X-ray diffractometer is mainly used for phase characterization, quantitative analysis, crystal structure analysis​, material structure analysis, crystal orientation analysis of powder, block or thin film samples.

X-ray diffractometer , also known as X-ray crystal diffractometer, abbreviated XPD or XRD, is an instrument to study the internal microstructure of matter. X-ray diffractometer has the advantages of high precision, high stability and convenient operation.

X-Ray Diffraction (XRD) is a major method for studying the phase and crystal structure of a substance. When a substance (crystal or non-crystal) is diffraction analysis, the substance is irradiated by X-rays to produce different degrees of diffraction phenomenon, material composition, crystal type, intramolecular bonding mode, molecular configuration, conformation and other material characteristics determine the specific diffraction pattern of the substance.