High temperature accessory are designed to understand the changes in the crystal structure of samples during high-temperature heating, as well as the changes in mutual dissolution of various substances during high-temperature heating.

X-ray absorption fine structure spectrometer (XAFS) is a powerful tool for studying the local atomic or electronic structure of materials, widely used in popular fields such as catalysis, energy, and nanotechnology.

XRD enables precise TiO2 phase quantification, crucial for product quality. Dandong Tongda's TD-series diffractometers, with specialized programs, ensure accurate rutile/anatase analysis (<0.2% error).

The TDM-20 desktop X-ray diffractometer delivers 1200W power in a compact design, surpassing 600W international standards. With ±0.01° linearity and 0.0001° repeatability, it enables precise phase analysis for materials research and industrial QC. Its integrated cooling system and global accessory compatibility make it an ideal cost-effective solution for international laboratories

The TDF series X-ray crystal analyzer delivers exceptional performance in microstructure analysis, supporting single crystal orientation, defect detection, and stress measurement. Featuring a vertical tube design with multi-window operation and imported PLC control, it ensures high precision, safety compliance (radiation <0.1 µSv/h), and adaptability across industries. Backed by ISO certification and global exports, this instrument empowers scientific and industrial advancements worldwide

Dandong Tongda Science and Technology Co., Ltd. is an industry leader focused on R&D and innovation in key technologies like diffraction analysis. Through academia collaborations, it develops high-efficiency products with independent IP, breaking international monopolies. The company builds its brand on integrity and professionalism, adhering to "Excellence Sets the Standard, Integrity Builds the Brand" to enhance competitiveness and contribute to China's scientific instrument industry.

TD-3700 High-Resolution X-Ray Diffractometer delivers exceptional analytical performance through innovative detector technology and dual scanning modes. Featuring rapid data acquisition, user-friendly operation, and enhanced safety, it enables precise materials analysis across research and industrial applications, setting new standards for Chinese scientific instruments.

The TDM-20 Desktop X-Ray Diffractometer integrates advanced X-ray generation, high goniometric accuracy, and efficient detection in a compact design. It delivers reliable phase analysis for materials science, pharmaceuticals, and industrial QC, backed by global support and international certifications.

TD-5000 X-ray diffractometer breaks international monopoly in high-end scientific instruments. This Chinese innovation delivers exceptional precision (0.0001° accuracy) and advanced detection capabilities, serving researchers in pharmaceuticals, materials science, and chemistry through comprehensive structural analysis.

Dandong Tongda's In-situ High-temperature Accessory enables real-time analysis of material structural changes up to 1600°C with ±1°C precision. Ideal for superconductors, ceramics, and thin film research, it's exported globally.