The TD-3500 X-ray diffractometer is mainly used for phase qualitative and quantitative analysis, crystal structure analysis, material structure analysis, crystal orientation analysis, macroscopic or microscopic stress determination, grain size determination, crystallinity determination, etc. of powder, block or film samples. The TD-3500 X-ray diffractometer produced by Dandong Tongda Technology Co., Ltd. adopts imported Siemens PLC control, which makes the TD-3500 X-ray diffractometer have the characteristics of high accuracy, high precision, good stability, long service life, easy upgrade, easy operation and intelligence, and can flexibly adapt to testing analysis and research in various industries!   The TD-3500 X-ray diffractometer adopts an X-ray generator (high-frequency and high-voltage solid-state generator, power frequency generator optional), which has a high degree of automation, extremely low failure rate, strong anti-interference ability, good system stability, and can extend the service life of the whole machine. PLC and computer interface automatically control the opening and closing of the light gate, automatically control the rise and fall of tube pressure and tube flow, and have the function of automatically training X-ray tubes. Real time online monitoring using a touch screen to display instrument status. The TD-3500 X-ray diffractometer adopts advanced recording control unit, PLC control circuit, advanced PLC control technology and true color touch screen to achieve human-computer interaction. The system hardware adopts modular design concept, greatly increasing the anti-interference ability of the system and making it more stable. Due to the use of imported Siemens PLC control circuits with high precision and automation, the system can operate stably for a long time without any faults. The TD-3500 X-ray diffractometer system has the following advantages over the microcontroller circuits used by other companies: Simple circuit control, easy to debug and install; Due to its modular design, the system maintenance is very simple, and users can repair and debug it themselves without the need for manufacturer technicians to be present; Adopting advanced true color touch screen to achieve human-computer interaction, with complete protection functions and very convenient operation, the highly three-dimensional animation design is more humanized, intuitive, and convenient for operators to use and judge fault information, etc; Greatly improving the counting stability of the system, thereby enhancing the overall stability of the entire machine; Due to the strong expansion capability of PLC, it can easily expand various functional accessories without the need to add any additional hardware circuits. Detector of TD-3500 X-ray diffractometer Proportional detector (PC) or scintillation detector (SC). High precision angle measuring instrument for TD-3500 X-ray diffractometer The TD series angle measuring instrument adopts imported high-precision bearing transmission, and the motion control is completed by a high-precision fully closed-loop vector drive servo system. The intelligent drive includes a 32-bit RISC microprocessor and a high-resolution magnetic encoder, which can automatically correct extremely small motion position errors, ensuring high precision and accuracy of measurement results. The angle reproducibility can reach 0.0001 degrees, and smaller step angles can reach 0.0001 degrees. Application areas of TD-3500 X-ray diffractometer: Materials Science: Used to study key information such as crystal structure, phase transition behavior, and texture of materials. Chemical analysis: can be used for qualitative or quantitative analysis of organic, inorganic, polymer compounds and other substances. Geology: helps people understand the formation of mineral deposits, the evolution of the Earth, and more. Biopharmaceuticals: Determine the crystal structure of drugs, optimize drug formulations, and improve drug efficacy. X-ray diffractometer is a powerful analytical tool widely used in multiple fields. By accurately measuring diffraction angle and intensity, it can provide detailed information about the crystal structure and composition of materials.

The TD-3700 high-resolution X-ray diffractometer is a new member of the TD series, equipped with a variety of high-performance detectors such as high-speed one-dimensional array detectors, two-dimensional detectors, SDD detectors, etc. It integrates fast analysis, convenient operation, and user safety. The modular hardware architecture and customized software system achieve a perfect combination, making its failure rate extremely low, anti-interference performance good, and ensuring long-term stable operation of high-voltage power supply. The TD-3700 high-resolution X-ray diffractometer supports not only the conventional diffraction data scanning method, but also the transmission data scanning method. The resolution of transmission mode is much higher than that of diffraction mode, which is suitable for structural analysis and other fields. Diffraction mode has strong diffraction signals and is more suitable for routine phase identification in the laboratory. In addition, in the transmission mode, the powder sample can be in trace amounts, which is suitable for data acquisition in cases where the sample size is relatively small and does not meet the requirements of diffraction method for sample preparation. The array detector fully utilizes mixed photon counting technology, with no noise, fast data acquisition, and more than ten times the speed of scintillation detectors. It has excellent energy resolution and can effectively remove fluorescence effects. Multi channel detectors have faster readout times and achieve better signal-to-noise ratios. A detector control system with electronic gating and external triggering effectively completes system synchronization. The working principle of TD-3700 high-resolution X-ray diffractometer: By utilizing the fluctuation of X-rays, when they are irradiated onto a crystal, atoms or ions in the crystal act as scattering centers, scattering X-rays in all directions. Due to the regularity of atomic arrangement in crystals, these scattered waves interfere with each other and reinforce each other in certain directions, forming diffraction. By measuring the diffraction angle and diffraction intensity, the structural information of the crystal can be obtained. The main features of TD-3700 high-resolution X-ray diffractometer are: (1) Easy to operate, one click collection system; (2) Modular design, plug and play instrument accessories, no need for calibration; (3) Real time online monitoring using touch screen to display instrument status; (4) Electronic lead door interlocking device, dual protection, ensuring user safety; (5) High frequency and high-voltage X-ray generator, with stable and reliable performance; (6) Advanced recording control unit with strong anti-interference ability. The high precision of the TD-3700 high-resolution X-ray diffractometer enables high-precision analysis of the crystal structure of materials, such as precise determination of lattice constants, cell parameters, etc. The angle measurement accuracy can reach ±0.0001°. The high resolution of TD-3700 high-resolution X-ray diffractometer can clearly distinguish adjacent diffraction peaks, accurately analyze diffraction information of different crystal planes for complex crystal structures, and reveal the microstructure characteristics of materials. The non-destructive nature of the TD-3700 high-resolution X-ray diffractometer: it will not cause damage to the sample during the testing process, and the sample can be kept in its original state for multiple tests, which is particularly important for precious or difficult to obtain samples. Rapid analysis of TD-3700 high-resolution X-ray diffractometer: Modern high-resolution X-ray diffractometers have fast detection capabilities and can complete sample testing in a short period of time, improving work efficiency. 3. Application areas of TD-3700 high-resolution X-ray diffractometer: Semiconductor materials: used to detect the crystal quality of semiconductor single crystal materials and epitaxial thin films, analyze lattice mismatch, defects and other information, which helps optimize the performance of semiconductor devices. Superconducting materials: Study the crystal structure and phase transition process of superconducting materials to provide a basis for optimizing superconducting properties. Nanomaterials: Analyzing the grain size, crystal structure, microscopic strain, etc. of nanomaterials helps researchers better understand their properties and applications. Other fields: It is also widely used in research and quality control of metal materials, ceramic materials, polymer materials, biomaterials, and other fields. High resolution X-ray diffractometer is a high-precision, high-resolution, non-destructive, and fast analytical instrument with important application value in many fields.

The rotating sample holder in an X-ray diffractometer is a key component used for precise adjustment and fixation of the sample position,the sample can rotate within its own plane, which is beneficial for errors caused by coarse grains. For samples with texture and crystallography, rotating sample holder ensures good reproducibility of diffraction intensity and eliminates preferred orientation. Working principle of rotating sample holder: When the X-ray diffractometer is working, high-energy X-rays generated by the X-ray source are irradiated onto the sample fixed on the rotating sample stage. Due to the specific crystal structure and lattice parameters of the sample, X-rays will undergo scattering, absorption, and diffraction phenomena when interacting with the sample, where diffraction phenomena occur according to the requirements of the Bragg equation. The rotating sample holder can rotate at smaller angles according to the setting, allowing the sample to receive X-ray irradiation at different angles, thereby obtaining diffraction patterns at different angles. In this way, the detector can measure the X-ray intensity after sample diffraction and convert it into an electrical signal to be transmitted to the computer for data processing. The main function of the rotating sample holder is: Rotation method: β axis (sample plane) Rotation speed: 1~60RPM Small step width: 0.1 º Operation mode: Constant speed rotation for sample scanning (step, continuous) Advantages of rotating sample holder: The rotating sample holder can improve the accuracy of diffraction data: For samples with irregular powder or particle shapes, the characteristic of preferred orientation is prone to occur during conventional powder sample preparation, resulting in deviations in the distribution of diffraction intensity and affecting the accuracy of diffraction result analysis. Rotating the sample stage can move the sample in a certain form in an appropriate space, eliminating the influence of preferred orientation to a certain extent, thereby improving the accuracy of diffraction data. The rotating sample holder can adapt to various testing needs: able to adapt to different types of X-ray diffraction angle measuring instruments, such as vertical angle measuring instruments, low-power compact powder diffraction equipment, etc., providing convenience for different testing needs. And rotating sample holder can meet the requirements of various samples and testing conditions by adjusting parameters such as speed and steering. The rotating sample holder can expand the instrument's analytical capabilities: New types of rotating sample stages are constantly being developed and applied, such as some sample stages for in-situ electrochemical X-ray diffraction analysis, which can monitor and analyze the changes of materials in different environments or conditions in real time, expanding the analysis capabilities of X-ray diffraction equipment. In summary, the rotating sample holder in X-ray diffractometer is crucial for accurately obtaining crystal structure information of substances. the rotating sample holder can not only improve the accuracy of diffraction data, but also adapt to various testing needs and expand the analytical capabilities of the instrument.

In X-ray diffractometer, the multifunctional integrated measuring accessories are crucial component that greatly enhances the functionality and flexibility of the instrument. Used for the analysis of films on boards, blocks, and substrates, and can perform tests such as crystal phase detection, orientation, texture, stress, and in-plane structure of thin films. Basic overview of multifunctional integrated measuring accessories: Definition: They are general term for a series of additional devices or modules used in X-ray diffractometer to expand instrument functions, improve measurement accuracy and efficiency. Purpose: These attachments aim to enable X-ray diffractometer to meet a wider range of experimental needs and provide more comprehensive and accurate material structure information. The functional characteristics of multifunctional integrated measuring accessories: Perform polar diagram testing using transmission or reflection methods; Stress testing can be conducted using either the parallel tilt method or the same tilt method; Thin film testing (in-plane rotation of the sample). Technical characteristics of multifunctional integrated measuring accessories: High precision:They typically use advanced sensing technology and control systems to ensure high precision and repeatability of measurements. Automation: Many attachments support automated operations and can be seamlessly integrated with the X-ray diffractometer host to achieve one click measurement. Modular design: facilitates users to select and combine different accessory modules according to their actual needs. Application areas of multifunctional integrated measuring accessories: Widely used in fields such as materials science, physics, chemistry, biology, and geology; Evaluation of metal assembly structures such as rolled plates; Evaluation of ceramic orientation; Evaluation of crystal priority orientation in thin film samples; Residual stress testing of various metal and ceramic materials (evaluation of wear resistance, cutting resistance, etc.); Residual stress testing of multilayer films (evaluation of film peeling, etc.); Analysis of surface oxidation and nitride films on high-temperature superconducting materials such as thin films and metal plates; Glass Si、Analysis of multilayer films on metal substrates (magnetic thin films, metal surface hardening films, etc.); Analysis of electroplating materials such as macromolecular materials, paper, and lenses. The multifunctional integrated measuring accessories in X-ray diffractometer are the key to improving instrument performance. They not only enhance the functionality of the instrument, but also improve the accuracy and efficiency of measurement, providing researchers with more comprehensive and in-depth material analysis methods. With the continuous advancement of technology, these attachments will continue to play an important role in promoting scientific research in related fields to achieve more breakthroughs.

The TDM-20 Benchtop X-ray diffractometer uses a new high-performance array detector, and the loading of this detector has greatly improved the overall performance of the machine. The TDM-20 Benchtop XRD is mainly used for phase analysis of powders, solids, and similar paste like materials. The TDM-20 Benchtop X-ray diffractometer utilizes the principle of X-ray diffraction to perform qualitative or quantitative analysis, crystal structure analysis, and other polycrystalline materials such as powder samples and metal samples. Benchtop XRD​ is widely used in industries such as industry, agriculture, national defense, pharmaceuticals, minerals, food safety, petroleum, education, and scientific research.

The TD-3700 high-resolution X-ray diffractometer​ is equipped with a variety of high-performance detectors such as high-speed one-dimensional array detectors, two-dimensional detectors, SDD detectors, etc. TD-3700 X-ray diffractometer integrates fast analysis, convenient operation, and user safety. The modular hardware architecture and customized software system achieve a perfect combination, making its failure rate extremely low, anti-interference performance good, and ensuring long-term stable operation of high-voltage power supply. TD-3700 X-ray diffractometer can increase the diffraction calculation intensity by tens of times or more, obtain complete high-sensitivity, high-resolution diffraction patterns and higher counting intensity in a shorter sampling period, and also support transmission data scanning. The resolution of transmission mode is much higher than that of diffraction mode, which is suitable for structural analysis and other fields. Diffraction mode has strong diffraction signals and is more suitable for routine phase identification in the laboratory.

The TD-5000 X-ray single crystal diffractometer is mainly used to determine the three-dimensional spatial structure and electron cloud density of crystalline substances such as inorganic, organic, and metal complexes, and to analyze the structure of special materials such as twinning, non commensurate crystals, quasicrystals, etc. Determine the accurate three-dimensional space (including bond length, bond angle, configuration, conformation, and even bonding electron density) of new compound (crystalline) molecules and the actual arrangement of molecules in the lattice; It can provide information on the crystal cell parameters, space group, crystal molecular structure, intermolecular hydrogen bonding and weak interactions, as well as structural information such as molecular configuration and conformation. X-ray single crystal diffractometer​ is widely used in analytical research in chemical crystallography, molecular biology, pharmacology, mineralogy, and materials science. Single crystal XRD is a high-tech product under the National Major Scientific Instrument and Equipment Development Project of the Ministry of Science and Technology, led by Dandong Tongda Technology Co., Ltd., filling the gap in the development and production of single crystal x-ray diffractometer in China.

Powder X-ray diffractometer is mainly used for phase qualitative and quantitative analysis, crystal structure analysis, material structure analysis, crystal orientation analysis, macroscopic or microscopic stress determination, grain size determination, crystallinity determination, etc. of powder, block or film samples. The TD-3500 X-ray diffractometer produced by Dandong Tongda Technology Co., Ltd. adopts imported Siemens PLC control, which makes the TD-3500 X-ray diffractometer have the characteristics of high accuracy, high precision, good stability, long service life, easy upgrade, easy operation and intelligence, and can flexibly adapt to testing analysis and research in various industries!

The TD-3700 X-ray diffractometer is a high-performance and multifunctional X-ray diffractometer produced by Dandong Tongda Technology Co., Ltd. The main features are high-performance detectors, diverse scanning methods, convenient and safe operation, stable and reliable performance. For specific details, please refer to the website of Dandong Tongda Technology Co., Ltd.

The TDM-20 high-power X-ray diffractometer (benchtop XRD) is mainly used for phase analysis of powders, solids, and similar paste like materials. The principle of X-ray diffraction can be used for qualitative or quantitative analysis, crystal structure analysis, and other polycrystalline materials such as powder samples and metal samples. It is widely used in industries such as industry, agriculture, national defense, pharmaceuticals, minerals, food safety, petroleum, education, and scientific research.

X-ray diffractometer is mainly used for phase qualitative and quantitative analysis, crystal structure analysis, material structure analysis, crystal orientation analysis, macroscopic or microscopic stress determination, grain size determination, crystallinity determination, etc. of powder, block or film samples. It produced by Dandong Tongda Technology Co., Ltd. adopts imported Siemens PLC control, which makes the TD-3500 X-ray diffractometer have the characteristics of high accuracy, high precision, good stability, long service life, easy upgrade, easy operation and intelligence, and can flexibly adapt to testing analysis and research in various industries!

The TD-3700 series high-resolution X-ray diffractometer is a new member of the TD series, equipped with a variety of high-performance detectors such as high-speed one-dimensional array detectors, two-dimensional detectors, SDD detectors, etc. It integrates fast analysis, convenient operation, and user safety. The modular hardware architecture and customized software system achieve a perfect combination, making its failure rate extremely low, anti-interference performance good, and ensuring long-term stable operation of high-voltage power supply.