The TD-3500 X-ray diffractometer is mainly used for phase qualitative and quantitative analysis, crystal structure analysis, material structure analysis, crystal orientation analysis, macroscopic or microscopic stress determination, grain size determination, crystallinity determination, etc. of powder, block or film samples. The TD-3500 X-ray diffractometer produced by Dandong Tongda Technology Co., Ltd. adopts imported Siemens PLC control, which makes the TD-3500 X-ray diffractometer have the characteristics of high accuracy, high precision, good stability, long service life, easy upgrade, easy operation and intelligence, and can flexibly adapt to testing analysis and research in various industries!  

The TD-3500 X-ray diffractometer adopts an X-ray generator (high-frequency and high-voltage solid-state generator, power frequency generator optional), which has a high degree of automation, extremely low failure rate, strong anti-interference ability, good system stability, and can extend the service life of the whole machine. PLC and computer interface automatically control the opening and closing of the light gate, automatically control the rise and fall of tube pressure and tube flow, and have the function of automatically training X-ray tubes. Real time online monitoring using a touch screen to display instrument status.

The TD-3500 X-ray diffractometer adopts advanced recording control unit, PLC control circuit, advanced PLC control technology and true color touch screen to achieve human-computer interaction. The system hardware adopts modular design concept, greatly increasing the anti-interference ability of the system and making it more stable. Due to the use of imported Siemens PLC control circuits with high precision and automation, the system can operate stably for a long time without any faults.

The TD-3500 X-ray diffractometer system has the following advantages over the microcontroller circuits used by other companies:

Simple circuit control, easy to debug and install; Due to its modular design, the system maintenance is very simple, and users can repair and debug it themselves without the need for manufacturer technicians to be present; Adopting advanced true color touch screen to achieve human-computer interaction, with complete protection functions and very convenient operation, the highly three-dimensional animation design is more humanized, intuitive, and convenient for operators to use and judge fault information, etc; Greatly improving the counting stability of the system, thereby enhancing the overall stability of the entire machine; Due to the strong expansion capability of PLC, it can easily expand various functional accessories without the need to add any additional hardware circuits.

Detector of TD-3500 X-ray diffractometer

Proportional detector (PC) or scintillation detector (SC).

High precision angle measuring instrument for TD-3500 X-ray diffractometer

The TD series angle measuring instrument adopts imported high-precision bearing transmission, and the motion control is completed by a high-precision fully closed-loop vector drive servo system. The intelligent drive includes a 32-bit RISC microprocessor and a high-resolution magnetic encoder, which can automatically correct extremely small motion position errors, ensuring high precision and accuracy of measurement results. The angle reproducibility can reach 0.0001 degrees, and smaller step angles can reach 0.0001 degrees.

Application areas of TD-3500 X-ray diffractometer:

Materials Science: Used to study key information such as crystal structure, phase transition behavior, and texture of materials.

Chemical analysis: can be used for qualitative or quantitative analysis of organic, inorganic, polymer compounds and other substances.

Geology: helps people understand the formation of mineral deposits, the evolution of the Earth, and more.

Biopharmaceuticals: Determine the crystal structure of drugs, optimize drug formulations, and improve drug efficacy.

X-ray diffractometer is a powerful analytical tool widely used in multiple fields. By accurately measuring diffraction angle and intensity, it can provide detailed information about the crystal structure and composition of materials.