The TDM-20 high-power X-ray diffractometer(Benchtop XRD)is mainly used for phase analysis of powders, solids, and similar paste materials. The principle of X-ray diffraction can be used for qualitative or quantitative analysis, crystal structure analysis, and other polycrystalline materials such as powder samples and metal samples. Benchtop XRD is widely used in industries such as industry, agriculture, national defense, pharmaceuticals, minerals, food safety, petroleum, education, and scientific research.

1、Core features of TDM-20 benchtop X-ray diffractometer(Benchtop XRD)：

The loading of the new high-performance array detector has greatly improved the overall performance of the device, with a small size and light weight; The whole machine is integrated into the desktop size (usually ≤ 1m³), saving space and suitable for small laboratories or teaching environments;The working power of high-frequency and high-voltage power supply can reach 1600W; Quick analysis, able to calibrate and test samples quickly; By using high-performance detectors (such as two-dimensional detectors) and optimizing the optical path, sample scanning can be completed in a few minutes; Simple circuit control, easy to debug and install; The angle repeatability can reach 0.0001; Low power consumption and safety, using low-power X-ray tubes (such as ≤ 50W), equipped with multiple radiation protection, no need for special shielding rooms; User friendly, equipped with automation software, supporting one click operation, real-time data visualization, and standard database (such as ICDD PDF) comparison.

2. Typical application scenarios of TDM-20 benchtop X-ray diffractometer(Benchtop XRD):

Materials Science of X-ray diffractometer（Benchtop XRD）: Rapid identification of crystal structure and phase composition (such as metals, ceramics, polymers).

Materials Science of X-ray diffractometer（Benchtop XRD）: Industrial site testing of the crystal purity of raw materials or finished products (such as pharmaceuticals and battery materials).

Materials Science of X-ray diffractometer（Benchtop XRD）: Undergraduate experimental teaching, visually demonstrating the Bragg diffraction principle.

Materials Science of X-ray diffractometer（Benchtop XRD）: Mineral composition analysis of cultural relics or preliminary screening of field samples.

3.Technical parameters of TDM-20 benchtop X-ray diffractometer（Benchtop XRD）:

Project : parameter range

X-ray source:Cu target (λ=1.54 Å), Mo target optional

Voltage/current:10-50 kV/0.1-2 mA

Angle measuring instrument range:0-90 ° 2θ (some models can be extended)

Angle resolution:≤ 0.01 °

Detector type: one-dimensional linear or two-dimensional surface detector

Sample size: Powder (milligrams), film or block

4.Advantages and limitations of TDM-20 benchtop X-ray diffractometer（Benchtop XRD）:

Advantages: Low cost (about 1/3-1/2 of large XRD), easy maintenance.

Support non-destructive analysis and simple sample preparation (such as directly placing powder).

limitations:

The resolution and sensitivity are slightly lower than high-end devices, and may not be suitable for ultra-fine structural analysis.

Extreme condition testing (such as high-temperature/high-pressure in-situ experiments) is usually not feasible.