In 1912, Laue et al. predicted by theory and confirmed by experiment that diffraction can occur when X-ray meets crystal, proving that X-ray has the property of electromagnetic wave, which became the first milestone in X-ray diffraction.

XAFS, as an advanced characterization technique for the local structure analysis of materials, can provide more accurate atomic structure coordination information in the short-range structure range than X-ray crystal diffraction.

X-ray diffraction is a commonly used non-destructive analytical technique that can be used to reveal the crystal structure, chemical composition, and physical properties of substances.

X-ray diffraction, through the X-ray diffraction of a material, the analysis of its diffraction pattern, to obtain the composition of the material, the structure or shape of the atoms or molecules inside the material and other research means.

A material whose properties are dominated by two-dimensional effects, the properties of the material on a two-dimensional scale are different from its properties on a larger scale.

According to the position and intensity changes of in-situ XRD diffraction peaks, the intermediates generated during the cycle can be inferred, and the reaction mechanism can be further derived from these intermediates.

X-ray diffraction runs through every stage of drug quality control, such as the study of raw materials and preparations.

Residual stress has a great impact on the dimensional stability, stress corrosion resistance, fatigue strength, phase change and other properties of materials and components. Its measurement has been widely concerned by academia and industry.

Recently, A new study successfully fused metal oxides with zeolite A, and revealed the mystery of this process through XRD and FTIR technology.

XRD, is short for X-ray diffraction, as a material person, no matter what material is done, XRD is the most commonly used, the most basic means of characterization.