The small angle diffractometer accessories are important accessories used in X-ray diffraction instruments, mainly for measuring the nanoscale parameters of materials. The corresponding accessories can be configured for small angle diffraction, and the angle range from 0°to 5°can be used for thickness testing of nano multilayer films. By measuring the nanoscale parameters of materials, powerful tools have been provided for research in fields such as materials science, biology, and chemistry.

The small angle diffractometer accessories are special device used in X-ray diffraction (XRD) experiments, mainly for measuring diffraction peaks in the low angle range to study the microstructure and properties of materials. The small angle diffractometer accessories are specialized device for X-ray diffractometers that allows for precise diffraction measurements within a lower 2θangle range (typically from 0°to 5°or lower). This technology is of great significance for studying nanostructures, mesoporous materials, multilayer films, and other materials. By configuring corresponding small angle diffractometer accessories, the thickness of nano multilayer films can be accurately measured. Overall, small angle diffractometer accessories are an indispensable and important component of X-ray diffractometers, with broad application prospects in materials science, chemistry, physics, and other fields.