X-ray absorption fine structure Spectrum (XAFS) is a powerful tool for studying the local atomic or electronic structure of materials, widely used in popular fields such as catalysis, energy, and nanotechnology. The principle of X-ray absorption fine structure Spectrum(XAFS): X-ray absorption fine structure Spectrum refers to high-resolution spectra near the characteristic edges of atomic core electrons absorbing X-rays. When the energy of X-rays is the same as the excitation energy of the inner shell electrons of the measured element, they will be strongly absorbed, resulting in an absorption limit (or absorption edge). Near the absorption edge, due to multiple scattering and other reasons, the absorption coefficient of X-rays will exhibit oscillatory phenomena, namely fine structure. 2. Core advantages of X-ray absorption fine structure Spectrum(XAFS): (1) The highest luminous flux product, with a photon flux exceeding 1000000 photons/second/eV, and a spectral efficiency several times higher than other products; Obtain data quality equivalent to synchrotron radiation (2) Excellent stability, monochromatic light intensity stability of the light source is better than 0.1%, and repeated energy drift is less than 50 meV (3) 1% detection limit, high light flux, excellent optical path optimization, and excellent light source stability ensure that high-quality EXAFS data can still be obtained when the measured element content is>1%. 3. Application areas of XAFS: Industrial catalysis, energy storage materials, nanomaterials, environmental toxicology, qualitative analysis, heavy element analysis, etc. 4. Main features of XAFS: (1) Short range ordering: EXAFS depends on short-range interactions and does not rely on long-range ordering. XAFS can be used to study the structure of disordered systems such as amorphous, liquid, molten, and catalyst active centers. (2) Element specificity: Fluorescence method can be used to measure samples of elements with concentrations as low as one millionth. By adjusting the incident X-ray energy, the neighboring structures of atoms of different elements in the same compound can be studied. (3) Polarization characteristics: Polarized X-rays can be used to measure atomic bond angles and surface structures in oriented samples. The X-ray absorption fine structure Spectrum, with its unique principles, significant characteristics, and wide application fields, has become an indispensable and important tool in multiple fields such as materials science, catalytic chemistry, and energy research, providing strong support for in-depth exploration of material microstructures and electronic states.

X-ray absorption fine structure spectrometer (XAFS) is a powerful tool for studying the local atomic or electronic structure of materials, widely used in popular fields such as catalysis, energy, and nanotechnology.

X-ray absorption fine structure spectrum (XAFS) is an analytical tool used to study the structure and properties of substances. XAFS obtains information about atoms and molecules in a sample by measuring the X-ray absorption of the sample within a specific energy range. XAFS is a powerful tool for studying the local atomic or electronic structure of materials.XAFS technology is widely used in materials science, chemistry, biology, and other fields, especially in research areas such as catalysis, batteries, sensors, etc. XAFS has important application value. Through XAFS technology, researchers can gain a deeper understanding of the microstructure and properties of samples, providing powerful support for the design and optimization of new materials.

X-ray absorption fine structure spectrometer is a powerful tool for studying the local atomic or electronic structure of materials, widely used in popular fields such as catalysis, energy, and nanotechnology. XAFS core advantages: Highest luminous flux product: Photon flux exceeding 1000000 photons/second/eV, with spectral efficiency several times higher than other products; Obtain data quality equivalent to synchrotron radiation Excellent stability: The stability of monochromatic light intensity of the light source is better than 0.1%, and the energy drift during repeated collection is less than 50 meV 1% detection limit: High luminous flux, excellent optical path optimization, and excellent light source stability ensure high-quality EXAFS data is obtained even when the measured element content is>1%。

At present, XAFS has been applied in many fields, especially in the field of catalysis and battery materials research, and has become an important accurate characterization method.

X-ray Absorption Fine Structure(XAFS) is a powerful tool for studying the local atomic or electronic struct ure of materials based on synchrotron radiation light source.