The TD-3500 powder X-ray diffractometer adopts imported Siemens PLC control, which makes the TD-3500 X-ray diffractometer highly accurate, stable, long-lasting, easy to upgrade, easy to operate and intelligent.  It is mainly used for phase qualitative and quantitative analysis, crystal structure analysis, material structure analysis, crystal orientation analysis, macroscopic or microscopic stress determination, grain size determination, crystallinity determination, etc. of powder, block or thin film samples. Capable of flexibly adapting to testing, analysis, and research in various industries!