Parallel optical film measuring accessory is a specialized tool for X-ray diffraction analysis, which filters out more scattered lines by increasing the length of the grating plate, thereby reducing the influence of the substrate signal on the results and enhancing the signal intensity of the thin film. In the field of materials science, parallel optical film measuring accessory is commonly used to study the crystal structure, phase transition behavior, and stress state of thin film materials. With the development of nanotechnology, parallel optical film measuring accessory has also been widely used in thickness testing and small angle diffraction analysis of nano multilayer films. The design and manufacturing of parallel optical film measuring accessory pursue high precision to meet the requirements of scientific research and industrial production for data accuracy. During use, parallel optical film measuring accessory need to maintain a high degree of stability to ensure the reliability of test results. With the advancement of technology and the development of industry, the demand for high-precision and high stability analytical instruments is constantly increasing. Parallel optical film measuring accessory, as an important component, are also experiencing sustained market demand growth. In order to meet market demand and improve product performance, the technology of parallel optical film measuring accessory is constantly innovating and improving. For example, improving the material and design of grating plates, optimizing the optical system, and other means can enhance the filtering effect and signal enhancement capability. In summary, parallel optical film measuring accessory play a crucial role in X-ray diffraction analysis. With the advancement of technology and the development of industry, its application prospects will become even broader.

The small angle diffractometer accessories are special device used in X-ray diffraction (XRD) experiments, mainly for measuring diffraction peaks in the low angle range to study the microstructure and properties of materials. The small angle diffractometer accessories are specialized device for X-ray diffractometers that allows for precise diffraction measurements within a lower 2θangle range (typically from 0°to 5°or lower). This technology is of great significance for studying nanostructures, mesoporous materials, multilayer films, and other materials. By configuring corresponding small angle diffractometer accessories, the thickness of nano multilayer films can be accurately measured. Overall, small angle diffractometer accessories are an indispensable and important component of X-ray diffractometers, with broad application prospects in materials science, chemistry, physics, and other fields.

Fiber accessories are tested for their unique crystal structure using X-ray diffraction (transmission) method. Test the orientation of the sample based on data such as fiber crystallinity and half peak width. Fiber accessories have a wide range of applications in various fields, including materials science, biomedicine, chemical engineering, nanotechnology, geological exploration, environmental monitoring, and more.

The TD-3700 high-resolution X-ray diffractometer, with all the advantages of the TD-3500 X-ray diffractometer, is equipped with a high-performance array detector. Compared to scintillation detectors or proportional detectors, diffraction calculation intensity can be increased by several tens of times, and complete high-sensitivity, high-resolution diffraction patterns and higher counting intensity can be obtained in a shorter sampling period. The TD-3700 high-resolution X-ray diffractometer supports both conventional diffraction data scanning and transmission data scanning methods. The resolution of transmission mode is much higher than that of diffraction mode, which is suitable for structural analysis and other fields. Diffraction mode has strong diffraction signals and is more suitable for routine phase identification in the laboratory. In addition, in the transmission mode, the powder sample can be in trace amounts, which is suitable for data acquisition in cases where the sample size is relatively small and does not meet the requirements of diffraction method for sample preparation.

Using X-ray diffraction (transmission) method to test the unique crystal structure of fibers. Test the orientation of the sample based on data such as fiber texture and half peak width.

The use of four concentric circles technique ensures that the center of the angle measuring instrument remains unchanged regardless of any rotation, achieving the goal of obtaining the most accurate data and higher completeness. Four concentric circles are a necessary condition for conventional single crystal scanning.

X-ray diffractometer is mainly used for phase qualitative and quantitative analysis, crystal structure analysis, material structure analysis, crystal orientation analysis, macroscopic or microscopic stress determination, grain size determination, crystallinity determination, etc. of powder, block or film samples.

The use of hybrid pixel detector can achieve the best data quality while ensuring low power consumption and low cooling. This detector combines the key technologies of single photon counting and hybrid pixels, and is applied in various fields such as synchrotron radiation and conventional laboratory light sources, effectively eliminating the interference of readout noise and dark current. Hybrid pixel technology can directly detect X-rays, making it easier to distinguish signals, and detector can efficiently provide high-quality data.

The high-precision multifunctional angle measuring instrument of Tongda Technology can not only measure conventional powder samples, but also test liquid samples, colloidal samples, viscous samples, loose powders, and large solid samples.

The goniometer is the heart of the X-ray diffractometer, and the TD series X-ray diffractometer has extremely high measurement accuracy

X-ray diffractometer is mainly used for qualitative or quantitative analysis of sample phases, crystal structure analysis, crystallinity determination, etc. Various special functional accessories and corresponding control and application software can be installed according to actual needs to form a diffraction system with special functions. X-ray diffractometer is a laboratory analytical instrument with high precision.