To understand the changes in crystal structure of samples during high-temperature heating and the changes in mutual dissolution of various substances during high-temperature heating. In situ high-temperature attachment is an experimental device used for in-situ characterization of materials under high temperature conditions, mainly used to study dynamic processes such as crystal structure changes, phase transitions, and chemical reactions of materials during high-temperature heating. The following provides a detailed introduction from the aspects of technical parameters, application scenarios, and precautions: 一、 Technical parameters of in-situ high-temperature attachments 1. Temperature range of in-situ high-temperature attachments Inert gas/vacuum environment: The maximum temperature can reach 1600 ℃. Standard environment: Room temperature to 1200 ℃ (as provided in the TD-3500 XRD accessory). 2. Temperature control accuracy of in-situ high-temperature accessories: usually ± 0.5 ℃ (such as in-situ high-temperature accessories), and the accuracy of some equipment above 1000 ℃ is ± 0.5 ℃. 3. Window materials and cooling methods for in-situ high-temperature attachments Window material: Polyester film (temperature resistant to 400 ℃) or beryllium sheet (thickness 0.1mm), used for X-ray penetration. Cooling method: Deionized water circulation cooling ensures stable operation of the equipment under high temperature conditions. 4. Atmosphere and pressure control of in-situ high-temperature attachments: Supports inert gases (such as Ar, N ₂), vacuum or atmospheric environments, and some models can withstand pressures less than 10 bar. The atmosphere gas flow rate can be adjusted (0.7-2.5L/min), suitable for corrosive gas environments. 二、 Application scenarios of in-situ high-temperature attachments 1. Material research on in-situ high-temperature attachments Analyze the changes in crystal structure (such as platinum phase transition) and phase transition processes (such as melting and sublimation) at high temperatures. Study the chemical reactions of materials at high temperatures, such as dissolution and oxidation. 2. Equipment adaptability of in-situ high-temperature attachments Mainly used in X-ray diffractometers (XRD), such as TD-3500, TD-3700, etc. It can also be used for in-situ tensile testing using scanning electron microscopy (SEM), with customized flange connections required. 三、 Precautions for using in-situ high-temperature accessories 1. Sample requirements for in-situ high-temperature attachments It is necessary to test the chemical stability of the sample in the target temperature range in advance to avoid decomposition into strong acids/bases or ceramic bonding. The sample shape must meet the requirements of the attachment (such as thickness 0.5-4.5mm, diameter 20mm). 2. Experimental operating procedures for in-situ high-temperature attachments The heating rate needs to be controlled (e.g. maximum 200 ℃)/ min@100 ℃) to avoid overheating and damaging the equipment. After the experiment, the sample needs to be cooled to room temperature to prevent structural damage.

The multifunctional sample stage is a highly integrated experimental equipment mainly used in the fields of materials science, semiconductor manufacturing, electron microscopy analysis, etc. Its core features are modular design, multifunctional integration, and high-precision control. 一、 The core functions and structural characteristics of the multifunctional sample stage 1. Modular design of multifunctional sample stage: Multiple functions are achieved through different module combinations, such as self rotation coupling module (speed 0~20 revolutions per minute, with zero limit), lifting module (standard stroke 50mm/100mm, customizable), heater module (maximum temperature up to 1100 ℃), etc. Support DC/RF power supply connection to meet the needs of thin film growth, sample cleaning, or auxiliary film formation. 2. High precision control and sensors for multifunctional sample stage: Equipped with temperature, pressure and other sensors, real-time monitoring of sample environmental parameters, and adjusting heating, cooling and other operations through the control system. Some models integrate pneumatic baffle modules for easy operation. 3. Compatibility and adaptability of multifunctional sample stage: Suitable for testing irregular samples such as trace powders, sheet materials, and large-sized samples, avoiding the damage caused by traditional cutting or grinding. Supports sample sizes below 6 inches and customizable flange interfaces. 二、 Application Fields of Multi functional Sample Stand 1. Thin film technology for multifunctional sample stage: used for advanced thin film growth technologies such as MBE (molecular beam epitaxy), PLD (pulsed laser deposition), magnetron sputtering, as well as substrate annealing, high-temperature degassing and other processes. 2. Electron microscopy analysis of multifunctional sample stage: Cold field scanning electron microscope: Fix the sample with long screws and adjust the conductivity with compatible brass washers. TEM/FIB system: integrates in-situ delamination, nanoprobe testing, and TEM analysis to avoid contamination or damage caused by sample transfer. 3. Failure analysis of multifunctional sample stage: Integrating atomic site stripping, electrical testing and analysis processes in FIB and TEM systems to improve success rate and efficiency. 三、 Technical advantages of multifunctional sample stage 1. Integration and automation of multifunctional sample stage: reduces manual operation complexity through modular design, supports overall movement and precise positioning in vacuum environment. 2. High reliability of the multifunctional sample stage: using standard flange interfaces (such as CF50/CF40) to ensure sealing and compatibility. 3. Customization of multifunctional sample table: Heating material, stroke length, and sample holder type (such as 3-jaw bayonet type, bottom fork type) can be selected according to needs. Overall, the multifunctional sample stage is a key equipment for material research and micro analysis, commonly used in X-ray diffraction instruments. Its value lies in functional integration, operational flexibility, and adaptability to complex experimental requirements. The specific selection needs to match the corresponding modules and performance parameters according to the actual application scenarios (such as thin film technology, electron microscopy analysis, or failure analysis).

一、Core functions and application scenarios of originally battery accessories Functional positioning of originally battery accessories: 1.Implement real-time testing during battery charging and discharging processes (such as XRD, optical observation, etc.) to avoid data loss or sample contamination caused by traditional disassembly. 2.Simulate the working environment of real batteries, support temperature control, electrolyte addition, and sealing guarantee. Typical application scenarios of originally battery accessories: 1.XRD in-situ testing: Analyze the crystal phase changes of electrode materials (such as LiFePO4) during charge and discharge processes. 2.Optical in-situ observation: Observe the surface reaction of the electrode through a beryllium window (polyester film). 3.High throughput screening: supports battery performance research under multiple conditions (temperature, pressure, electrolyte). 4.Widely used in electrochemical systems containing carbon, oxygen, nitrogen sulfur, metal embedded complexes, etc.    二、Structural composition and material properties of originally battery accessories 1.Core components of originally battery accessories: Lower insulation cover: mostly made of alumina ceramic or polytetrafluoroethylene material, including installation chamber and coolant flow channel, supporting temperature control. Upper conductive cover: designed with through holes, bolted to the lower insulating cover to form a current path. Lower electrode: including top plate and support column, fixed by butterfly spring compression, simplifying the assembly process. Beryllium window (polyester film): diameter 15mm (customizable), thickness 0.1mm (customizable), used for X-ray penetration or optical observation. 2.Technical improvement of originally battery accessories: Formal assembly: replaces traditional inverted methods, simplifies the operation process, and reduces the impact of compression on the separator and positive electrode materials. Cooling and Heating: The lower insulation cover integrates a coolant channel or resistance wire pipeline, supporting temperature control of -400℃. Sealing design: The butterfly spring compresses and fixes the lower electrode, and cooperates with the installation seat airflow to blow and prevent frost and ice formation. 三、Technical advantages of originally battery accessories 1. Convenient operation of originally battery accessories: The formal structure reduces the operating time inside the glove box and lowers the assembly complexity. Modular design of components (such as replaceable beryllium windows and insulation sleeves) improves maintenance efficiency. 2. Performance parameters: Test range: Temperature range of 0.5-160℃, temperature resistance up to 400 ℃. Sealing: Supports long-term stable storage of electrolyte to avoid leakage. Compatibility: Suitable for X-ray diffractometers and other equipment.

XRD and FTIR fiber accessories provide complete material characterization solutions. XRD units analyze crystal structure and orientation, while FTIR systems identify composition through micro-imaging and ATR technology. Accessories include small-angle diffraction, parallel beam thin-film, and in-situ temperature stages for nanoscale analysis. Automated sample handling enhances efficiency. Applications span material research, industrial quality control, and scientific studies of polymer dichroism. These tools continue to evolve, driving innovations in fiber science and industrial applications.

X-ray absorption fine structure spectrometer (XAFS)​ is a powerful tool for studying the local atomic or electronic structure of materials, widely used in popular fields such as catalysis, energy, and nanotechnology. The basic principle of X-ray absorption fine structure spectrometer (XAFS) is that when the energy of X-rays resonates with the energy of an inner electron shell of an element in the sample, a sudden increase in electrons is excited to form a continuous spectrum, which is called the absorption edge. Near the absorption edge, as the X-ray energy increases, the absorption rate monotonically decreases as the penetration depth of the X-ray increases. When the spectrum is extended beyond a specific edge, fine structures can be observed, where X-ray absorption near edge structures (XANES) regions appear as soon as peaks and shoulders with a width exceeding 20 to 30 electron volts pass through the starting point of the edge. The fine structure located on the high-energy side of the edge where energy decays to several hundred electron volts is called X-ray Absorption Fine Structure (XAFS). The main features of X-ray absorption fine structure spectrometer (XAFS) are: Sensitivity to short-range ordering: It depends on short-range ordering and does not rely on long-range ordering, making it possible to measure a wide range of samples. It can be used for amorphous, liquid, molten, catalyst active centers, metal proteins, etc., as well as for structural studies of impurity atoms in crystals. Strong elemental characteristics: The X-ray absorption edge has elemental characteristics, and for atoms of different elements in the sample, the atomic neighbor structure of different elements in the same compound can be studied by adjusting the incident X-ray energy. High sensitivity: Fluorescence method can be used to measure samples of elements with concentrations as low as one millionth. Comprehensive acquisition of structural information: able to provide parameters that determine the local structure, such as the distance between absorbing atoms and neighboring atoms, the number and type of these atoms, and the oxidation state of absorbing elements. Sample preparation is simple: no single crystal is required, and under the experimental conditions, the data collection time is relatively short. Using a synchrotron X-ray source usually only takes a few minutes to measure a spectral line. The main advantages of X-ray absorption fine structure spectrometer (XAFS) are: Core advantage: highest luminous flux product Photon flux exceeding 1000000 photons/second/eV, with spectral efficiency several times higher than other products; Obtain data quality equivalent to synchrotron radiation Excellent stability: The stability of monochromatic light intensity of the light source is better than 0.1%, and the energy drift during repeated collection is less than 50 meV 1% detection limit: High luminous flux, excellent optical path optimization, and excellent light source stability ensure that high-quality EXAFS data can still be obtained when the measured element content is>1%. 4. Application areas of X-ray absorption fine structure spectrometer (XAFS) : Energy field: such as research on lithium batteries and other secondary battery materials, fuel cell research, hydrogen storage material research, etc. XAFS can be used to obtain the concentration, valence state, coordination environment, and dynamic changes of core atoms during charge discharge cycles and electrochemical reactions. Catalysis field: used for research on nanoparticle catalysis, single atom catalysis, etc. Obtain the morphology of the catalyst on the support, the interaction form with the support, and its changes during the catalytic process through XAFS, as well as the neighboring structures of metal ions with extremely low content. In the field of materials science, X-ray absorption fine structure spectrometer (XAFS) is used for the characterization of various materials, the study of complex systems and disordered structural materials, the research of radioactive isotopes, the study of related properties of surface and interface materials, and the study of dynamic changes in materials. In the field of geology, X-ray absorption fine structure spectrometer (XAFS) can be used for element valence state analysis of ore materials in geological research. Environmental field: XES can be used for valence state analysis of Cr/As elements, etc. In the field of radiochemistry, X-ray absorption fine structure spectrometer (XAFS) can be used for valence state analysis of Ce, U elements, etc. The X-ray absorption fine structure spectrometer (XAFS) plays an important role in modern scientific research due to its unique working principle, significant characteristics, and wide application fields. It provides a powerful means for people to gain a deeper understanding of the microstructure and chemical state of matter, promoting the development and progress of multiple disciplinary fields.

The main purpose of NDT portable X-ray welding testing machine is to inspect the processing and welding quality of materials and components such as ship hulls, pipelines, high-pressure vessels, boilers, aircraft, vehicles, and bridges in industrial sectors such as national defense, shipbuilding, petroleum, chemical, mechanical, aerospace, and construction, as well as internal defects and the inherent quality of various light metals, rubber, ceramics, etc. The principle and application of NDT portable X-ray welding testing machine： NDT portable X-ray welding testing machine utilize the acoustic, optical, magnetic, and electrical properties of materials to detect the presence of defects or unevenness in the tested object without damaging or affecting its performance. They provide information such as defect size, location, nature, and quantity. Compared with destructive testing,it has the following characteristics. The first is non-destructive, as it does not compromise the performance of the detected object during testing; The second is comprehensive, as the detection is non-destructive, it is necessary to conduct a 100% comprehensive detection of the tested object, which cannot be achieved by destructive detection; The third is comprehensive, and destructive testing is generally only applicable to the testing of raw materials, such as tension, compression, bending, etc. commonly used in mechanical engineering. Destructive testing is carried out on manufacturing raw materials, and for finished products and in use items, destructive testing cannot be carried out unless they are not intended to continue to serve.on the other hand, it does not damage the performance of the tested object. So,it can not only perform full process testing on manufacturing raw materials, intermediate processes, and even final products, but also test equipment in service. Characteristics of NDT portable X-ray welding testing machine: The X-ray generator has a small volume, with an anode grounded and forced cooling by a fan; ◆ Lightweight, easy to carry, and simple to operate; Work and rest in a 1:1 ratio; Beautiful appearance and reasonable structure; ◆ Delayed exposure to ensure operator safety; Visual inspection range of NDT portable X-ray welding testing machine 1. Inspection of surface defects on welds. Check the welding quality such as surface cracks, incomplete penetration, and leakage of the weld seam. 2. Status check. Check for surface cracks, peeling, pulling, scratches, dents, protrusions, spots, corrosion, and other defects. 3. Internal cavity inspection. When certain products (such as worm gear pumps, engines, etc.) are working, perform endoscopic testing according to the specified technical requirements. 4. Assembly inspection. When there are requirements and needs, use the same 3D industrial video endoscope to inspect the assembly quality; After assembly or a certain process is completed, check each component.Whether the assembly position of the components meets the requirements of the drawings or technical specifications; Is there an assembly defect. 5. Excess item inspection. Check for residual debris, foreign objects, and other debris inside the product cavity.

The WBK-01 X-ray irradiator generates high-energy X-rays to irradiate cells or small animals. X-ray irradiator is used for various basic and applied research. Throughout history, radioactive isotope irradiators have been used, which require transporting samples to a core irradiation facility. Today, smaller, safer, simpler, and lower cost X-ray irradiator can be installed in laboratories for convenient and rapid irradiation of cells. Various samples can be directly irradiated in the laboratory without affecting fertility or safety. The X-ray irradiator is easy to use for personnel without professional X-ray training, and there are no expensive license applications or safety or radiation source maintenance costs. This device is easy to operate, safe, reliable, and cost-effective, and can replace radioactive isotope sources. 1. Principle of X-ray irradiator: The X-ray tube in the X-ray irradiator generates high-energy electrons, which produce X-rays when they collide with the target material (usually tungsten). Accelerating electrons through a high-voltage electric field to obtain sufficient energy to generate the required X-ray wavelength and intensity. Then, the X-rays are adjusted and optimized through a series of collimators, filters, and other devices, and finally irradiated onto the sample. The main components of an X-ray irradiator are: The X-ray irradiator mainly includes X-ray tubes, high-voltage generators, control circuits, cooling systems, safety protection devices, and sample rooms. Among them, the X-ray tube is the core component responsible for generating X-rays; The high-voltage generator provides the required high voltage and current for the X-ray tube; The control circuit is used to control parameters such as the generation, intensity, and irradiation time of X-rays; The cooling system ensures that the equipment will not be damaged due to overheating during operation; The safety protection device ensures the safety of operators and the usage environment. 3. Application areas of X-ray irradiator: The X-ray irradiator can be used in the field of biology: it can be used for cell culture and division inhibition research, gene change induction, stem cell research, small animal irradiation, T-B cell research, blood cell research, bone marrow transplantation irradiation, transplantation immunity, immunosuppressive therapy, radiation sensitivity research, DNA damage research, etc. The X-ray irradiator can be used in the medical field: in tumor treatment, it can be used to locally irradiate the tumor site, kill cancer cells or inhibit their growth; The X-ray irradiator can also be used as an auxiliary diagnosis for certain diseases, such as helping to determine the condition by observing the imaging changes of tissues and organs through X-rays. The X-ray irradiator can be used in the food industry: it can be used for food irradiation preservation, killing microorganisms in food through X-ray irradiation, inhibiting enzyme activity, thereby extending the shelf life of food while maintaining its original taste and nutritional content. The X-ray irradiator can be used in the industrial field: it can be used for material performance testing and modification, such as cross-linking treatment of polymer materials to improve their strength and stability; It can also be used for non-destructive testing to detect defects and cracks inside materials. In summary, X-ray irradiator​ is an important scientific and industrial device with broad application prospects and value.

The X-ray crystal orienter is an indispensable instrument for precision machining and manufacturing of crystal devices. X-ray crystal orienter utilizes the principle of X-ray diffraction to accurately and quickly determine the cutting angle of natural and artificial single crystals (piezoelectric crystals, optical crystals, laser crystals, semiconductor crystals), and is equipped with a cutting machine for directional cutting of the above-mentioned crystals. The X-ray crystal orienter is widely used in the research, processing, and manufacturing industries of crystal materials. 1. Principle of X-ray crystal orienter: The X-ray crystal orienter utilizes the principle of X-ray diffraction to accurately and quickly determine the cutting angle of natural and artificial single crystals (piezoelectric crystals, optical crystals, laser crystals, semiconductor crystals). Equipped with a cutting machine, X-ray crystal orienter can be used for directional cutting of the above-mentioned crystals and is an indispensable instrument for precision machining and manufacturing of crystal devices. The X-ray crystal orientation instrument has a measurement accuracy of ± 30 inches, with a digital display mode and a smaller reading of 10 inches. Can measure samples with a diameter of 1-30 kilograms and 2-8 inches. Angle display: digital mode, measurement accuracy ± 30 inches. 2. Characteristics of X-ray crystal orienter: Easy to operate, no need for professional knowledge or proficient skills. The digital display angle is easy to observe and reduces reading errors. The monitor can be zeroed at any position for easy display of chip angle deviation values. The dual angle measuring instrument can work simultaneously, improving efficiency. The X-ray crystal orienter has a special integrator with peak amplification, which improves the detection accuracy. The integration of X-ray tube and high-voltage cable increases high-voltage reliability. The detector high-voltage adopts DC high-voltage module and vacuum suction sample board, which improves the angle measurement accuracy and speed. The main components of an X-ray crystal orienter are: Radiation tube: Typically, a copper target is used as the anode and grounded, while forced air cooling is employed for cooling. High voltage power supply: provides stable high voltage and current for X-ray tubes, and is one of the core components of the entire system. Detector: used to receive diffracted X-ray photons and convert them into electrical signals for subsequent processing and analysis. Goniometer: used to accurately measure the rotation angle of crystal samples, thereby determining the orientation information of the diffraction plane. Data processing system: processes, analyzes, and stores the signals output by the detector to obtain information about the crystal structure. 4. Application areas of X-ray crystal orienter: Materials Science: Used to study the crystal structures of various materials, including metals, ceramics, semiconductors, etc. Geology: Used for identifying mineral types, analyzing rock structures, etc. Chemistry: used to study the structure and changes of molecular crystals. Physics: used to explore the microstructure and physical properties of matter. In summary, with the continuous progress and innovation of science and technology,X-ray crystal orienter​ is believed that there will be more new materials and technologies applied in various fields in the future, promoting the continuous development of human society.

X-ray crystal analyzer operates on Bragg's law, measuring diffraction patterns to determine crystal structure. Key components include X-ray tube (2.4kW, multiple targets), spectroscopic crystal, detector, and goniometer. TDF series features 4-window operation, PLC control, and automated tube training. Widely used in materials science, chemistry, biology, and geology for structural analysis.

The TDM-10 desktop x ray diffraction instrumentation is an instrument used for analyzing the phase structure of materials, which can be equipped with scintillation/proportional/linear array detectors. 1. The working principle of TDM-10 desktop x ray diffraction instrumentation:Based on Bragg's law, when a monochromatic X-ray beam is incident on a crystal, if the Bragg diffraction condition is satisfied (n λ=2dsin θ, where λ is the wavelength of the X-ray, d is the interplanar spacing, and θ is the incident angle), atoms or molecules in the crystal will scatter and interfere with the X-ray, forming a specific diffraction pattern. By measuring the diffraction intensity at different angles, the structural information of the crystal can be obtained. 2. Characteristics of TDM-10 desktop x ray diffraction instrumentation: The high resolution of a desktop x ray diffraction instrumentation enables precise measurement of the crystal structure of substances, which is crucial for studying complex mixtures or searching for low content polycrystalline and trace phases. Non destructive analysis of desktop x ray diffraction instrumentation: During the testing process, it will not cause damage to the sample, and the sample can remain in its original state for further testing or use. The operation of desktop X-ray powder diffraction equipment is simple: Modern desktop X-ray powder diffraction equipment usually have automation and intelligence functions, making the operation more convenient and reducing the requirements for the operator's professional knowledge and skills. The versatility of desktop X-ray powder diffraction equipment: X-ray powder diffraction equipment can perform various analyses such as phase qualitative and quantitative analysis, lattice constant analysis, stress analysis, etc. 3. Technical parameters of TDM-10 desktop X-ray powder diffraction equipment: Desktop x ray diffraction machine has a small volume; High frequency and high voltage power supply reduces the overall power consumption of the machine; Can quickly calibrate and test samples; Simple circuit control, easy to debug and install; The measurement accuracy of diffraction peak position is 0.001 °; Detector: scintillation, proportional, linear array; Range of 2 θ:- 10°~150° Power: 600W; Maximum voltage: 40kV； Maximum current: 15mA； X-ray tubes: corrugated ceramic tubes, metal ceramic tubes, glass tubes. 4. Application areas of TDM-10 desktop x ray diffraction machine: Materials Science: Used to study the crystal structure, phase composition, grain size, crystallinity, etc. of metals, ceramics, semiconductors, and other materials, helping materials scientists understand the properties and characteristics of materials. In the field of chemistry, x ray diffraction machine can be used in the manufacturing industry of catalysts, cement, pharmaceuticals, and other products to identify phases in unknown samples, as well as to quantitatively analyze known phases in mixed samples. Geology: Conducting phase analysis on ores, rocks, etc. to determine their mineral composition and structure. Environmental science: used to analyze the mineral composition and pollutant forms in environmental samples such as soil and sediment. Food industry: detecting crystal components, additives, etc. in food. The TDM-10 desktop x ray diffraction machine is a powerful analytical instrument with important application value in multiple fields.

The TDM-20 high-power X-ray diffractometer(Benchtop XRD)is mainly used for phase analysis of powders, solids, and similar paste materials. The principle of X-ray diffraction can be used for qualitative or quantitative analysis, crystal structure analysis, and other polycrystalline materials such as powder samples and metal samples. Benchtop XRD is widely used in industries such as industry, agriculture, national defense, pharmaceuticals, minerals, food safety, petroleum, education, and scientific research. 1、Core features of TDM-20 benchtop X-ray diffractometer(Benchtop XRD)： The loading of the new high-performance array detector has greatly improved the overall performance of the device, with a small size and light weight; The whole machine is integrated into the desktop size (usually ≤ 1m³), saving space and suitable for small laboratories or teaching environments;The working power of high-frequency and high-voltage power supply can reach 1600W; Quick analysis, able to calibrate and test samples quickly; By using high-performance detectors (such as two-dimensional detectors) and optimizing the optical path, sample scanning can be completed in a few minutes; Simple circuit control, easy to debug and install; The angle repeatability can reach 0.0001; Low power consumption and safety, using low-power X-ray tubes (such as ≤ 50W), equipped with multiple radiation protection, no need for special shielding rooms; User friendly, equipped with automation software, supporting one click operation, real-time data visualization, and standard database (such as ICDD PDF) comparison. 2. Typical application scenarios of TDM-20 benchtop X-ray diffractometer(Benchtop XRD): Materials Science of X-ray diffractometer（Benchtop XRD）: Rapid identification of crystal structure and phase composition (such as metals, ceramics, polymers). Materials Science of X-ray diffractometer（Benchtop XRD）: Industrial site testing of the crystal purity of raw materials or finished products (such as pharmaceuticals and battery materials). Materials Science of X-ray diffractometer（Benchtop XRD）: Undergraduate experimental teaching, visually demonstrating the Bragg diffraction principle. Materials Science of X-ray diffractometer（Benchtop XRD）: Mineral composition analysis of cultural relics or preliminary screening of field samples. 3.Technical parameters of TDM-20 benchtop X-ray diffractometer（Benchtop XRD）: Project : parameter range X-ray source:Cu target (λ=1.54 Å), Mo target optional Voltage/current:10-50 kV/0.1-2 mA Angle measuring instrument range:0-90 ° 2θ (some models can be extended) Angle resolution:≤ 0.01 ° Detector type: one-dimensional linear or two-dimensional surface detector Sample size: Powder (milligrams), film or block 4.Advantages and limitations of TDM-20 benchtop X-ray diffractometer（Benchtop XRD）: Advantages: Low cost (about 1/3-1/2 of large XRD), easy maintenance. Support non-destructive analysis and simple sample preparation (such as directly placing powder). limitations: The resolution and sensitivity are slightly lower than high-end devices, and may not be suitable for ultra-fine structural analysis. Extreme condition testing (such as high-temperature/high-pressure in-situ experiments) is usually not feasible.

The TD-3500 X-ray diffractometer is mainly used for phase qualitative and quantitative analysis, crystal structure analysis, material structure analysis, crystal orientation analysis, macroscopic or microscopic stress determination, grain size determination, crystallinity determination, etc. of powder, block or film samples. The TD-3500 X-ray diffractometer produced by Dandong Tongda Technology Co., Ltd. adopts imported Siemens PLC control, which makes the TD-3500 X-ray diffractometer have the characteristics of high accuracy, high precision, good stability, long service life, easy upgrade, easy operation and intelligence, and can flexibly adapt to testing analysis and research in various industries!   The TD-3500 X-ray diffractometer adopts an X-ray generator (high-frequency and high-voltage solid-state generator, power frequency generator optional), which has a high degree of automation, extremely low failure rate, strong anti-interference ability, good system stability, and can extend the service life of the whole machine. PLC and computer interface automatically control the opening and closing of the light gate, automatically control the rise and fall of tube pressure and tube flow, and have the function of automatically training X-ray tubes. Real time online monitoring using a touch screen to display instrument status. The TD-3500 X-ray diffractometer adopts advanced recording control unit, PLC control circuit, advanced PLC control technology and true color touch screen to achieve human-computer interaction. The system hardware adopts modular design concept, greatly increasing the anti-interference ability of the system and making it more stable. Due to the use of imported Siemens PLC control circuits with high precision and automation, the system can operate stably for a long time without any faults. The TD-3500 X-ray diffractometer system has the following advantages over the microcontroller circuits used by other companies: Simple circuit control, easy to debug and install; Due to its modular design, the system maintenance is very simple, and users can repair and debug it themselves without the need for manufacturer technicians to be present; Adopting advanced true color touch screen to achieve human-computer interaction, with complete protection functions and very convenient operation, the highly three-dimensional animation design is more humanized, intuitive, and convenient for operators to use and judge fault information, etc; Greatly improving the counting stability of the system, thereby enhancing the overall stability of the entire machine; Due to the strong expansion capability of PLC, it can easily expand various functional accessories without the need to add any additional hardware circuits. Detector of TD-3500 X-ray diffractometer Proportional detector (PC) or scintillation detector (SC). High precision angle measuring instrument for TD-3500 X-ray diffractometer The TD series angle measuring instrument adopts imported high-precision bearing transmission, and the motion control is completed by a high-precision fully closed-loop vector drive servo system. The intelligent drive includes a 32-bit RISC microprocessor and a high-resolution magnetic encoder, which can automatically correct extremely small motion position errors, ensuring high precision and accuracy of measurement results. The angle reproducibility can reach 0.0001 degrees, and smaller step angles can reach 0.0001 degrees. Application areas of TD-3500 X-ray diffractometer: Materials Science: Used to study key information such as crystal structure, phase transition behavior, and texture of materials. Chemical analysis: can be used for qualitative or quantitative analysis of organic, inorganic, polymer compounds and other substances. Geology: helps people understand the formation of mineral deposits, the evolution of the Earth, and more. Biopharmaceuticals: Determine the crystal structure of drugs, optimize drug formulations, and improve drug efficacy. X-ray diffractometer is a powerful analytical tool widely used in multiple fields. By accurately measuring diffraction angle and intensity, it can provide detailed information about the crystal structure and composition of materials.