The TDF series X-ray crystal analyzer is a large-scale X-ray instrument used to study the internal microstructure of substances. It utilizes the principle of interaction between X-ray and crystal to determine the atomic arrangement inside the crystal by analyzing the diffraction pattern of X-ray. Mainly used for single crystal orientation, defect inspection, determination of lattice parameters, determination of residual stress, study of the structure of plate and rod, investigation of the structure of unknown substances and single crystal dislocations. The X-ray crystal analyzer, as an X-ray instrument, provides valuable information for materials science research and other related fields. With the continuous advancement of technology and the expansion of applications, X-ray crystal analyzer will continue to play an important role in scientific research and industrial production.

The automatic X-ray orientation instrument is a device that uses the diffraction principle of X-ray to determine the crystal structure, orientation, and lattice parameters. It has a wide range of applications in materials science, geology, physics, and chemistry, especially in studying the microstructure and properties of single crystal, polycrystalline materials, and thin film materials. The following will provide a detailed introduction to the working principle, application, and operational precautions of the X-ray crystal orienter. With the advancement of technology, the automatic X-ray orientation instrument devices continues to improve, with higher resolution and easier operation. At the same time, the combination with other analytical techniques such as electron microscopy and spectroscopic analysis makes the analysis of crystal structure more comprehensive and in-depth. In addition, portable and online monitoring X-ray orientation analyzer devices have gradually developed, providing possibilities for on-site analysis and real-time monitoring. In summary, X-ray orientation analyzer is a powerful analytical tool that is crucial for understanding and controlling the microstructure of materials. With the continuous development of technology, its application in various fields will become more extensive and in-depth.

The Graphite curved crystal monochromator is an important instrument accessory for X-ray diffraction analysis, mainly used to monochromatize the X-rays passing through the receiving slit, thereby improving the accuracy and signal-to-noise ratio of analysis. This monochromator utilizes the specific structure of graphite crystals to selectively reflect incident X-rays, allowing only X-rays of specific wavelengths (usually Kαcharacteristic X-rays) to pass through while filtering out other unwanted X-ray components such as continuous X-rays, Kβcharacteristic X-rays, and fluorescent X-rays. This selective reflection is based on Bragg's law, which states that when the angle between the incident light and the crystal plane satisfies certain conditions, coherent scattering occurs, forming diffraction peaks.When using this monochromator, attention should be paid to the preparation and placement of the sample to ensure the accuracy and symmetry of the diffraction peaks. ​Graphite curved crystal monochromator are widely used in materials research fields such as chemistry, chemical engineering, machinery, geology, minerals, metallurgy, building materials, ceramics, petrochemicals, and pharmaceuticals. In these fields, it is used for X-ray diffraction analysis to study the physical properties of materials such as crystal structure, phase transition, stress state, etc.X-ray diffractometer accessories significantly improves the accuracy and reliability of analysis by increasing the peak to background ratio and reducing background noise.

The multi-function sample holder is a device used to provide flexibility and high efficiency in various scientific research and industrial applications. It is commonly used in X-ray diffraction (XRD) analysis and electron microscopy, and is an accessory of X-ray diffractometers (XRD accessory). As an accessory of X-ray diffractometers (XRD accessory) usually equipped with adjustable countertops to accommodate samples of different sizes and shapes.The multi-function sample holder is one of the indispensable tools in modern laboratories and research institutions. It greatly promotes the development of scientific research and industrial applications by providing a flexible, efficient, and accurate sample processing and analysis platform. Whether in the fields of materials science, biomedicine, or electronics industry, multifunction sample holder play an important role in helping researchers and engineers better understand and improve their research subjects.

Driven by an imported stepper motor and controlled by an imported Siemens programmable logic controller (PLC), there is no need for manual sample replacement. The system automatically measures samples continuously and saves data automatically. Six samples can be loaded at once for continuous measurement. Overall, as an efficient experimental auxiliary equipment, automatic sample changer play an important role in multiple fields. With the continuous advancement of technology and the increasing demand for applications, the performance and functionality of automatic sample changer will also be further improved and perfected.

The multifunctional integratedmeasuring accessories are used for analyzing films on boards, blocks, and substrates, and can perform tests such as crystal phase detection, orientation, texture, stress, and in-plane structure of thin films. Multifunctional integrated measuring accessories are typically designed to enhance the functionality of X-ray diffractometer , enabling them to adapt to more diverse testing needs. There is a close relationship between multifunctional integrated measurement accessories and X-ray diffractometer. These accessories not only enhance the functionality and performance of X-ray diffractometer, but also improve its ease of operation and safety. In practical applications, users can choose suitable accessories according to their specific needs to expand the application scenarios of X-ray diffractometer and improve measurement efficiency.

The in-situ medium and low temperature accessory​ is designed to understand the changes in crystal structure during the low-temperature refrigeration process; In order to provide a medium and low temperature (usually below room temperature but not extremely low temperature, such as a range between -100 ℃ and room temperature) sample environment for microscopes and other instruments. Vacuum environment: -196~500℃ Temperature control accuracy: ±0.5℃ Refrigeration method: liquid nitrogen (consumption less than 4L/h) Window material: Polyester film Cooling method: deionized water circulation cooling

High temperature accessory is designed to understand the changes in the crystal structure of samples during high-temperature heating, as well as the changes in mutual dissolution of various substances during high-temperature heating.  High-temperature accessory play a crucial role as important experimental and industrial equipment in multiple fields. Its wide range of application fields, precise technical parameters, and diverse product types make high-temperature accessory an indispensable part of scientific research and industrial production. technical parameter Temperature setting: Inert gas environment from room temperature to 1200 ℃ Vacuum environment with high temperature of 1600 ℃ Temperature control accuracy: ± 0.5 ℃ Window material: Polyester film

X-ray tubes specifically designed for analytical instruments： corrugated ceramic tubes, cermet tube , and glass tubes ，suitable for various models of XRD, XRF, crystal analyzers, and orientation instruments at home and abroad. X-ray tubes technical parameter： 1. Optional target material types: Cu, Co, Fe, Cr, Mo, Ti, W, etc 2. Focus type: 0.2 × 12mm² or 1 × 10mm² or 0.4 × 14mm² (fine focus)

Originally Battery Accessory, testing range: 0.5-160 degrees, temperature resistance: 400 ℃, beryllium window (polyester film) size: diameter 15mm (customizable); Thickness 0.1mm (customizable). They are widely used as X-ray diffractometer accessories in electrochemical systems containing carbon, oxygen, nitrogen sulfur, metal embedded complexes, etc. Originally Battery Accessory is used to fix the entire Originally Battery ​ sample stage on the angle measuring instrument of the X-ray diffractometer, serving as a connection and support.