Dandong Tongda Technology Co., Ltd. is a professional enterprise that produces X-ray products. Its main product is X-ray analysis instruments, and in 2013, it became the project undertaker for the National Major Scientific Instrument and Equipment Development Special X-ray Single Crystal Diffraction Instrument of the Ministry of Science and Technology of China. Our company adheres to the principles of customer first, product first, and service first, insists on people-oriented, and has a strong technology team. We are committed to providing users with the highest quality high-tech products with advanced technology, and providing strong support and services to users with efficient technical consulting and after-sales service institutions.

X-ray diffractometer is mainly used for phase qualitative and quantitative analysis, crystal structure analysis, material structure analysis, crystal orientation analysis, macroscopic or microscopic stress determination, grain size determination, crystallinity determination, etc. of powder, block or film samples.

XRD technology plays an important role in the research and development of ceramic materials. It provides a reliable scientific basis for the synthesis, preparation process optimization, performance improvement and application popularization of ceramic materials.

In materials science research, X-ray diffraction (XRD) is an important experimental method. Through XRD data, we can obtain information such as grain size, lattice distortion and dislocation density.

Researchers at the synchrotron radiation facility SPring-8 at the RIKEN Research Institute in Japan and their collaborators have developed a faster and simpler way to perform segmentation analysis, an important process in materials science.

In this paper, a series of hard carbon materials with adjustable structure were prepared using chitosan as carbon source, and the relationship between the evolution of hard carbon structure and the properties of sodium storage was analyzed.

A new study from BESSY II analyzes the formation of skomingons in dysprosium and cobalt ferromagnetic films in real time with high spatial resolution.

In this paper, we briefly analyze one (actually two) crystal defects, one fault and layer fault in these three crystal structures. Other crystal structures also have faults and layer faults.

XRD is a means of research which is Diffraction by X-Ray diffraction of a material to analyze its diffraction pattern to obtain information such as the composition of the material, the structure or shape of atoms or molecules inside the material.

X-ray diffraction, through the X-ray diffraction of a material, the analysis of its diffraction pattern, to obtain the composition of the material, the structure or shape of the atoms or molecules inside the material and other research means.

X-Ray Diffraction (XRD) is a major method for studying the phase and crystal structure of a substance. When a substance (crystal or non-crystal) is diffraction analysis, the substance is irradiated by X-rays to produce different degrees of diffraction phenomenon, material composition, crystal type, intramolecular bonding mode, molecular configuration, conformation and other material characteristics determine the specific diffraction pattern of the substance.