X-ray absorption fine structure spectrum (XAFS) is an analytical tool used to study the structure and properties of substances. XAFS obtains information about atoms and molecules in a sample by measuring the X-ray absorption of the sample within a specific energy range. XAFS is a powerful tool for studying the local atomic or electronic structure of materials.XAFS technology is widely used in materials science, chemistry, biology, and other fields, especially in research areas such as catalysis, batteries, sensors, etc. XAFS has important application value. Through XAFS technology, researchers can gain a deeper understanding of the microstructure and properties of samples, providing powerful support for the design and optimization of new materials.

X-ray single crystal diffractometer is mainly used to determine the three-dimensional spatial structure and electron cloud density of crystalline substances such as inorganic,organic,and metal complexes,and to analyze the structure of special materials such as twinning, non commensurate crystals,quasicrystals,etc.Determine the accurate three-dimensional space (including bond length, bond angle,configuration,conformation,and even bonding electron density) of new compound (crystalline) molecules and the actual arrangement of molecules in the lattice;Single crystal X-ray diffractometer can provide information on the crystal cell parameters,space group,molecular structure,intermolecular hydrogen bonding and weak interactions,as well as structural information such as molecular configuration and conformation.Single crystal XRD is widely used in analytical research in chemical crystallography,molecular biology,pharmacology,mineralogy,and materials science. Single crystal XRD has high precision: 2θ angle repeatability accuracy: 0.0001°; Minimum step angle: 0.0001°; Temperature control range:100K-300K Control accuracy: ±0.3K Single crystal angle measuring instrument selects four concentric scanning circles. Single crystal XRD adopts low-temperature configuration. The company's technical personnel have completed the installation and debugging of the foreign single crystal X-ray diffractometer,and the test results have greatly satisfied foreign users. At the same time,the functionality,stability,and after-sales service of the instrument have received unanimous praise from foreign users. Overall, X-ray single crystal diffractometer plays an irreplaceable role as an important scientific instrument in research and application in multiple disciplines. With the continuous advancement and innovation of technology, we believe that in the future,single crystal XRD will demonstrate their unique value and potential in more fields.

NDT portable X-ray welding testing machine is a type of radiographic inspection equipment​ that can generate X-rays and has multiple uses. Portable X-ray machine for weld inspection can be used in industrial and medical fields. In industry, it is used for defect detection in automotive parts manufacturing, wheel hub detection, subframe detection, hinge quality detection, etc., to ensure that the tested industrial products have high strength. In addition, its belongs to X-ray weld inspection equipment and is commonly used for weld detection, boiler weld detection, aerospace component weld detection, etc.

The TDF series X-ray crystal analyzer is a large-scale X-ray instrument used to study the internal microstructure of substances. It utilizes the principle of interaction between X-ray and crystal to determine the atomic arrangement inside the crystal by analyzing the diffraction pattern of X-ray. Mainly used for single crystal orientation, defect inspection, determination of lattice parameters, determination of residual stress, study of the structure of plate and rod, investigation of the structure of unknown substances and single crystal dislocations. The X-ray crystal analyzer, as an X-ray instrument, provides valuable information for materials science research and other related fields. With the continuous advancement of technology and the expansion of applications, X-ray crystal analyzer will continue to play an important role in scientific research and industrial production.

The automatic X-ray orientation instrument is a device that uses the diffraction principle of X-ray to determine the crystal structure, orientation, and lattice parameters. It has a wide range of applications in materials science, geology, physics, and chemistry, especially in studying the microstructure and properties of single crystal, polycrystalline materials, and thin film materials. The following will provide a detailed introduction to the working principle, application, and operational precautions of the X-ray crystal orienter. With the advancement of technology, the automatic X-ray orientation instrument devices continues to improve, with higher resolution and easier operation. At the same time, the combination with other analytical techniques such as electron microscopy and spectroscopic analysis makes the analysis of crystal structure more comprehensive and in-depth. In addition, portable and online monitoring X-ray orientation analyzer devices have gradually developed, providing possibilities for on-site analysis and real-time monitoring. In summary, X-ray orientation analyzer is a powerful analytical tool that is crucial for understanding and controlling the microstructure of materials. With the continuous development of technology, its application in various fields will become more extensive and in-depth.

The multifunctional integratedmeasuring accessories are used for analyzing films on boards, blocks, and substrates, and can perform tests such as crystal phase detection, orientation, texture, stress, and in-plane structure of thin films. Multifunctional integrated measuring accessories are typically designed to enhance the functionality of X-ray diffractometer , enabling them to adapt to more diverse testing needs. There is a close relationship between multifunctional integrated measurement accessories and X-ray diffractometer. These accessories not only enhance the functionality and performance of X-ray diffractometer, but also improve its ease of operation and safety. In practical applications, users can choose suitable accessories according to their specific needs to expand the application scenarios of X-ray diffractometer and improve measurement efficiency.

X-ray tubes specifically designed for analytical instruments： corrugated ceramic tubes, cermet tube , and glass tubes ，suitable for various models of XRD, XRF, crystal analyzers, and orientation instruments at home and abroad. X-ray tubes technical parameter： 1. Optional target material types: Cu, Co, Fe, Cr, Mo, Ti, W, etc 2. Focus type: 0.2 × 12mm² or 1 × 10mm² or 0.4 × 14mm² (fine focus)

Originally Battery Accessory, testing range: 0.5-160 degrees, temperature resistance: 400 ℃, beryllium window (polyester film) size: diameter 15mm (customizable); Thickness 0.1mm (customizable). They are widely used as X-ray diffractometer accessories in electrochemical systems containing carbon, oxygen, nitrogen sulfur, metal embedded complexes, etc. Originally Battery Accessory is used to fix the entire Originally Battery ​ sample stage on the angle measuring instrument of the X-ray diffractometer, serving as a connection and support.

Parallel optical film measuring accessory is a specialized tool for X-ray diffraction analysis, which filters out more scattered lines by increasing the length of the grating plate, thereby reducing the influence of the substrate signal on the results and enhancing the signal intensity of the thin film. In the field of materials science, parallel optical film measuring accessory is commonly used to study the crystal structure, phase transition behavior, and stress state of thin film materials. With the development of nanotechnology, parallel optical film measuring accessory has also been widely used in thickness testing and small angle diffraction analysis of nano multilayer films. The design and manufacturing of parallel optical film measuring accessory pursue high precision to meet the requirements of scientific research and industrial production for data accuracy. During use, parallel optical film measuring accessory need to maintain a high degree of stability to ensure the reliability of test results. With the advancement of technology and the development of industry, the demand for high-precision and high stability analytical instruments is constantly increasing. Parallel optical film measuring accessory, as an important component, are also experiencing sustained market demand growth. In order to meet market demand and improve product performance, the technology of parallel optical film measuring accessory is constantly innovating and improving. For example, improving the material and design of grating plates, optimizing the optical system, and other means can enhance the filtering effect and signal enhancement capability. In summary, parallel optical film measuring accessory play a crucial role in X-ray diffraction analysis. With the advancement of technology and the development of industry, its application prospects will become even broader.

Fiber accessories are tested for their unique crystal structure using X-ray diffraction (transmission) method. Test the orientation of the sample based on data such as fiber crystallinity and half peak width. Fiber accessories have a wide range of applications in various fields, including materials science, biomedicine, chemical engineering, nanotechnology, geological exploration, environmental monitoring, and more.

The cabinet X-ray irradiator system generates high-energy X-rays to irradiate cells or small animals. Used for various basic and applied research. In history, radioactive isotope irradiator equipment has been used, which requires transporting samples to a core irradiation facility. Today, smaller, safer, simpler, and lower cost X-ray irradiator devices can be installed in laboratories for convenient and rapid irradiator of cells. Various samples can be directly irradiated in the laboratory without affecting fertility or safety. This biological X-ray irradiator device is convenient for personnel without professional X-ray training to use, and there are no expensive license applications or maintenance costs for safety or radiation sources. The X-ray irradiator instrument is easy to operate, safe, reliable, and cost-effective, and can replace radioactive isotope sources.

The X-ray orientation analyzer is a device that uses the principle of X-ray diffraction to determine crystal orientation. It is widely used in fields such as materials science, geology, physics, etc., for studying crystal structure, lattice parameters, crystal defects, etc. The working principle of an X-ray orientation analyzer​ is to irradiate a monochromatic X-ray beam onto the crystal under test. When the X-ray interacts with atoms in the crystal, scattering occurs. According to Bragg's law, when the wavelength of X-rays is an integer multiple of the atomic spacing in a crystal, scattered light will interfere and form a series of alternating bright and dark stripes, known as Bragg reflection. By measuring the angles and intensities of these Bragg reflections, information such as crystal orientation and lattice parameters can be calculated. The X-ray orientation analyzer usually includes the following main parts: 1.X-ray source: a device that produces monochromatic X-rays, typically using an X-ray tube or synchrotron radiation source. 2.Sample stage: a platform used to place the crystal to be tested, which can adjust the position and angle of the crystal. 3.Detector: used to receive scattered X-rays and convert them into electrical signals. Common detectors include scintillation counters, proportional counters, etc. 4.Data acquisition and processing system: used to collect signals output by detectors, and perform data processing and analysis. Usually includes multi-channel analyzers, computers, and other equipment. 5.Control system: used to control the movement of X-ray source, sample stage, and detector to achieve measurement of crystals in different directions. By using an X-ray orientation analyzer, researchers can accurately determine the orientation and lattice parameters of crystals, thereby gaining a deeper understanding of their structure and properties. This is of great significance for the development of new materials, geological exploration, crystal growth and other fields.