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Different crystal forms of the same drug may differ significantly in appearance, solubility, melting point, etc., affecting the stability, production, bioavailability, and safety of the drug.
X-ray diffraction is a method to study the phase and crystal structure of a substance by using the diffraction phenomenon of X-rays in a crystal.
X-ray diffraction is a method of analyzing the structure or composition of a sample by shining a monochromatic X-ray beam on it.
In-situ XRD, also known as In situ X-ray Diffraction, is a technique for making X-ray diffraction measurements during a structure or phase transition. This technology can monitor the dynamic change of the structure of the material under external force in real time.
Powder X-ray diffraction, as one of the methods for the study of drug polymorphism, has the advantages of not destroying samples and simple operation, and is the main method for the qualitative and quantitative analysis of drug polymorphism at present.
This paper introduces the related knowledge of crystal pattern and crystal fetish
Powder X-ray diffraction, as one of the methods for the study of drug polymorphism, has the advantages of no sample destruction and simple operation.
An X-ray diffractometer is a precision instrument used to study the crystal structure, morphology and properties of matter. During the packaging and transportation process, certain measures need to be taken to ensure that the safety and performance of the instrument are not affected.
X-ray diffractometer is mainly used for phase characterization, quantitative analysis, crystal structure analysis, material structure analysis, crystal orientation analysis of powder, block or thin film samples, etc.
Due to the different crystallization conditions, the particles of powder drug samples will have different morphologies.
Polycrystalline X-ray diffractometer, also known as powder diffractometer, is usually used to measure powder, polycrystalline metal or polymer bulk materials.
The full name of XRD is X-ray diffraction, which uses the diffraction phenomenon of X-ray in the crystal to obtain the X-ray signal characteristics after diffraction, and gets the diffraction pattern after processing.