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Tongda Technology Diffraction Instrument

X-ray diffractometer is mainly used for phase qualitative and quantitative analysis, crystal structure analysis, material structure analysis, crystal orientation analysis, macroscopic or microscopic stress determination, grain size determination, crystallinity determination, etc. of powder, block or film samples.

2024/09/11
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detector

The use of hybrid pixel detector can achieve the best data quality while ensuring low power consumption and low cooling. This detector combines the key technologies of single photon counting and hybrid pixels, and is applied in various fields such as synchrotron radiation and conventional laboratory light sources, effectively eliminating the interference of readout noise and dark current. Hybrid pixel technology can directly detect X-rays, making it easier to distinguish signals, and detector can efficiently provide high-quality data.

2024/09/06
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Angle measuring instrument

The high-precision multifunctional angle measuring instrument of Tongda Technology can not only measure conventional powder samples, but also test liquid samples, colloidal samples, viscous samples, loose powders, and large solid samples.

2024/09/05
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Multi functional angle measuring instrument

The goniometer is the heart of the X-ray diffractometer, and the TD series X-ray diffractometer has extremely high measurement accuracy

2024/09/04
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X-ray diffractometer

X-ray diffractometer is mainly used for qualitative or quantitative analysis of sample phases, crystal structure analysis, crystallinity determination, etc. Various special functional accessories and corresponding control and application software can be installed according to actual needs to form a diffraction system with special functions. X-ray diffractometer is a laboratory analytical instrument with high precision.

2024/08/29
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Analysis method of XRD pattern of drug crystal powder

The X-ray diffraction pattern serves as the most reliable foundation for determining polycrystalline patterns, and the X-ray diffraction pattern is frequently regarded as the "fingerprint" of crystalline patterns.

2024/06/28
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Characterization of perovskite -- XRD pattern analysis

The crystal structure of the perovskite films modified by ionic liquid (ILs) BMIMAc under various annealing durations was characterized by X-ray diffraction.

2024/06/26
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Non-destructive testing technology - X-ray diffraction

X-ray diffraction is a fast, accurate and efficient non-destructive testing technique for materials. As a means of characterizing the crystal structure and its change rule, it is widely used in many fields such as biology, medicine, ceramics and so on.

2024/06/21
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XRD application

The properties of materials are often determined by their phase composition, and XRD is widely used as one of the main means of phase analysis.

2024/06/14
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