The goniometer is the heart of the X-ray diffractometer, and the TD series X-ray diffractometer has extremely high measurement accuracy

X-ray diffractometer is mainly used for qualitative or quantitative analysis of sample phases, crystal structure analysis, crystallinity determination, etc. Various special functional accessories and corresponding control and application software can be installed according to actual needs to form a diffraction system with special functions. X-ray diffractometer is a laboratory analytical instrument with high precision.

The X-ray diffraction pattern serves as the most reliable foundation for determining polycrystalline patterns, and the X-ray diffraction pattern is frequently regarded as the "fingerprint" of crystalline patterns.

The crystal structure of the perovskite films modified by ionic liquid (ILs) BMIMAc under various annealing durations was characterized by X-ray diffraction.

X-ray diffraction is a fast, accurate and efficient non-destructive testing technique for materials. As a means of characterizing the crystal structure and its change rule, it is widely used in many fields such as biology, medicine, ceramics and so on.

The properties of materials are often determined by their phase composition, and XRD is widely used as one of the main means of phase analysis.

The degree of graphitization refers to how closely the crystal structure of the graphite material resembles perfect graphite after rearranging the amorphous carbon structure.

X-ray diffraction is a basic technique for the study of solid structure, which can provide unique spectral information for the chemical composition and structure arrangement of samples.

XRD is the most advanced X-ray diffractometer system in the world today, with precise design and complete functions, and can flexibly adapt to various microstructure determination such as powder.