The X-ray single crystal diffractometer is mainly used to determine the three-dimensional spatial structure and electron cloud density of crystalline substances such as inorganic, organic, and metal complexes, and to analyze the structure of special materials such as twinning, non commensurate crystals, quasicrystals, etc. Determine the accurate three-dimensional space (including bond length, bond angle, configuration, conformation, and even bonding electron density) of new compound (crystalline) molecules and the actual arrangement of molecules in the lattice; It can provide information on the crystal cell parameters, space group, crystal molecular structure, intermolecular hydrogen bonding and weak interactions, as well as structural information such as molecular configuration and conformation. It is widely used in analytical research in chemical crystallography, molecular biology, pharmacology, mineralogy, and materials science.

Dandong Tongda Technology Co., Ltd. is committed to the research and development, production, and sales of X-ray diffractometers. The company currently has X-ray diffractometers, X-ray desktop diffractometers, X-ray single crystal diffractometers, X-ray crystal analyzers, and other products, which are sold both domestically and internationally and have received unanimous praise from the industry.

Dandong Tongda Technology Co., Ltd. holds a team building event every summer to focus on the survival and development of employees, implement humanistic care that cares for, cherishes, and respects people, and stimulate the cohesion, enthusiasm, and vitality of employees. Tongda Technology Company is a professional manufacturer of X-ray analysis instruments. The company currently has TD series X-ray diffractometers, X-ray single crystal diffractometers, X-ray desktop diffractometers, X-ray crystal analyzers and other products. X-ray diffractometer is mainly used for phase qualitative and quantitative analysis, crystal structure analysis, material structure analysis, crystal orientation analysis, macroscopic or microscopic stress determination, grain size determination, crystallinity determination, etc. of powder, block or film samples.

X-ray diffractometer is mainly used for qualitative or quantitative analysis of sample phases, crystal structure analysis, crystallinity determination, etc. Various special functional accessories and corresponding control and application software can be installed according to actual needs to form a diffraction system with special functions. X-ray diffractometer is a laboratory analytical instrument with high precision.

The X-ray diffraction pattern serves as the most reliable foundation for determining polycrystalline patterns, and the X-ray diffraction pattern is frequently regarded as the "fingerprint" of crystalline patterns.

As an indispensable raw material in the realm of construction, cement assumes a vital role throughout the construction process. There exist numerous types of Portland cement. Owing to its superb performance, Portland cement is extensively utilized.

X-ray diffractometer is a kind of instrument to analyze the crystal structure, phase composition and crystal orientation of a substance by the interaction of X-ray with matter.

The degree of graphitization refers to how closely the crystal structure of the graphite material resembles perfect graphite after rearranging the amorphous carbon structure.

An X-ray stress diffractometer is a widely utilized instrument in the field of materials science and engineering for measuring the internal stress distribution of materials.

X-ray diffraction is a basic technique for the study of solid structure, which can provide unique spectral information for the chemical composition and structure arrangement of samples.