The parallel optical film measuring accessory increases the length of the grating plate to filter out more scattered lines, which is beneficial for reducing the influence of the substrate signal on the results and enhancing the signal intensity of the film.

The X-ray irradiator can generate high-energy X-rays to irradiate cells or small animals. Used for various basic and applied research. Throughout history, radioactive isotope irradiators have been used, which require transporting samples to a core irradiation facility. Today, smaller, safer, simpler, and lower cost X-ray irradiation equipment can be installed in laboratories for convenient and rapid irradiation of cells.

High temperature accessory are designed to understand the changes in the crystal structure of samples during high-temperature heating, as well as the changes in mutual dissolution of various substances during high-temperature heating.

X-ray absorption fine structure spectrometer (XAFS) is a powerful tool for studying the local atomic or electronic structure of materials, widely used in popular fields such as catalysis, energy, and nanotechnology.

TD-3700 High-Resolution X-Ray Diffractometer delivers exceptional analytical performance through innovative detector technology and dual scanning modes. Featuring rapid data acquisition, user-friendly operation, and enhanced safety, it enables precise materials analysis across research and industrial applications, setting new standards for Chinese scientific instruments.

The TDM-20 Desktop X-Ray Diffractometer integrates advanced X-ray generation, high goniometric accuracy, and efficient detection in a compact design. It delivers reliable phase analysis for materials science, pharmaceuticals, and industrial QC, backed by global support and international certifications.

TD-5000 X-ray diffractometer breaks international monopoly in high-end scientific instruments. This Chinese innovation delivers exceptional precision (0.0001° accuracy) and advanced detection capabilities, serving researchers in pharmaceuticals, materials science, and chemistry through comprehensive structural analysis.

Dandong Tongda's In-situ High-temperature Accessory enables real-time analysis of material structural changes up to 1600°C with ±1°C precision. Ideal for superconductors, ceramics, and thin film research, it's exported globally.

Trusted Worldwide: Dandong Tongda's X-Ray Orientation Analycer Receives Multi-National Certifications In today's rapidly evolving global landscape of semiconductors, optical devices, and materials science, precise crystal orientation measurement has become crucial for enhancing product quality and production efficiency. As a specialized developer and manufacturer in the field of X-ray analysis instruments, Dandong Tongda Technology Co., Ltd. announces the launch of its high-performance X-Ray Orientation Analyzer. This instrument integrates advanced X-ray diffraction technology with intelligent algorithms, delivering fast and accurate orientation measurement solutions for crystal-related industries worldwide. Technical Principle: The Perfect Integration of X-Ray Diffraction and Precision Measurement The X-Ray Orientation Analyzer operates based on Bragg's diffraction law. When X-rays strike the crystal surface, the regularly arranged atomic planes within the crystal generate diffraction phenomena at specific angles. By capturing these diffraction signals with precision detectors and calculating the diffraction angles, the instrument can accurately determine the crystal's orientation, providing reliable data for subsequent cutting and processing. Compared to traditional orientation methods, X-ray crystal orientation technology offers significant advantages of being non-destructive, high-precision, and highly efficient, ensuring reliable measurement results without damaging the sample. The instrument achieves a measurement accuracy of ±30 arcseconds (±30″), with a minimum reading of 10 arcseconds, meeting the orientation requirements of the vast majority of crystal materials. Product Series: Comprehensive Solutions for Diverse Application Needs Dandong Tongda Technology's X-Ray Orientation Analyzers primarily include two foundational models: the TYX-200 and the TYX-2H8. The TYX-200 model, as the base version, features a digital display with a minimum reading of 10″ and a measurement accuracy of ±30″, making it suitable for routine crystal material orientation needs. The TYX-2H8 model is a comprehensive upgrade of the TYX-200, featuring an improved goniometer structure, enhanced load-bearing tracks, and a raised sample stage. The TYX-2H8 can measure samples weighing 1-30 kg with diameters of 2-8 inches. Certain configurations can even be extended to handle samples weighing 30-180 kg, with diameters up to 350 mm and lengths up to 480 mm. For more complex research requirements, the company also offers the TDF series X-Ray Orientation Analyzers, which utilize imported PLC control technology, offer a tube voltage range of 10-60 kV, and enable broader functionalities including single-crystal orientation, defect detection, and lattice parameter determination. Functional Applications: A Key Tool for Crystal Processing Across Multiple Industries The X-Ray Orientation Analyzer can precisely and rapidly determine the cutting angles of natural and synthetic single crystals and, in coordination with cutting machines, perform oriented cutting. It is an indispensable instrument for the precision machining and manufacturing of crystal devices. In the semiconductor industry, the instrument is widely used for inspecting ingots, wafers, and chips, controlling processes such as cutting, grinding, and polishing to ensure consistent performance of semiconductor devices. For optical crystal and laser crystal processing, the instrument can accurately determine crystal orientation, ensuring the optical performance of optical devices meets design requirements and improving product yield. Particularly in the field of sapphire crystal processing, the instrument can simultaneously satisfy the measurement requirements for sapphire A, C, M, and R crystal orientations, with an electrically adjustable measurement range of 0–45°, adapting to complex processing needs. In the jewelry and gemstone industry, the instrument supports precise orientation of gemstones, enhancing cutting accuracy and the value of finished products, helping manufacturers maximize the optical effects and commercial value of gemstones. Product Features: Innovative Design Enhances User Experience Dandong Tongda Technology's X-Ray Orientation Analyzers incorporate several innovative features that significantly improve the instrument's practicality and reliability. Easy Operation: The instrument can be operated without professional knowledge or extensive skill, lowering the barrier to use and reducing personnel training time. Digital Display: The digital angle display provides intuitive observation, reduces reading errors, and can be zeroed at any position, facilitating direct display of the wafer's angle deviation. Efficient Design: Some models are equipped with dual goniometers that can operate simultaneously, greatly improving inspection efficiency. Enhanced Precision: A special integrator with peak amplification improves detection accuracy, and a vacuum suction sample plate ensures stable sample positioning. Reliability and Durability: The integrated design of the X-ray tube and high-voltage cable enhances high-voltage reliability. The detector high voltage utilizes a DC high-voltage module, ensuring long-term stable operation. Safety Protection: The instrument uses high-density, high-transmittance lead glass as the X-ray protective shield. The external radiation dose does not exceed 0.1 µSv/h, complying with international safety standards. Sample Stage Configuration: Flexible Adaptation to Diverse Measurement Needs To meet the measurement requirements for samples of different shapes and sizes, Dandong Tongda Technology offers various sample stage configurations: TA Type Sample Stage: Designed specifically for cylindrical crystal rods, equipped with load-bearing tracks. It can measure crystal rods weighing 1-30 kg with diameters of 2-6 inches (expandable to 8 inches), and can measure the reference surface of rod-shaped crystals or the surface of sheet-shaped crystal wafers. TB Type Sample Stage: Also designed for cylindrical crystal rods, it incorporates V-shaped support rails and can measure crystal rods up to 500 mm in length, making it particularly suitable for measuring the end faces of rod-shaped crystals. TC Type Sample Stage: Primarily used for detecting the outer circumference reference surface of single crystal wafers such as silicon and sapphire. Its open design overcomes issues of X-ray obstruction and positioning inaccuracies caused by suction plates. TD Type Sample Stage: Designed specifically for multi-point measurement of wafers like silicon and sapphire. The wafer can be manually rotated on the stage (e.g., 0°, 90°, 180°, 270°) to meet specific customer measurement requirements. Global Market: Empowering International Clients to Achieve Technological Breakthroughs Products from Dandong Tongda Technology Co., Ltd. have successfully entered the international market, exporting to multiple countries and regions including the United States, South Korea, Iran, Azerbaijan, Iraq, and Jordan. Adhering to the principles of "Customer First, Product First, Service First," the company provides global users with high-quality high-tech products and comprehensive technical support. For overseas customers, the company offers full technical consultation and after-sales service, including operational training, maintenance support, and spare parts supply, ensuring users have no concerns. Addressing the needs of clients in different regions, the company can also provide customized solutions, including special sample stage design and measurement software adjustments, ensuring the instrument perfectly adapts to specific application scenarios. Multi-language operation interfaces and detailed English technical documentation further lower the usage barrier for overseas customers and enhance the international user experience. Dandong Tongda Technology's X-Ray Orientation Analyzer is not merely a measurement tool but a strategic partner for enhancing corporate competitiveness. It can significantly shorten the R&D cycle for crystal materials, optimize production processes, ensure product quality, and create tangible value for the global crystal manufacturing industry. Whether in semiconductor chip manufacturing, optical component processing, or new material research, choosing Dandong Tongda Technology means opting for reliable, efficient, and precise crystal orientation solution.

Scientific Instrument Breakthrough: Dandong Tongda's TD-3700 X-Ray Diffractometer Empowers Research Innovation Dandong Tongda Science and Technology Co., Ltd. is a high-tech enterprise specializing in the research, development, and production of X-ray analysis instruments. Its flagship product, the TD-3700 X-Ray Diffractometer , integrates rapid analysis, user-friendly operation, and robust safety features. The perfect synergy between its modular hardware and customized software systems makes it a powerful tool for research fields such as materials science, chemistry, and mineralogy. TheTD-3700 X-Ray Diffractometer demonstrates significant advantages in both detection technology and measurement modes, enabling it to meet a wide range of analytical demands. Core Technology and Performance High-Performance Detectors: The instrument can be equipped with optional high-speed 1D array detectors (e.g., MYTHEN2R), SDD detectors, or 2D detectors. Utilizing hybrid photon counting technology, it operates with no readout noise, achieves data acquisition speeds tens to hundreds of times faster than traditional scintillation detectors, and effectively eliminates fluorescence effects for excellent energy resolution. For instance, the 1D array detector features 640 channels with a remarkably short readout time of just 89 microseconds, contributing to an outstanding signal-to-noise ratio. Flexible Scanning Modes: The TD-3700 X-Ray Diffractometer supports two primary data scanning methods: conventional reflection (diffraction) mode and transmission mode. The transmission mode provides higher resolution, making it suitable for analyzing limited samples or conducting structural analysis. The reflection mode offers a stronger signal, which is more appropriate for routine phase identification in laboratory settings. This flexibility enables the instrument to handle a wide variety of sample types, ranging from trace amounts of powder and bulk solids to even liquids and viscous samples. Precision Goniometer System: It employs a θS-θd vertical goniometer where the sample remains horizontal and stationary during measurement. This design not only facilitates easier sample preparation but also helps prevent potential corrosion of the goniometer's axis system by samples, thereby extending its operational lifespan. With a wide 2θ scanning range (-110° to 161°) and exceptional repetitive accuracy of 0.0001°, it ensures highly precise and repeatable measurements. Instrument Features & Safety Assurance The TD-3700 X-Ray Diffractometer is designed with a strong emphasis on user experience and operational safety. User-Friendly Design: Effortless Operation: Features a one-click acquisition system and incorporates a touchscreen interface for real-time monitoring of instrument status. Modular Design: Components are designed for plug-and-play functionality, requiring no calibration and ensuring straightforward maintenance. Comprehensive Safety Protection: Incorporates an electronic lead door interlock system for dual-layer protection, ensuring user safety. External radiation leakage from the protection system is ≤ 0.1μSv/h, complying with stringent international safety standards. Includes multiple protective functions against excessively high/low kV, excessively high/low mA, water flow failure, and X-ray tube overheating. Stable & Reliable System: Utilizes a high-frequency, high-voltage X-ray generator known for its stable and reliable performance, with system stability ≤ 0.005%. The integrated recirculating chiller has a built-in cooling function, eliminating the need for an external water circulation unit. Applications & Global Recognition The TD-3700 X-Ray Diffractometer is widely used for qualitative/quantitative phase analysis, crystal structure analysis, materials structure research, grain size determination, and crystallinity measurement. Recognized for their reliable quality, Dandong Tongda's products have been exported to numerous countries and regions including the United States, South Korea, Iran, Azerbaijan, Iraq, and Jordan, earning validation in the international market. The company has also obtained ISO9001 and other international quality management system certifications.Dandong Tongda Science and Technology Co., Ltd.provides customers with comprehensive service and support, including after-sales service, professional training, and international business support. We warmly welcome your inquiries and look forward to your procurement!