X-ray diffraction technique is often used to detect the crystal quality of wafers and epitaxial wafers.

XRD analysis is a method to analyze the structure of the internal atoms in the space distribution of substances by using the X-ray diffraction formed by crystals.

X-ray diffraction is a method of analyzing the structure or composition of a sample by shining a monochromatic X-ray beam on it.

XRD technology provides a powerful tool for studying the chemical composition and mineral composition of brine. Through the use of this technique, the characteristics and value of brine can be more fully understood.

NREL researchers have utilized state-of-the-art X-ray diagnostic capabilities as a nondestructive method to examine the composition and structure of battery materials.

Battery material analysis helps to understand and optimize battery performance, improve battery safety and life, reduce costs, and promote the development and application of new materials.

XRD qualitative detection is convenient, fast and less interference. With the continuous innovation of technical means, X-ray diffraction technology has a broader application prospect in the field of material analysis.

XRD uses monochromatic X-rays as the diffraction source, which can generally penetrate the solid, so as to verify its internal structure. XRD gives the bulk phase structure information of the material.

Synchrotron radiation is the electromagnetic radiation produced along the tangent direction of the orbit when the electron is moving in high-speed curve, which can be used to carry out many advanced scientific and technological research.

When graphite materials are used as negative electrode materials for lithium batteries, one of the necessary conditions for the degree of graphitization.

In 1912, Laue et al. predicted by theory and confirmed by experiment that diffraction can occur when X-ray meets crystal, proving that X-ray has the property of electromagnetic wave, which became the first milestone in X-ray diffraction.

XAFS, as an advanced characterization technique for the local structure analysis of materials, can provide more accurate atomic structure coordination information in the short-range structure range than X-ray crystal diffraction.