X-ray absorption fine structure spectrometer is a powerful tool for studying the local atomic or electronic structure of materials, widely used in popular fields such as catalysis, energy, and nanotechnology. XAFS core advantages: Highest luminous flux product: Photon flux exceeding 1000000 photons/second/eV, with spectral efficiency several times higher than other products; Obtain data quality equivalent to synchrotron radiation Excellent stability: The stability of monochromatic light intensity of the light source is better than 0.1%, and the energy drift during repeated collection is less than 50 meV 1% detection limit: High luminous flux, excellent optical path optimization, and excellent light source stability ensure high-quality EXAFS data is obtained even when the measured element content is>1%。

Using X-ray diffraction (transmission) method to test the unique crystal structure of fibers. Test the orientation of the sample based on data such as fiber texture and half peak width.

The data collected through low-temperature equipment yields more ideal results. With the help of low-temperature equipment, more advantageous conditions can be provided, which can enable undesirable crystals to obtain ideal results, as well as ideal crystals to obtain more ideal results.

θ - θ structure, the sample remains stationary while the radiation source and detector rotate; Adopting imported high-precision bearing transmission, with good stability; High precision fully closed-loop vector drive servo system control, Contains 32-bit RISC microprocessor and high-resolution magnetic encoder for automatic error correction;

The crystal structure of the perovskite films modified by ionic liquid (ILs) BMIMAc under various annealing durations was characterized by X-ray diffraction.

Battery material analysis helps to understand and optimize battery performance, improve battery safety and life, reduce costs, and promote the development and application of new materials.

X-ray absorption spectroscopy is a spectral technique to analyze the elemental composition and electronic states of materials by using the signal changes before and after the incident of synchrotron radiation X-rays.

XAFS, as an advanced characterization technique for the local structure analysis of materials, can provide more accurate atomic structure coordination information in the short-range structure range than X-ray crystal diffraction.

A material whose properties are dominated by two-dimensional effects, the properties of the material on a two-dimensional scale are different from its properties on a larger scale.

Recently, A new study successfully fused metal oxides with zeolite A, and revealed the mystery of this process through XRD and FTIR technology.

X-ray Absorption Fine Structure(XAFS) is a powerful tool for studying the local atomic or electronic struct ure of materials based on synchrotron radiation light source.