X-ray diffractometer is mainly used for phase characterization, quantitative analysis, crystal structure analysis, material structure analysis, crystal orientation analysis of powder, block or thin film samples. Measurement of macroscopic stress, measurement of grain size, measurement of crystallinity, etc.

TD-3700 diffractometer sample analysis map display:

1. SI powder (embedded image 111 unimodal magnification

Note: TD-3700 scan time is 10 times shorter than the ordinary diffractometer, improving the scanning efficiency and saving time.

2. Full spectrum of SiO2 (embedded image: five-finger peak local amplification)

                           TD-3700 (Mythen detector) VS TD-3500 (Scintillation detector)

3.Single peak comparison of diffraction data of Si powder samples

Note: TD-3700 can obtain higher peak intensity, higher resolution and smaller peak half-height width than ordinary diffractometer

4. Al2O3 diffraction spectrum