background

News

A New Perspective on the Nano World

The small angle diffractometer accessories are special device used in X-ray diffraction (XRD) experiments, mainly for measuring diffraction peaks in the low angle range to study the microstructure and properties of materials. The small angle diffractometer accessories are specialized device for X-ray diffractometers that allows for precise diffraction measurements within a lower 2θangle range (typically from 0°to 5°or lower). This technology is of great significance for studying nanostructures, mesoporous materials, multilayer films, and other materials. By configuring corresponding small angle diffractometer accessories, the thickness of nano multilayer films can be accurately measured. Overall, small angle diffractometer accessories are an indispensable and important component of X-ray diffractometers, with broad application prospects in materials science, chemistry, physics, and other fields.

2024/11/11
READ MORE
The key to exploring the microcosm

Fiber accessories are tested for their unique crystal structure using X-ray diffraction (transmission) method. Test the orientation of the sample based on data such as fiber crystallinity and half peak width. Fiber accessories have a wide range of applications in various fields, including materials science, biomedicine, chemical engineering, nanotechnology, geological exploration, environmental monitoring, and more.

2024/11/09
READ MORE
Exploring in-situ battery accessories: opening up a new perspective on energy

The in-situ battery accessory is a component of the X-ray diffractometer accessories.In situ battery accessories are widely used in electrochemical systems containing composite materials such as carbon, oxygen, nitrogen sulfur, and metal inserts. Test range: 0.5-160 degrees Celsius Temperature resistance: 400 ℃ Beryllium window (polyester film) size: diameter 15mm (customizable); Thickness 0.1mm (customizable) Dandong Tongda Technology Co., Ltd. is a professional manufacturer of X-ray diffractometers、Wholesaler of X-ray directional analyzer、Wholesaler of X-series X-ray crystal analyzer。

2024/10/21
READ MORE
Series X-ray diffractometer

X-ray diffractometer is mainly used for phase qualitative and quantitative analysis, bulk structure analysis, material structure analysis, crystal orientation analysis, macroscopic or microscopic stress determination, particle size determination, crystallinity determination, etc. of powder, block or film samples.

2024/09/29
READ MORE
Characteristics of Tongda Technology X-ray Diffraction Instrument

X-ray diffractometer is mainly used for phase qualitative and quantitative analysis, crystal structure analysis, material structure analysis, crystal orientation analysis, macroscopic or microscopic stress determination, grain size determination, crystallinity determination, etc. of powder, block or film samples.

2024/09/13
READ MORE
Angle measuring instrument

The high-precision multifunctional angle measuring instrument of Tongda Technology can not only measure conventional powder samples, but also test liquid samples, colloidal samples, viscous samples, loose powders, and large solid samples.

2024/09/05
READ MORE
Multi functional angle measuring instrument

The goniometer is the heart of the X-ray diffractometer, and the TD series X-ray diffractometer has extremely high measurement accuracy

2024/09/04
READ MORE
High precision multifunctional angle measuring instrument

The goniometer is the heart of the X-ray diffractometer, and the TD series X-ray diffractometer has extremely high measurement accuracy

2024/09/03
READ MORE
Dandong Tongda Technology Co., Ltd. product service - product training

The previous one detailed and complete introduction of the company's pre-sale, sale and after-sales service, today introduced is our company's product training related content.

2023/09/19
READ MORE
Prev 1 2
Get the latest price? We'll respond as soon as possible(within 12 hours)
This field is required
This field is required
Required and valid email address
This field is required
This field is required