Small-angle X-ray scattering is the diffuse scattering of electrons to X-rays in the small Angle range near the original beam. Small-angle scattering occurs in all materials with non-uniform electron density on the nanometer scale.

Small Angle X-ray diffraction (SAXD) is mainly used to determine the spacing of very large crystal faces or the structure of thin films.

Small Angle X-ray scattering (SAXS) is a technology that collects scattered signals generated by X-rays passing through a sample to study the structural information of a sample in the range of 1~100 nm.

X-ray diffractometer is a device that uses the principle of interaction between X-rays and substances to obtain information such as crystal structure and lattice constant of substances by measuring the diffraction Angle and intensity of X-rays in substances.