Grazing incidence means that the X-ray is exposed to the film at a very small incidence Angle (< 5°), which greatly reduces the penetration depth in the film.At the same time, the low incidence Angle increases the irradiation area of the X-ray on the sample

Parallel beam XRD of X-ray optical crystals has been successfully applied in thin film analysis, sample texture evaluation, crystal phase and structure monitoring, etc.

Industrial CT non-destructive testing is the judgment of internal defects, structural defects, physics and composition of the product under the original state and performance of the workpiece without destroying or changing the raw materials.

Micro-ct technology has significant advantages in the characterization of ceramics, which can reveal the composite structure inside the material without damage, and restore the key technology in the production of ceramics.

An X-ray diffractometer is a precision instrument used to study the crystal structure, morphology and properties of matter. During the packaging and transportation process, certain measures need to be taken to ensure that the safety and performance of the instrument are not affected.

As one of the important means of material structure characterization, XRD is widely used in materials, physics, chemistry, medicine and other fields.

X-ray diffractometer is mainly used for phase characterization, quantitative analysis, crystal structure analysis, material structure analysis, crystal orientation analysis of powder, block or thin film samples, etc.

Due to the different crystallization conditions, the particles of powder drug samples will have different morphologies.

Researchers at the synchrotron radiation facility SPring-8 at the RIKEN Research Institute in Japan and their collaborators have developed a faster and simpler way to perform segmentation analysis, an important process in materials science.

In X-ray analysis, an instrument used to measure the Angle between an incident X-ray beam and a diffracted X-ray beam. The diffractometer automatically maps the variation of the diffraction intensity with the 2θ Angle.