X-ray diffractometers determine material crystal structures by analyzing X-ray diffraction patterns. Essential in materials science, chemistry, and biomedicine, they enable property optimization and drug development. Evolving with high resolution and speed, they are increasingly crucial for nanotechnology and quantum materials research, supporting global scientific and industrial progress.

TD-3700 XRD: Key Steps & Safety Procedure: Startup prep, calibration, sample loading, scanning, data analysis. Safety: Trained operators only. Wear full protective gear (dosimeter, lead glasses). Never open door during operation. Maintain clean, stable environment. Follow strict maintenance and emergency protocols.

Enhance resolution by upgrading to a high-resolution detector, optimizing crystal quality, employing precise data collection strategies, utilizing advanced software, and ensuring regular instrument maintenance.

XRD maintenance requires strict environmental control (temperature, humidity), regular cooling system care, and X-ray tube upkeep. Key troubleshooting includes resolving high voltage startup, shutter operation, goniometer errors, and cooling water alarms to ensure instrument stability and data accuracy.

A quality single crystal for X-ray diffraction requires optimal solvent choice (moderate solubility/volatility), proper growth method (evaporation/diffusion), high sample purity, and a vibration-free environment to ensure well-defined morphology and minimal defects.

XRD analyzers use Bragg's Law to measure diffraction angles, enabling non-destructive decoding of crystal phases, lattice constants, grain size, and stress from interplanar spacing changes.

XRD maintenance follows "Prevention First, Regular Inspection." Safety protocols require "Protection Priority, Standardized Procedures." Key practices include environment control, component care, strict safety checks, and proper shutdown. Adherence ensures instrument longevity, operator safety, and data reliability.

Dandong Tongda Technology Co., Ltd. is a high-tech enterprise from China specializing in X-ray analysis and NDT equipment. With core competitiveness in XRD, we provide precise tools for global research and industry.

Powder diffractometer efficiency can be doubled by optimizing sample preparation (grinding, loading), instrument parameters (scan range/speed), and adopting batch processing and routine maintenance. These steps ensure high-quality data while significantly reducing experimental time and rework.

In the fields of materials science and industrial testing, precise sample analysis relies on reliable instruments. The rotating sample stage produced by Dandong Tongda Technology Co., Ltd. is precisely such a critical accessory dedicated to enhancing the quality of X-ray diffraction (XRD) analysis. In X-ray diffraction analysis, the characteristics of the sample itself often pose challenges. For example, when the grains are excessively coarse, the material exhibits significant texture (or "preferred orientation," meaning the grains are not randomly arranged), or the sample has specific crystal habits (crystal growth patterns), obtaining diffraction data that is statistically representative and truly reflects the overall material properties becomes difficult. When measuring such samples with traditional static sample stages, the diffraction intensity may be distorted due to the aforementioned factors, affecting the accuracy of phase identification, texture analysis, and other evaluations. The core design philosophy of Tongda Technology's rotating sample stage is to address these challenges by enabling smooth rotation of the sample within its own plane. Core Function: Eliminating Orientation Errors and Enhancing Data Reliability The working principle of this rotating sample stage is intuitive and effective. By driving the sample to rotate continuously or in a stepwise manner, it ensures that the X-ray beam covers more grains with different orientations on the sample during irradiation. The main advantages of this approach are: Effective Reduction of Measurement Errors: Through the rotation averaging effect, it significantly mitigates measurement deviations caused by coarse grains or preferred orientation, making the diffraction data more representative of the material's overall properties. Ensuring Result Reproducibility: Whether the sample itself has texture or not, it guarantees good reproducibility of diffraction intensity across multiple measurements or between different laboratories, enhancing the reliability and comparability of data. Simplified Sample Preparation Requirements: It reduces the stringent demands for perfect sample preparation to a certain extent, improving analysis efficiency. Technical Specifications: Precision Control and Flexible Adaptability The rotating sample stage from Dandong Tongda Technology offers the following key technical parameters to meet the rigorous demands of scientific research and industrial testing: ParameterDescription Rotation Methodβ-axis (sample rotates within its own plane) Rotation Speed Range1 ~ 60 RPM (revolutions per minute) Adjustable based on experimental requirements Stepping PrecisionMinimum step width: 0.1º Supports high-precision positioning scanning Operation ModesConstant-speed rotation (for sample scanning), stepping, continuous, and other modes Adapts to various testing workflows and data acquisition needs Typical ApplicationsQuality control and R&D in industries such as environmental protection and electronics CompatibilityPrimarily used as an accessory for X-ray diffraction spectrometers (XRD) Application Scenarios: Serving the Environmental Protection and Electronics Industries This rotating sample stage is not merely a "showpiece" in the laboratory; it directly serves industries with high requirements for material analysis, such as environmental protection and electronics. In areas such as quality control, new product development, and failure analysis in these fields, it assists engineers and researchers in conducting more accurate phase analysis on samples of various forms, including powders, bulk materials, and thin films, ensuring the authenticity and reliability of data.

XRD and FTIR fiber accessories provide complete material characterization solutions. XRD units analyze crystal structure and orientation, while FTIR systems identify composition through micro-imaging and ATR technology. Accessories include small-angle diffraction, parallel beam thin-film, and in-situ temperature stages for nanoscale analysis. Automated sample handling enhances efficiency. Applications span material research, industrial quality control, and scientific studies of polymer dichroism. These tools continue to evolve, driving innovations in fiber science and industrial applications.

Fiber accessories are tested for their unique crystal structure using X-ray diffraction (transmission) method. Test the orientation of the sample based on data such as fiber texture and half peak width.