In X-ray diffractometer, the multifunctional integrated measuring accessories are crucial component that greatly enhances the functionality and flexibility of the instrument. Used for the analysis of films on boards, blocks, and substrates, and can perform tests such as crystal phase detection, orientation, texture, stress, and in-plane structure of thin films. Basic overview of multifunctional integrated measuring accessories: Definition: They are general term for a series of additional devices or modules used in X-ray diffractometer to expand instrument functions, improve measurement accuracy and efficiency. Purpose: These attachments aim to enable X-ray diffractometer to meet a wider range of experimental needs and provide more comprehensive and accurate material structure information. The functional characteristics of multifunctional integrated measuring accessories: Perform polar diagram testing using transmission or reflection methods; Stress testing can be conducted using either the parallel tilt method or the same tilt method; Thin film testing (in-plane rotation of the sample). Technical characteristics of multifunctional integrated measuring accessories: High precision:They typically use advanced sensing technology and control systems to ensure high precision and repeatability of measurements. Automation: Many attachments support automated operations and can be seamlessly integrated with the X-ray diffractometer host to achieve one click measurement. Modular design: facilitates users to select and combine different accessory modules according to their actual needs. Application areas of multifunctional integrated measuring accessories: Widely used in fields such as materials science, physics, chemistry, biology, and geology; Evaluation of metal assembly structures such as rolled plates; Evaluation of ceramic orientation; Evaluation of crystal priority orientation in thin film samples; Residual stress testing of various metal and ceramic materials (evaluation of wear resistance, cutting resistance, etc.); Residual stress testing of multilayer films (evaluation of film peeling, etc.); Analysis of surface oxidation and nitride films on high-temperature superconducting materials such as thin films and metal plates; Glass Si、Analysis of multilayer films on metal substrates (magnetic thin films, metal surface hardening films, etc.); Analysis of electroplating materials such as macromolecular materials, paper, and lenses. The multifunctional integrated measuring accessories in X-ray diffractometer are the key to improving instrument performance. They not only enhance the functionality of the instrument, but also improve the accuracy and efficiency of measurement, providing researchers with more comprehensive and in-depth material analysis methods. With the continuous advancement of technology, these attachments will continue to play an important role in promoting scientific research in related fields to achieve more breakthroughs.

The Small angle diffractometer accessories​ are important accessories used in X-ray diffractometers. Small angle diffractometer accessories enable X-ray diffraction measurements to be taken within a very small angle range, from 0°to5°, for thickness testing of nano multilayer films. Plays an important role in fields such as materials science, physics, chemistry, and biology. Common types and characteristics: Parallel light thin film accessory: This accessory can generate parallel X-ray beams and is suitable for small angle diffraction measurements of thin film samples. It can improve the accuracy and resolution of measurements, reduce measurement errors caused by beam divergence, and better adapt to thin film samples of different thicknesses and properties. Multi functional sample stage: Equipped with small angle diffraction accessories, the multifunctional sample stage can provide various testing environments for samples, such as in-situ heating, cooling, stretching, etc. This makes it more convenient to study the structural changes of materials under different external conditions, and enables real-time observation of the structural response of materials during temperature, stress, and other changes. The Small angle diffractometer accessories play important role in multiple fields such as materials science, physics, chemistry, and biology by achieving small angle diffraction and precise measurement of nano multilayer film thickness, providing researchers with a powerful tool for in-depth exploration of material microstructures and properties.

Fiber accessories are tested for their unique crystal structure using X-ray diffraction (transmission) method. Test the orientation of the sample based on data such as fiber crystallinity and half peak width. A specialized component used for analyzing fiber materials such as textiles, polymer fibers, biological fibers, etc. It is commonly used to study the crystal structure, orientation, and molecular arrangement of fibers. Main functions of fiber accessories: 1. Fiber sample fixation: Fiber accessories​ are used to fix the fiber sample, ensuring its position and direction stability in the X-ray beam. 2. Fiber orientation analysis: By adjusting the position and angle of the sample, the crystal orientation and molecular arrangement of the fibers are studied. 3. Small angle X-ray scattering (SAXS): Some fiber attachments support SAXS for analyzing the nanoscale structure of fibers. Common types of fiber accessories: 1. Fiber stretching device: It can apply tension to fibers during XRD analysis to study structural changes under stress. 2. Rotating sample stage: allows fiber samples to rotate, facilitating the collection of diffraction data from different angles. 3. Temperature control accessories: used to analyze fiber materials at specific temperatures and study the effect of temperature on structure. Application fields of fiber accessories: 1. Materials Science: Study the crystal structure and mechanical properties of synthetic fibers such as nylon and polyester. 2. Biomaterials: Analyze the structure of natural fibers such as collagen and cellulose. 3. Textiles: Evaluate the orientation and crystallinity of textile fibers. Steps for using fiber accessories: 1. Sample preparation: Fix the fiber sample onto the attachment. 2. Adjust parameters: Set the X-ray source, detector, and sample positions. 3. Data collection: Collect diffraction patterns. 4. Data analysis: Use software to analyze diffraction data and obtain structural information. Matters needing attention: -Sample alignment: Ensure that the sample is accurately aligned with the X-ray beam. -Parameter optimization: Optimize X-ray energy, exposure time, etc. based on sample characteristics. -Data quality: Ensure clear diffraction patterns and avoid noise interference. Our company provides on-site training on instrument usage and related industry knowledge, as well as subsequent analysis software usage and maintenance, and complete machine maintenance services.

Fiber accessories are tested for their unique crystal structure using X-ray diffraction (transmission) method. Test the orientation of the sample based on data such as fiber texture and half peak width.

Originally Battery Accessory is a device used for electrochemical system research, belonging to X-ray diffractometer accessories，which allows real-time and dynamic monitoring and analysis of the battery under specific conditions. Widely used in electrochemical systems containing carbon, oxygen, nitrogen sulfur, metal embedded complexes, etc.

Fiber accessories are tested for their unique crystal structure using X-ray diffraction (transmission) method. Test the orientation of the sample based on the fiber crystallinity and half peak width of the fibers. This type of accessory is usually installed on a wide-angle diffractometer and is mainly used to study the texture of thin films on the substrate, perform crystal phase detection, orientation, stress testing, and other tests.

The graphite curved crystal monochromator is installed in front of the X-ray detector, which monochromatizes the X-rays passing through the receiving slit and only detects the K α characteristic X-ray diffractometer accessories of the X-ray spectrum. By using this device, continuous X-rays, K β characteristic X-rays, and fluorescent X-rays can be completely eliminated, enabling high signal-to-noise ratio X-ray diffraction analysis. When copper target X-ray tubes are used in conjunction with corresponding monochromators, fluorescent X-rays generated from Mn, Fe, Co, Ni based samples can be eliminated, making them suitable for analysis of various samples.

Multifunctional integrated measurement accessory is an instrument accessory that can measure multiple parameters. It is a measurement accessory for X-ray diffractometer, mainly used to improve measurement efficiency, increase measurement functions, and improve instrument maintenance. Used for analysis and testing of various materials in fields such as chemical engineering, machinery, geology, minerals, metallurgy, building materials, ceramics, petrochemicals, pharmaceuticals, etc. Multifunctional integrated measuring accessories play an important role in various fields, providing strong support for scientific research and industrial production.

The small angle diffractometer accessories are important accessories used in X-ray diffraction instruments, mainly for measuring the nanoscale parameters of materials. The corresponding accessories can be configured for small angle diffraction, and the angle range from 0°to 5°can be used for thickness testing of nano multilayer films. By measuring the nanoscale parameters of materials, powerful tools have been provided for research in fields such as materials science, biology, and chemistry.

The Graphite curved crystal monochromator is an important instrument accessory for X-ray diffraction analysis, mainly used to monochromatize the X-rays passing through the receiving slit, thereby improving the accuracy and signal-to-noise ratio of analysis. This monochromator utilizes the specific structure of graphite crystals to selectively reflect incident X-rays, allowing only X-rays of specific wavelengths (usually Kαcharacteristic X-rays) to pass through while filtering out other unwanted X-ray components such as continuous X-rays, Kβcharacteristic X-rays, and fluorescent X-rays. This selective reflection is based on Bragg's law, which states that when the angle between the incident light and the crystal plane satisfies certain conditions, coherent scattering occurs, forming diffraction peaks.When using this monochromator, attention should be paid to the preparation and placement of the sample to ensure the accuracy and symmetry of the diffraction peaks. ​Graphite curved crystal monochromator are widely used in materials research fields such as chemistry, chemical engineering, machinery, geology, minerals, metallurgy, building materials, ceramics, petrochemicals, and pharmaceuticals. In these fields, it is used for X-ray diffraction analysis to study the physical properties of materials such as crystal structure, phase transition, stress state, etc.X-ray diffractometer accessories significantly improves the accuracy and reliability of analysis by increasing the peak to background ratio and reducing background noise.

The multifunctional integratedmeasuring accessories are used for analyzing films on boards, blocks, and substrates, and can perform tests such as crystal phase detection, orientation, texture, stress, and in-plane structure of thin films. Multifunctional integrated measuring accessories are typically designed to enhance the functionality of X-ray diffractometer , enabling them to adapt to more diverse testing needs. There is a close relationship between multifunctional integrated measurement accessories and X-ray diffractometer. These accessories not only enhance the functionality and performance of X-ray diffractometer, but also improve its ease of operation and safety. In practical applications, users can choose suitable accessories according to their specific needs to expand the application scenarios of X-ray diffractometer and improve measurement efficiency.

Originally Battery Accessory, testing range: 0.5-160 degrees, temperature resistance: 400 ℃, beryllium window (polyester film) size: diameter 15mm (customizable); Thickness 0.1mm (customizable). They are widely used as X-ray diffractometer accessories in electrochemical systems containing carbon, oxygen, nitrogen sulfur, metal embedded complexes, etc. Originally Battery Accessory is used to fix the entire Originally Battery ​ sample stage on the angle measuring instrument of the X-ray diffractometer, serving as a connection and support.