X-ray absorption fine structure spectrometer (XAFS) is a powerful tool for studying the local atomic or electronic structure of materials, widely used in popular fields such as catalysis, energy, and nanotechnology.

X-ray absorption fine structure spectrum (XAFS) is an analytical tool used to study the structure and properties of substances. XAFS obtains information about atoms and molecules in a sample by measuring the X-ray absorption of the sample within a specific energy range. XAFS is a powerful tool for studying the local atomic or electronic structure of materials.XAFS technology is widely used in materials science, chemistry, biology, and other fields, especially in research areas such as catalysis, batteries, sensors, etc. XAFS has important application value. Through XAFS technology, researchers can gain a deeper understanding of the microstructure and properties of samples, providing powerful support for the design and optimization of new materials.

X-ray absorption fine structure spectrometer is a powerful tool for studying the local atomic or electronic structure of materials, widely used in popular fields such as catalysis, energy, and nanotechnology. XAFS core advantages: Highest luminous flux product: Photon flux exceeding 1000000 photons/second/eV, with spectral efficiency several times higher than other products; Obtain data quality equivalent to synchrotron radiation Excellent stability: The stability of monochromatic light intensity of the light source is better than 0.1%, and the energy drift during repeated collection is less than 50 meV 1% detection limit: High luminous flux, excellent optical path optimization, and excellent light source stability ensure high-quality EXAFS data is obtained even when the measured element content is>1%。

X-ray absorption spectroscopy is a spectral technique to analyze the elemental composition and electronic states of materials by using the signal changes before and after the incident of synchrotron radiation X-rays.

XAFS, as an advanced characterization technique for the local structure analysis of materials, can provide more accurate atomic structure coordination information in the short-range structure range than X-ray crystal diffraction.

X-ray Absorption Fine Structure(XAFS) is a powerful tool for studying the local atomic or electronic struct ure of materials based on synchrotron radiation light source.