The TD series diffractometer embodies the essence of Tongda Technology's research and development over the years, evolving with the demands of the times. X-ray diffractometer is mainly used for phase qualitative and quantitative analysis, crystal structure analysis, material structure analysis, crystal orientation analysis, macroscopic or microscopic stress determination, grain size determination, crystallinity determination, etc. of powder, block or film samples. The TD-3500 X-ray diffractometer produced by Dandong Tongda Technology Co., Ltd. adopts imported Siemens PLC control, which makes the TD-3500 X-ray diffractometer have the characteristics of high accuracy, high precision, good stability, long service life, easy upgrade, easy operation and intelligence, and can flexibly adapt to testing analysis and research in various industries! Angle measuring instrument with hollow shaft structure

A high-precision X-ray single crystal diffractometer designed specifically for materials science research, crystal structure analysis, and industrial quality control. It utilizes the diffraction effect generated by the interaction between X-rays and single crystals to provide users with detailed crystal structure information by accurately measuring diffraction angles and intensities, thereby revealing the microstructure and properties of materials.

The in-situ battery accessory is a component of the X-ray diffractometer accessories.In situ battery accessories are widely used in electrochemical systems containing composite materials such as carbon, oxygen, nitrogen sulfur, and metal inserts. Test range: 0.5-160 degrees Celsius Temperature resistance: 400 ℃ Beryllium window (polyester film) size: diameter 15mm (customizable); Thickness 0.1mm (customizable) Dandong Tongda Technology Co., Ltd. is a professional manufacturer of X-ray diffractometers、Wholesaler of X-ray directional analyzer、Wholesaler of X-series X-ray crystal analyzer。

Today, diffractometer has become an important tool in scientific research, education, medical and other fields. However, the precision and complexity of the diffractometer makes it necessary to take extra care during transportation and packaging.

The TD-3500 powder X-ray diffractometer adopts imported Siemens PLC control, which makes the TD-3500 X-ray diffractometer highly accurate, stable, long-lasting, easy to upgrade, easy to operate and intelligent. It is mainly used for phase qualitative and quantitative analysis, crystal structure analysis, material structure analysis, crystal orientation analysis, macroscopic or microscopic stress determination, grain size determination, crystallinity determination, etc. of powder, block or thin film samples. Capable of flexibly adapting to testing, analysis, and research in various industries!

Dandong Tongda Technology Co., Ltd. is a professional manufacturer of X-ray products, with two main series of products: X-ray analysis instruments and X-ray non-destructive testing instruments. And in 2013, it became the undertaking unit of the X-ray single crystal diffractometer project of the National Major Scientific Instrument and Equipment Development Special Project of the Ministry of Science and Technology. Our company adheres to the principles of customer first, product first, and service first, insists on people-oriented, and has a strong technology team. We are committed to providing users with the highest quality high-tech products with advanced technology, and providing strong support and services to users with efficient technical consulting and after-sales service institutions.

Dandong Tongda Technology Co., Ltd. is a professional manufacturer of X-ray products, with two main series of products: X-ray analysis instruments and X-ray non-destructive testing instruments. And in 2013, it became the undertaking unit of the national major scientific instrument and equipment development special X-ray single crystal diffractometer project of the Ministry of Science and Technology of China. Our company adheres to the principles of customer first, product first, and service first, insists on people-oriented, and has a strong scientific and technological team. We are committed to providing users with the highest quality high-tech products with advanced technology, and providing strong support and services with efficient technical consulting and after-sales service institutions.

Dandong Tongda Technology Co., Ltd. is committed to the research and development, production, and sales of X-ray diffractometers. The company currently has X-ray diffractometers, X-ray desktop diffractometers, X-ray single crystal diffractometers, X-ray crystal analyzers, and other products, which are sold both domestically and internationally and have received unanimous praise from the industry.

Dandong Tongda Technology Co., Ltd. holds a team building event every summer to focus on the survival and development of employees, implement humanistic care that cares for, cherishes, and respects people, and stimulate the cohesion, enthusiasm, and vitality of employees. Tongda Technology Company is a professional manufacturer of X-ray analysis instruments. The company currently has TD series X-ray diffractometers, X-ray single crystal diffractometers, X-ray desktop diffractometers, X-ray crystal analyzers and other products. X-ray diffractometer is mainly used for phase qualitative and quantitative analysis, crystal structure analysis, material structure analysis, crystal orientation analysis, macroscopic or microscopic stress determination, grain size determination, crystallinity determination, etc. of powder, block or film samples.

X-ray diffractometer is mainly used for qualitative or quantitative analysis of sample phases, crystal structure analysis, crystallinity determination, etc. Various special functional accessories and corresponding control and application software can be installed according to actual needs to form a diffraction system with special functions. X-ray diffractometer is a laboratory analytical instrument with high precision.

The X-ray diffraction pattern serves as the most reliable foundation for determining polycrystalline patterns, and the X-ray diffraction pattern is frequently regarded as the "fingerprint" of crystalline patterns.