This article mainly shares some relevant issues about "JADE software analysis and processing XRD data".

X-ray diffractometer is mainly used for phase characterization, quantitative analysis, crystal structure analysis​, material structure analysis, crystal orientation analysis of powder, block or thin film samples.

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X-Ray Diffraction (XRD) is a major method for studying the phase and crystal structure of a substance. When a substance (crystal or non-crystal) is diffraction analysis, the substance is irradiated by X-rays to produce different degrees of diffraction phenomenon, material composition, crystal type, intramolecular bonding mode, molecular configuration, conformation and other material characteristics determine the specific diffraction pattern of the substance.

It uses the X-ray principle to carry out qualitative or quantitative analysis and crystal structure analysis of polycrystalline materials such as powder samples and metal samples.