and repeated energy drift is less than 50 meV

(3) 1% detection limit, high light flux, excellent optical path optimization, and excellent light source stability ensure that high-quality EXAFS data can still be obtained when the measured element content is>1%.

3. Application areas of  XAFS:

Industrial catalysis, energy storage materials, nanomaterials, environmental toxicology, qualitative analysis, heavy element analysis, etc.

4. Main features of  XAFS:

(1) Short range ordering: EXAFS depends on short-range interactions and does not rely on long-range ordering. XAFS can be used to study the structure of disordered systems such as amorphous, liquid, molten, and catalyst active centers.

(2) Element specificity: Fluorescence method can be used to measure samples of elements with concentrations as low as one millionth. By adjusting the incident X-ray energy, the neighboring structures of atoms of different elements in the same compound can be studied.

(3) Polarization characteristics: Polarized X-rays can be used to measure atomic bond angles and surface structures in oriented samples.

The X-ray absorption fine structure Spectrum, with its unique principles, significant characteristics, and wide application fields, has become an indispensable and important tool in multiple fields such as materials science, catalytic chemistry, and energy research, providing strong support for in-depth exploration of material microstructures and electronic states.


X-ray Absorption Fine Structure

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