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The crystallinity of the polymer material was measured by XRD

The main indicators of polymer materials include the type of polymer or its crystallinity. Polymers also exhibit different microstructure, which can also affect the mechanical .properties of polymer materials.

2023/10/11
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XRD for material characterization equipment

X-ray diffraction (XRD) is a means of research to obtain information such as the composition of a material, the structure or form of an internal atom or molecule by analyzing its diffraction pattern through X-ray diffraction.

2023/10/10
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The early scientific history of crystals and X-rays

Crystals, although long admired for their regularity and symmetry, were not studied scientifically until the 17th century. Let's take a look at the early history of crystallography.

2023/10/06
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X-ray crystal orientation instrument

Using the principle of X-ray diffraction, the cutting Angle of natural and artificial single crystals is accurately and quickly determined, and the cutting machine is equipped for directional cutting of the said crystals.

2023/10/03
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New system of metal air battery assisted by internal stress

The method of assisting internal stress without additional energy proposed in this paper provides an economical and convenient new strategy for improving battery reaction dynamics.

2023/10/01
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XRD Sample Preparation Requirements

XRD can measure bulk and powder samples, and has different requirements for different sample sizes and properties.

2023/09/24
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Application of XRD in petroleum industry

Taking deposition scaling as an example, this paper introduces how to use X-ray diffractometer for qualitative phase and quantitative analysis.

2023/09/21
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Application of XRD technology in semiconductor industry

The application of new technologies and new products such as 5G, big data, and artificial intelligence will bring a huge semiconductor market demand, and global semiconductor equipment spending has entered an upward cycle.

2023/09/20
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High-resolution X-ray diffraction (HR-XRD) measurements of compound semiconductors

High-resolution XRD (HR-XRD) is a common method for measuring the composition and thickness of compound semiconductors such as SiGe, AlGaAs, InGaAs, etc.

2023/09/16
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Application of XRD in situ cell characterization technique to battery electrode materials

XRD is a means of research which is Diffraction by X-Ray diffraction of a material to analyze its diffraction pattern to obtain information such as the composition of the material, the structure or shape of atoms or molecules inside the material.

2023/09/13
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Application of GI-XRD technique in material characterization and structure analysis

Grazing-incidence X-ray diffraction (GI-XRD) is a kind of X-ray diffraction technique, which is different from the traditional XRD experiment, mainly by changing the Angle of X-ray incidence and the orientation of the sample.

2023/09/12
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Technology for detecting residual stress in metals

It is necessary to reduce the harmful residual stress and predict the distribution trend and value of residual stress. In this paper, the non-destructive testing method of residual stress testing is introduced.

2023/09/09
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