X-ray Absorption Fine Structure(XAFS) is a powerful tool for studying the local atomic or electronic struct ure of materials based on synchrotron radiation light source.

When a beam of extremely thin X-rays passes through a material with an uneven electron density of nanometer size, the X-rays will spread out in a small angular region near the direction of the original beam, this phenomenon is called small-angle X-ray scattering.

Small-angle X-ray scattering is the diffuse scattering of electrons to X-rays in the small Angle range near the original beam. Small-angle scattering occurs in all materials with non-uniform electron density on the nanometer scale.

Small Angle X-ray diffraction (SAXD) is mainly used to determine the spacing of very large crystal faces or the structure of thin films.

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The use of X-rays to study the structure of crystals mainly through the X-ray diffraction phenomenon in the crystal.

X-ray diffraction technique is an analytical method used to study the structure of a substance. It determines the structure of a crystal by measuring the Angle of X-ray diffraction in the crystal.

In-situ XRD, also known as In situ X-ray Diffraction, is a technique for making X-ray diffraction measurements during a structure or phase transition. This technology can monitor the dynamic change of the structure of the material under external force in real time.

In-situ XRD is one of the most popular and developed advanced characterization techniques for studying lithium-ion and sodium-ion battery systems in electrochemical processes.