- Home
- >
News
Driven by an imported stepper motor and controlled by an imported Siemens programmable logic controller (PLC), there is no need for manual sample replacement. The system automatically measures samples continuously and saves data automatically. Six samples can be loaded at once for continuous measurement.
Dandong Tongda Technology Co., Ltd. is a professional manufacturer of X-ray products, with two main series of products: X-ray analysis instruments and X-ray non-destructive testing instruments. And in 2013, it became the undertaking unit of the X-ray single crystal diffractometer project of the National Major Scientific Instrument and Equipment Development Special Project of the Ministry of Science and Technology. Our company adheres to the principles of customer first, product first, and service first, insists on people-oriented, and has a strong technology team. We are committed to providing users with the highest quality high-tech products with advanced technology, and providing strong support and services to users with efficient technical consulting and after-sales service institutions.
The data collected through low-temperature equipment yields more ideal results. With the help of low-temperature equipment, more advantageous conditions can be provided, which can enable undesirable crystals to obtain ideal results, as well as ideal crystals to obtain more ideal results.
Software feature description:This program is a self-developed program. It contains various quantitative methods developed independently, in accordance with diffraction theory, and calculated entirely using integrated intensity.Analysis function. If this program contains the function of full spectrum peak fitting, separation and quantification that can still be accurately quantified under different phase line widths; as The function of the integrated intensity quantification method, which can conveniently automatically eliminate the interference of overlapping peaks of this phase and other phases, and is not affected by the different line widths of each phase, such as Complete PDF file calculation spectrum combination full spectrum fitting method, custom card file calculation spectrum combination full spectrum fitting method, etc. All the above methods use integration. The concept of intensity can be quantified by full spectrum fitting without involving structure and with different phase line widths. Can exclude overlapping peaks.Interference can reduce or eliminate the influence of preferred orientation.
Dandong Tongda Technology Co., Ltd. is a professional manufacturer of X-ray products, with two main series of products: X-ray analysis instruments and X-ray non-destructive testing instruments. And in 2013, it became the undertaking unit of the national major scientific instrument and equipment development special X-ray single crystal diffractometer project of the Ministry of Science and Technology of China. Our company adheres to the principles of customer first, product first, and service first, insists on people-oriented, and has a strong scientific and technological team. We are committed to providing users with the highest quality high-tech products with advanced technology, and providing strong support and services with efficient technical consulting and after-sales service institutions.
The use of hybrid pixel detector can achieve the best data quality while ensuring low power consumption and low cooling. This detector combines the key technologies of single photon counting and hybrid pixels, and is applied in various fields such as synchrotron radiation and conventional laboratory light sources, effectively eliminating the interference of readout noise and dark current. Hybrid pixel technology can directly detect X-rays, making it easier to distinguish signals, and detector can efficiently provide high-quality data.
The TD series X-ray diffractometer inherits its consistent high stability and high-precision closed-loop vector driven servo positioning technology, further improving accuracy. In addition to upgrading traditional performance such as plug and play optical path with triple protection, the TD-3700 also incorporates vertical hollow axis and HPC hybrid photon counting technology, making it a representative of the new generation of X-ray diffractometers and one of the best X-ray polycrystalline diffractometers in the world.
We not only provide products, but as a carrier, we pay more attention to the convenience, efficiency, accuracy, and satisfaction that it can bring to our customers' actual work. This is our commitment that we have always upheld. As the most advanced domestically produced X-ray diffractometer, TD-3500 has benefited organizations such as colleges, research institutions, and industrial enterprises in material identification and analysis, receiving high praise. This also confirms our commitment to customer satisfaction. Of course, with the rapid pace of the times and competition, in order to ensure higher customer expectations, we continuously update and improve our product line. Our goal is not only to lead domestically, but also to keep up with the world!
Recently, the Ministry of Science and Technology announced the list of the second batch of key projects under the 2023 National key research and Development Plan "Basic scientific research Conditions and major scientific instruments and equipment research and development".
It is difficult to quantify the amorphous and crystalline phases of cement materials due to the complexity of the mineral phases in the mixture and the significant overlapping peaks. Excellent results can be obtained by Rietveld refinement of the measured sample using standard measurement configurations.
X-ray diffraction spectroscopy mainly analyzes the crystal state and microstructure of materials, and there are two X-ray diffraction measurement methods for crystal analysis.
Researchers at the synchrotron radiation facility SPring-8 at the RIKEN Research Institute in Japan and their collaborators have developed a faster and simpler way to perform segmentation analysis, an important process in materials science.