X-ray absorption fine structure spectrometer is a powerful tool for studying the local atomic or electronic structure of materials, widely used in popular fields such as catalysis, energy, and nanotechnology. XAFS core advantages: Highest luminous flux product: Photon flux exceeding 1000000 photons/second/eV, with spectral efficiency several times higher than other products; Obtain data quality equivalent to synchrotron radiation Excellent stability: The stability of monochromatic light intensity of the light source is better than 0.1%, and the energy drift during repeated collection is less than 50 meV 1% detection limit: High luminous flux, excellent optical path optimization, and excellent light source stability ensure high-quality EXAFS data is obtained even when the measured element content is>1%。

X-ray absorption spectroscopy is a spectral technique to analyze the elemental composition and electronic states of materials by using the signal changes before and after the incident of synchrotron radiation X-rays.

XAFS, as an advanced characterization technique for the local structure analysis of materials, can provide more accurate atomic structure coordination information in the short-range structure range than X-ray crystal diffraction.

X-ray Absorption Fine Structure(XAFS) is a powerful tool for studying the local atomic or electronic struct ure of materials based on synchrotron radiation light source.