X-ray absorption spectroscopy is a spectral technique to analyze the elemental composition and electronic states of materials by using the signal changes before and after the incident of synchrotron radiation X-rays.

XAFS, as an advanced characterization technique for the local structure analysis of materials, can provide more accurate atomic structure coordination information in the short-range structure range than X-ray crystal diffraction.

X-ray Absorption Fine Structure(XAFS) is a powerful tool for studying the local atomic or electronic struct ure of materials based on synchrotron radiation light source.